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公开(公告)号：US12235431B2
公开(公告)日：2025-02-25
申请号：US17468248
申请日：2021-09-07
Applicant: Carl Zeiss Microscopy GmbH
Inventor： Martin Müller
IPC: G02B21/24
Abstract: The invention relates to a device for incorporation into a microscope comprising a stator for connecting to a static component of a microscope and a rotor arranged rotatably relative to the stator. The rotor has mounting locations for receiving microscope components. An electrical rotary feedthrough is present comprising a first part, which is connected to the stator, and a second part, which is connected to the rotor. At least one electrical connection is formed via the electrical rotary feedthrough between the stator and the rotor and an electrical connection is formed on the rotor from the second part of the rotary feedthrough to at least one of the mounting locations for the purpose of electrically contacting a microscope component. The invention also relates to a microscope and a method for contacting microscope components on a rotor of a microscope.
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公开(公告)号：US20250037435A1
公开(公告)日：2025-01-30
申请号：US18782142
申请日：2024-07-24
Applicant: Carl Zeiss Microscopy GmbH
Inventor： Manuel Amthor , Daniel Haase
IPC: G06V10/774 , G06T11/00 , G06V10/40 , G06V20/69 , G06V20/70
Abstract: A computer-implemented method for generating pairs of registered microscope images includes training a generative model to create generated microscope images from input feature vectors comprising feature variables. The training uses image data sets which respectively contain microscope images of microscopic objects but which differ in an imaging/image property. It is identified which of the feature variables are object feature variables, which define at least object positions of microscopic objects in generated microscope images, and which of the feature variables are imaging-property feature variables, which determine a depiction of the microscopic objects in generated microscope images depending on the imaging/image property. At least a pair of generated microscope images is created from feature vectors with corresponding object feature variables and differing imaging-property feature variables, so that the generated microscope images show objects with corresponding object positions, but with a difference in the imaging/image property.
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公开(公告)号：US12204082B2
公开(公告)日：2025-01-21
申请号：US17602086
申请日：2019-04-09
Inventor： Tiemo Anhut , Daniel Schwedt , Ivan Michel Antolovic , Claudio Bruschini , Edoardo Charbon
Abstract: A light microscope has a light source for illuminating a specimen, a sensor array comprised of photon-counting detector elements for measuring detection light coming from the specimen, and a control device for controlling the sensor array. The control device is configured for flexibly binning the photon-counting detector elements into one or more super-pixels.
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公开(公告)号：US20240371597A1
公开(公告)日：2024-11-07
申请号：US18654627
申请日：2024-05-03
Applicant: Carl Zeiss Microscopy GmbH
Inventor： Dirk Preikszas , Juergen Pommerenke
IPC: H01J37/153 , H01J37/141
Abstract: A multipole element for creating a magnetic multipole field or for creating an electric-magnetic multipole field for a particle beam system such as a scanning electron microscope, for example, comprises: a tube surrounding a central axis of the multipole element; an external space assembly arranged outside of the tube and a vacuum space assembly arranged within the tube. The external space assembly comprises: a magnetically conductive circumferential pole piece surrounding the tube; a plurality of magnetically conductive supports arranged so as to be distributed around the central axis and extending from the circumferential pole piece up to an outer wall surface of the tube; and a plurality of coils. The vacuum space assembly comprises a plurality of magnetically conductive pole pieces arranged so as to be distributed around the central axis and extending from the tube in the direction of the central axis.
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公开(公告)号：US20240319487A1
公开(公告)日：2024-09-26
申请号：US18598162
申请日：2024-03-07
Applicant: Carl Zeiss Microscopy GmbH
Inventor： Nils Langholz , Markus Sticker , Thomas Nobis
CPC classification number: G02B21/367 , G02B21/04 , G02B21/361
Abstract: According to a method for autofocusing on a microscopic sample, measurement light having a local structure is generated. The measurement light is coupled into the microscope beam path, whereby the measurement light is incident on, and reflected by, the sample. The measurement light reflected by the sample is output from the microscope beam path and split among a plurality of component beam paths which pass over optical paths of different lengths to image the reflected measurement light, whereby a plurality of measurement images assigned to different focus positions on the microscope beam path are obtained. At least the measurement image which comes closest to an ideal image of the local structure of the measurement light is selected. Depending on the focus position assigned to the selected measurement image, a focus position to be used on the microscope beam path for the purpose of microscopic imaging of the sample is set.
