Scrubbing and sampling device, card reader apparatus and gate apparatus

    公开(公告)号:US10775278B2

    公开(公告)日:2020-09-15

    申请号:US15826098

    申请日:2017-11-29

    Abstract: It is disclosed a scrubbing and sampling device, a card reader apparatus and a gate apparatus. The scrubbing and sampling device includes: a scrubbing and sampling portion including a first wheel and a second wheel, which are respectively capable of rotating around respective rotating axes, and a scrubbing conveyor belt tensioned by the first wheel and the second wheel and driven by rotation of the first wheel and the second wheel, to move between them; and an desorbing portion configured to desorb properties of an sample that is conveyed into the desorbing portion. The scrubbing conveyor belt is configured to move through the desorbing portion such that the desorbing portion desorbs the sample on the scrubbing conveyor belt when the scrubbing conveyor belt enters the desorbing portion.

    Device for collecting semi-volatile or non-volatile substrate

    公开(公告)号:US10663429B2

    公开(公告)日:2020-05-26

    申请号:US16235340

    申请日:2018-12-28

    Abstract: The present disclosure provides a device for collecting semi-volatile or non-volatile substance, including an air nozzle, a front cavity and a collecting body. The air nozzle is configured to eject air to a sample attachment surface. The front cavity has an upper port. The collecting body is sealingly connected to a lower end of the front cavity, inside of which is provided with a cylindrical cavity and a conical cavity arranged vertically coaxially, and bottom of which is provided with a sample outlet. The collecting body is provided with an air intake passage which is non-coplanar with respect to an axis of the cylindrical cavity and is disposed obliquely downward and inward. The collecting body is further provided with an air exhaust passage one end of which is a discharge port connected to the interior of the cylindrical cavity, the other end is connected to an air pump.

    Security inspection apparatus and method

    公开(公告)号:US10585052B2

    公开(公告)日:2020-03-10

    申请号:US15609012

    申请日:2017-05-31

    Abstract: The present disclosure proposes a security inspection apparatus and method, relates to the technical field of radiation, wherein the security inspection apparatus of the disclosure includes: radiation emitting device, back-scatter detector, size-distance detecting device, orientation adjusting device; the back-scatter detector located between the radiation emitting device and an inspected object; the size-distance detecting device located between the radiation emitting device and the inspected object, for detecting a size of the inspected object and/or a distance between the inspected object and the size-distance detecting device; and the orientation adjusting device adjusts orientation of the radiation emitting device according to the size of the inspected object and/or the distance from the inspected object.

    Scan method, scan system and radiation scan controller

    公开(公告)号:US10578765B2

    公开(公告)日:2020-03-03

    申请号:US16253221

    申请日:2019-01-22

    Abstract: This invention provides a scan method, scan system and radiation scan controller, and relates to the field of radiation. The scanning method includes obtaining detection data of an object to be inspected under radiation scanning using a detector, adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to the detection data. With this method, working conditions of the accelerator of the radiation emission device may be adjusted according to the detection data detected by the detector, so that for a region having a larger mass thickness, a higher output beam dose rate or a higher electron beam output energy level is adopted to guarantee satisfied imaging technical indexes, for a region having a smaller mass thickness, a lower output beam dose rate or a lower electron beam output energy level is adopted to reduce the environmental dose level while guaranteeing satisfied imaging technical indexes.

    Radiation detector assembly and method of making the same

    公开(公告)号:US10422889B2

    公开(公告)日:2019-09-24

    申请号:US15856303

    申请日:2017-12-28

    Abstract: A radiation detector assembly and a method of manufacturing the same are provided. The radiation detector assembly includes a base and an outer encapsulation layer. The base includes a scintillator having a light-entering surface and a light-exiting surface on both ends thereof, respectively; a reflection layer provided on the light-entering surface and an outer peripheral surface of the scintillator; a photosensor comprising a photosensitive surface and an encapsulation housing, the photosensitive surface is coupled to the light-exiting surface via an optical adhesive; and an inner encapsulation layer adhered to an outer surface of the reflection layer and hermetically encapsulates a coupling portion where the scintillator and the photosensor connected with each other. The outer encapsulation layer is provided on the outer surface of the base.

    Safety inspection apparatus
    89.
    发明授权

    公开(公告)号:US10371854B2

    公开(公告)日:2019-08-06

    申请号:US15230316

    申请日:2016-08-05

    Abstract: A safety inspection apparatus is disclosed in embodiments of the present invention. The safety inspection apparatus includes: an x-ray source including a ray emission focal spot; and a plurality of detector modules each of which has a ray receiving surface, and which are arranged along a plurality of straight line segments. The plurality of straight line segments include a first straight line segment and two second straight line segments, and, the two second straight line segments extend from the two ends of the first straight line segment towards the x-ray source side, respectively. In a plane where the sectorial ray beam is located, a normal to the ray receiving surface of each of the detector modules at a midpoint of the ray receiving surface of the each of the detector modules passes generally through the ray emission focal spot of the x-ray source.

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