HIGH SENSITIVITY PHASE MICROSCOPY IMAGING

    公开(公告)号:US20210325653A1

    公开(公告)日:2021-10-21

    申请号:US17273255

    申请日:2019-09-04

    IPC分类号: G02B21/14 G02B21/36

    摘要: Device for phase microscopy comprising: a spatial light modulator, a connecting means adapted to fix the spatial light modulator onto a phase microscope, said phase microscope comprising a light path comprising at least a sample area, a lighting device for lighting said sample area and an imaging device for capturing a phase image of said sample, said phase image being a 2D matrix of pixels, so that the spatial light modulator is positioned in the light path in a conjugated plane of the sample area and a command of the spatial light modulator connected to the imaging device and adapted to measure the phase shift of a plurality of pixels of the phase image and to command the spatial light modulator in order to subtract the measured phase shifts.