Embedded Wire Grid Polarizer with High Reflectivity on Both Sides

    公开(公告)号:US20180143364A1

    公开(公告)日:2018-05-24

    申请号:US15715378

    申请日:2017-09-26

    Applicant: Moxtek, Inc.

    CPC classification number: G02B5/3058 G02B1/14 G02B27/283

    Abstract: A wire grid polarizer (WGP) 10 can include wires 15 sandwiched between a first pair of thin-film layers 21 (with a first transparent layer 11 and a second transparent layer 12) and a second pair of thin-film layers 22 (with a third transparent layer 13 and a fourth transparent layer 14). An index of refraction of each outer transparent layer 11 and 14 can be greater than an index of refraction of the adjacent inner transparent layer 12 and 13, respectively. Material composition of the outer transparent layers 11 and 14 can be the same and material composition of the adjacent inner transparent layers 12 and 13 can be the same. There can be high reflection of one polarization (e.g. Rs1>93% and Rs2>93%) for light incident on either side of the WGP. The wires 15 can be embedded for protection.

    XRF analyzer activation switch
    84.
    发明授权

    公开(公告)号:US09839108B2

    公开(公告)日:2017-12-05

    申请号:US15585672

    申请日:2017-05-03

    Applicant: Moxtek, Inc.

    Abstract: The invention includes various electronic devices for avoiding or minimizing XRF analyzer user fatigue. In one embodiment, the XRF analyzer can include a finger tap switch for activating the XRF analysis. In another embodiment, the XRF analyzer can include a hand sensor and a finger tap switch, activation of both required to activate the XRF analysis. In another embodiment, the XRF analyzer can include a microphone capable of receiving a verbal command from a user and a finger tap switch, both receipt of the verbal command and activation of the finger tap switch required to activate the XRF analysis. Additional benefits of some embodiments include improving XRF analysis safety and avoiding XRF analyzer theft.

    XRF analyzer rotational filter
    90.
    发明授权

    公开(公告)号:US09689815B2

    公开(公告)日:2017-06-27

    申请号:US14806975

    申请日:2015-07-23

    Applicant: Moxtek, Inc.

    Abstract: An XRF analyzer can include a rotatable filter structure to separately position at least two different x-ray source modification regions between an x-ray source and a focal point and at least two different x-ray detector modification regions between an x-ray detector and the focal point.An XRF analyzer can include a rotatable source filter wheel between an x-ray source and a focal point and a rotatable detector filter wheel between an x-ray detector and the focal point. The source filter wheel can include multiple x-ray source modification regions. The detector filter wheel can include multiple x-ray detector modification regions. A gear wheel can mesh with a gear on the source filter wheel and with a gear on the detector filter wheel and can cause the source filter wheel and the detector filter wheel to rotate together.

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