摘要:
A differential current signal circuit is described which includes a voltage to differential current converter circuit that generates a differential pair of current output signals in response to receiving a voltage input signal, where the differential pair of current output signals are linearly proportional to the voltage input signal within a voltage operating range from a minimum operating voltage to a maximum operating voltage. The differential pair of current output signals are linear over a wide range of voltage input signals. A correction circuit is included which eliminates voltage offsets in the voltage operating range due to process and temperature variations. The correction circuit also provides the capability to adjust the minimum operating voltage, and eliminates variations in the minimum operating voltage due to process and temperature variations.
摘要:
A converter (200) adapted to convert an analog input signal into a digital output signal includes an analog input terminal (205) for receiving the analog input signal, a Redundant Signed Digit (RSD) stage (210) coupled to the analog input terminal, and a digital section (220). The RSD stage is configured to receive the analog input signal at the analog input terminal, produce a first number of bits at a digital output from the analog input signal during a first half of a first clock cycle, provide a residual feedback signal of the analog input signal at the analog input terminal during a second half of the first clock cycle, and produce a second number of bits at the digital output from the residual feedback signal during a first half of a second clock cycle, the second number of bits less than the first number of bits.
摘要:
The present invention provides a method for tiling an integrated circuit having a critically matched device such as a transistor. The method obtains an advantage of automatically improving metallic density over critically matched devices thus yielding improved CMP. The method may include the steps of: identifying critically matched devices in the integrated circuit; placing metal tiles over the critically matched device; performing a density test around each critically matched device; and if a density test is not satisfied around a critically matched device, placing at least one metal strip over a critically matched device.
摘要:
A differential current signal circuit is described which includes a voltage to differential current converter circuit that generates a differential pair of current output signals in response to receiving a voltage input signal, where the differential pair of current output signals are linearly proportional to the voltage input signal within a voltage operating range from a minimum operating voltage to a maximum operating voltage. The differential pair of current output signals are linear over a wide range of voltage input signals. A correction circuit is included which eliminates voltage offsets in the voltage operating range due to process and temperature variations. The correction circuit also provides the capability to adjust the minimum operating voltage, and eliminates variations in the minimum operating voltage due to process and temperature variations.
摘要:
A double sampled switched capacitor architecture as described herein includes an amplifier having two separate inputs corresponding to two separate amplifier sections. The amplifier uses a first differential transistor pair for the first amplifier section, a second differential transistor pair for the second amplifier section, a first tail current bias arrangement for the first differential transistor pair, and a second tail current bias arrangement for the second differential transistor pair. The tail current bias arrangements are driven by a bias switching architecture that alternately activates one tail current bias arrangement while at least partially deactivating the other tail current bias arrangement. The amplifier and bias switching architecture cooperate to eliminate gain error that would otherwise be caused by a common parasitic capacitance shared by a single amplifier section.
摘要:
A method for placing tiles in an integrated circuit has matched devices that includes the steps of (1) calculating a metal spacing for tiles to be placed adjacent to the matched device in the integrated circuit; (2) calculating a lateral spacing for tiles to be placed adjacent to the matched device in the integrated circuit; (3) placing tiles about the matched device based on the metal spacing and the lateral spacing; (4) performing a density test in an area around the matched device; and (5) if a density test is not satisfied in the area around the matched device, dividing the matched device into at least two subdevices and repeating, with respect to each subdevice, the steps of calculating a metal spacing, calculating a lateral spacing, and placing tiles about each subdevice. The method is further adaptable to various kinds of matched devices including poly resistors, diffused resistors, double-poly capacitors, metal-insulator-metal capacitors, and fringe capacitors.
摘要:
A double sampled switched capacitor architecture as described herein includes an amplifier having two separate inputs corresponding to two separate amplifier sections. The amplifier uses a first differential transistor pair for the first amplifier section, a second differential transistor pair for the second amplifier section, a first tail current bias arrangement for the first differential transistor pair, and a second tail current bias arrangement for the second differential transistor pair. The tail current bias arrangements are driven by a bias switching architecture that alternately activates one tail current bias arrangement while at least partially deactivating the other tail current bias arrangement. The amplifier and bias switching architecture cooperate to eliminate gain error that would otherwise be caused by a common parasitic capacitance shared by a single amplifier section.
摘要:
A double sampled switched capacitor architecture as described herein includes an amplifier having two separate inputs corresponding to two separate amplifier sections. The amplifier uses a first differential transistor pair for the first amplifier section, a second differential transistor pair for the second amplifier section, a first tail current bias arrangement for the first differential transistor pair, and a second tail current bias arrangement for the second differential transistor pair. The tail current bias arrangements are driven by a bias switching architecture that alternately activates one tail current bias arrangement while at least partially deactivating the other tail current bias arrangement. The amplifier and bias switching architecture cooperate to eliminate gain error that would otherwise be caused by a common parasitic capacitance shared by a single amplifier section.
摘要:
A switched-capacitor gain stage suitable for use with a pipelined analog to digital converter (“ADC”) is capable of processing two or more input channels. The analog input voltages from the multiple channels are concurrently sampled (every other clock phase), and the gain stage processes the samples using a double sampling technique, generates residual voltage samples (every clock phase), and generates digital outputs for the multiple channels in an alternating manner. The gain stage provides equal input loading for the input stages, which enhances the performance of the ADC.
摘要:
A converter (200) adapted to convert an analog input signal into a digital output signal includes an analog input terminal (205) for receiving the analog input signal, a Redundant Signed Digit (RSD) stage (210) coupled to the analog input terminal, and a digital section (220). The RSD stage is configured to receive the analog input signal at the analog input terminal, produce a first number of bits at a digital output from the analog input signal during a first half of a first clock cycle, provide a residual feedback signal of the analog input signal at the analog input terminal during a second half of the first clock cycle, and produce a second number of bits at the digital output from the residual feedback signal during a first half of a second clock cycle, the second number of bits less than the first number of bits.