TOUCH POSITIONING METHOD FOR TOUCH DISPLAY DEVICE, AND TOUCH DISPLAY DEVICE
    82.
    发明申请
    TOUCH POSITIONING METHOD FOR TOUCH DISPLAY DEVICE, AND TOUCH DISPLAY DEVICE 有权
    用于触摸显示设备的触摸定位方法和触摸显示设备

    公开(公告)号:US20160195998A1

    公开(公告)日:2016-07-07

    申请号:US14771715

    申请日:2014-10-24

    Abstract: The present disclosure provides a touch positioning method for a touch display device, and the touch display device. When it is detected that a touch operation has been made on a touch panel, whether or not the touch operation is effective is determined. When the touch operation is effective, coordinate information about a touch point are sampled multiple times, so as to acquire a plurality of initial coordinates of the touch point. A grouping calculation is performed on the plurality of initial coordinates of the touch point, so as to determine final coordinates of the touch point.

    Abstract translation: 本公开提供了一种用于触摸显示装置和触摸显示装置的触摸定位方法。 当检测到在触摸面板上进行了触摸操作时,确定触摸操作是否有效。 当触摸操作有效时,关于触摸点的坐标信息被多次采样,以便获取触摸点的多个初始坐标。 对触摸点的多个初始坐标执行分组计算,以便确定触摸点的最终坐标。

    LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL

    公开(公告)号:US20240230403A1

    公开(公告)日:2024-07-11

    申请号:US17925214

    申请日:2021-12-27

    CPC classification number: G01J1/44 G01R31/2656 G01J2001/4247 G01J2001/4473

    Abstract: The present disclosure provides a luminous flux test circuitry, a test method and a display panel. The luminous flux test circuitry includes two test sub-circuitries, a control sub-circuitry and a light-shielding pattern. Each test sub-circuitry includes N photosensitive transistors; an output end of each photosensitive transistor in a first test sub-circuitry is coupled to a first input end of the control sub-circuitry; an output end of each photosensitive transistor in a second test sub-circuitry is coupled to a second input end of the control sub-circuitry; the light-shielding pattern covers the photosensitive transistors in the second test sub-circuitry; at a sampling stage, the photosensitive transistors in each test sub-circuitry are in a reverse bias state; and the control sub-circuitry is configured to determine a luminous flux detected by the photosensitive transistors in the first test sub-circuitry in accordance with a leakage current generated by the photosensitive transistors in each test sub-circuitry.

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