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Patent Agency Ranking
公开(公告)号：US12099174B2
公开(公告)日：2024-09-24
申请号：US17498339
申请日：2021-10-11
Applicant: Carl Zeiss Microscopy GmbH
Inventor： Daniel Haase , Manuel Amthor , Markus Sticker , Sebastian Backs , Thomas Ohrt , Christian Dietrich
CPC classification number: G02B21/0052 , G02B21/06 , G02B21/367 , G06N20/00
Abstract: A method for generating an overview image of a sample which is arranged in an observation volume of a microscope by means of a sample carrier is proposed, wherein the sample carrier is illuminated by a first illumination, wherein a preliminary overview image is generated using the first illumination and an overview camera of the microscope, wherein an overview image illumination is chosen on the basis of the preliminary overview image, wherein the sample carrier is illuminated by the overview illumination, and wherein the overview image is generated using the overview image illumination and the overview camera.
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公开(公告)号：US20240312760A1
公开(公告)日：2024-09-19
申请号：US18606665
申请日：2024-03-15
Applicant: Carl Zeiss Microscopy GmbH
Inventor： Bjoern Gamm
Abstract: In a method for operating a particle beam microscope, an image of an object region is generated by virtue of a particle beam being directed to a multiplicity of incidence locations within the object region. Particles are detected and a data record is generated. The data record represents the image by a field of pixels, with a position of the pixel in the field representing the incidence location and a pixel value of the pixel representing an intensity of the detected particles at the incidence location. In order to generate an image with an increased number of pixels, at least two images of the object region are generated in succession with a fewer number of pixels and the data records representing the at least two images are supplied to an image processing program which generates the data record representing the image with the greater number of pixels therefrom.
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公开(公告)号：US20240304410A1
公开(公告)日：2024-09-12
申请号：US18600212
申请日：2024-03-08
Applicant: Carl Zeiss Microscopy GmbH
Inventor： Erik Essers
IPC: H01J37/26 , H01J37/14 , H01J37/147 , H01J37/244
CPC classification number: H01J37/26 , H01J37/14 , H01J37/147 , H01J37/244 , H01J2237/049 , H01J2237/141 , H01J2237/1415 , H01J2237/2443
Abstract: An electron beam microscope comprises an electron beam source, a beam tube, a magnetic objective lens, an object holder, a scintillator arrangement, a detector arrangement and a potential supply system. The power supply system supplies: i) the object holder with a potential U1; ii) the beam tube with a potential U2; iii) a pole end of the objective lens with a potential U3; iv) a scintillator body of the scintillator arrangement with a potential; and v) a light detector of the detector arrangement with a potential U5, such that:
(
U
2
-
U
5
)
≥
5000
V
;
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4
-
U
1
)
≥
0.1
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2
-
U
1
)
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U
4
-
U
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≥
0.1
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U
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-
U
5
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≤
0.3
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-
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公开(公告)号：US20240266139A1
公开(公告)日：2024-08-08
申请号：US18431498
申请日：2024-02-02
Applicant: Carl Zeiss Microscopy GmbH
Inventor： Ramu Pradip
IPC: H01J37/08 , H01J37/244
CPC classification number: H01J37/08 , H01J37/244 , H01J2237/24585 , H01J2237/24592
Abstract: Operating an ion beam source comprises operating the ion beam source in a beam generation mode and operating the ion beam source in a decontamination mode. Operating in beam generation mode includes generating an ion beam from ions emitted from a tip. Operating in decontamination mode includes supplying power to a heating wire to raise the temperature of the heating wire to a decontamination temperature, measuring a change over time of a physical property indicating a temperature of the heating wire while the power is supplied to the heating wire, and displaying an indication based on the measured change over time of the physical property and/or storing a change value based on the measure change over time of the physical property. The ion beam source comprises the heating wire, a metal reservoir mechanically connected to the heating wire, and the tip mechanically connected to the metal reservoir.
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公开(公告)号：US20240257313A1
公开(公告)日：2024-08-01
申请号：US18423154
申请日：2024-01-25
Applicant: CARL ZEISS MICROSCOPY GMBH
Inventor： Thomas Kalkbrenner , Joerg Engel , Joerg Siebenmorgen
IPC: G06T5/50 , G06V10/141
CPC classification number: G06T5/50 , G06V10/141 , G06T2207/20221
Abstract: Generating an overview image of an object includes, during a first capture duration, scanning regions of the object along a trajectory with illumination radiation, where the trajectory is chosen individually on the basis of properties of the object. First images of the object which together with position data (x, y, z) of an absolute distance measurement system are stored as an individual overview image are captured during the scanning of the trajectory. During a second capture duration, at least regions of the object are scanned with illumination radiation, and second images are captured; regions of the object which have already been imaged during the first capture duration are not imaged again. The first images captured during the first capture duration and the second images captured during the second capture duration are merged to form a resultant overview image of the object.
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