Security inspection apparatus and method of controlling the same

    公开(公告)号:US12007523B2

    公开(公告)日:2024-06-11

    申请号:US17304903

    申请日:2021-06-28

    CPC classification number: G01V3/12 G01V3/38

    Abstract: The application describes a security inspection apparatus and a method of controlling the same. An example security inspection apparatus includes a body fixed in the field and an electromagnetic imaging device installed on the body. The electromagnetic imaging device includes a two-dimensional multi-input multi-output array panel, including at least one two-dimensional multi-input multi-output sub-array and a control circuit. Each two-dimensional multi-input multi-output sub-array includes transmitting antennas and receiving antennas, with the transmitting antennas and the transmitting antennas being arranged such that equivalent phase centers are arranged in a two-dimensional array. The electromagnetic imaging device further includes a signal processing device configured to reconstruct an image of an inspected object based on an echo signal received and a display device configured to display the reconstructed image of the inspected object.

    Portable terahertz security inspection apparatus

    公开(公告)号:US11733422B2

    公开(公告)日:2023-08-22

    申请号:US17309908

    申请日:2019-10-09

    CPC classification number: G01V8/20 G01V5/0008 G01V8/005

    Abstract: The present disclosure provides a portable terahertz security inspection apparatus, including: a carrying body; a terahertz emitting device arranged on the carrying body, wherein the terahertz emitting device includes a terahertz signal source and an emitting unit connected to the terahertz signal source and configured to emit a terahertz wave; a terahertz detector arranged on the carrying body and configured to receive the terahertz wave reflected from an inspected object; a data acquisition and processing system arranged on the carrying body and connected to the terahertz detector, wherein the data acquisition and processing system is configured to receive a scan data for the inspected object from the terahertz detector and generate a terahertz image; and a display device connected to the data acquisition and processing system and configured to receive and display the terahertz image from the data acquisition and processing system. The portable terahertz security inspection apparatus does not need to be equipped with a mechanical scanning system, so that a volume and a weight of the terahertz security inspection apparatus may be greatly reduced, and a security inspector may move the terahertz security inspection apparatus manually to perform scanning of the imaging area.

    Gathering and sampling device and inspection apparatus

    公开(公告)号:US10782211B2

    公开(公告)日:2020-09-22

    申请号:US15858829

    申请日:2017-12-29

    Abstract: A sampling device and an inspection apparatus are disclosed. In one aspect, an example gathering and sampling device includes a cylindrical outer housing and an inner housing disposed within the cylindrical outer housing, a cyclone chamber is formed between the cylindrical outer housing and the inner housing to generate a cyclone by injecting a gas flow into the cyclone chamber. The gathering and sampling device further includes an outer chamber body, and a plurality of gas injection orifices formed in the first inner housing end opening of the inner housing and configured to inject a gas towards a substantial center of a circular region defined by an end face of the first outer housing end opening of the cylindrical outer housing.

    Dual energy detector and radiation inspection system

    公开(公告)号:US10386502B2

    公开(公告)日:2019-08-20

    申请号:US15853961

    申请日:2017-12-26

    Abstract: The present application relates to a dual energy detector and a radiation inspection system. The dual energy detector comprises: a detector module mount and a plurality of detector modules. The detector module includes a higher energy detector array and a lower energy detector array, which are juxtaposedly provided on said detector module mount to be independently irradiated. The present application may simplify the arrangement of the photodiodes and printed circuit boards to which the higher and lower energy detector arrays are connected, such that necessary thickness dimension of the detector module mount is reduced, thereby facilitating the installation and use of the dual energy detector of the present application. On the other hand, the radiation beam in the present application may be independently irradiated to the higher and lower energy detector arrays juxtaposed to each other, which reduces to certain extent the mutual restriction during selection of the higher and lower energy detector arrays.

    Darkroom type security inspection apparatus and method

    公开(公告)号:US10281431B2

    公开(公告)日:2019-05-07

    申请号:US15271713

    申请日:2016-09-21

    Abstract: The present invention discloses darkroom type security inspection apparatus and method. An apparatus comprises a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing are communicated by fittings or connectors and comprises: a sampling assembly comprising a sample collecting unit and a conveyer unit configured to convey an object to be inspected into the sample collecting unit; a sample processing assembly configured to concentrate and analyze the sample; and, an inspecting assembly configured to inspect composition of the sample by means of a gas chromatographic-ion mobility spectrometer (GC-IMS) or a separated ion mobility spectrometer (IMS). The security inspection apparatus of the present invention can perform the sampling easy, rapidly and effectively and perform the inspection accurately and rapidly without destroying and unpacking an object to be inspected, and thus is suitable for requirements of on-site rapid inspection of forbidden items in the airport, customs and the likes.

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