公开(公告)号：US11703466B2

公开(公告)日：2023-07-18

申请号：US17909683

申请日：2021-02-22

Applicant: Halo X Ray Technologies Limited

Inventor： Anthony Dicken

IPC: G01N23/207

CPC classification number: G01N23/207 ,  G01N2223/1016

Abstract: A sample inspection system and a corresponding method for inspecting a sample is provided. The sample inspection system includes a beam former, a beam modulator an energy resolving detector and a collimator. The beam former is adapted to receive an electromagnetic radiation from an electromagnetic source to generate a primary beam of electromagnetic radiation. The beam modulator is provided at a distance from the beam former to define a sample chamber. The collimator is provided between the beam modulator and the energy resolving detector. The collimator has a plurality of channels adapted to receive diffracted or scattered radiation. Upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation. The energy resolving detector is arranged to detect the reference beam.

公开(公告)号：US11913890B1

公开(公告)日：2024-02-27

申请号：US18281237

申请日：2022-01-06

Applicant: Halo X Ray Technologies Limited

Inventor： Anthony Dicken ,  Daniel Spence

IPC: G01N23/10 ,  G01N23/044 ,  G01N23/087 ,  G01N23/20 ,  G01N23/20008 ,  G01N23/20091 ,  G01N23/205 ,  G01N23/2055

CPC classification number: G01N23/10 ,  G01N23/044 ,  G01N23/087 ,  G01N23/20008 ,  G01N23/20083 ,  G01N23/20091 ,  G01N23/205 ,  G01N23/2055 ,  G01N2223/045 ,  G01N2223/0561 ,  G01N2223/0563 ,  G01N2223/0566 ,  G01N2223/1016 ,  G01N2223/316 ,  G01N2223/3306 ,  G01N2223/401 ,  G01N2223/402 ,  G01N2223/403 ,  G01N2223/41 ,  G01N2223/419 ,  G01N2223/421 ,  G01N2223/423 ,  G01N2223/639

Abstract: There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (100), a rotatable platform (310) to receive the item, and a mechanical arrangement (320, 330). The detection apparatus has an emitter portion to generate a primary beam of ionising radiation and a detector portion to detect an absorption signal and at least one of a diffraction signal and a scattering signal. The mechanical arrangement is adapted to translate the detection apparatus along a translation axis to scan the item with the primary beam. The screening system may be used for identifying restricted or illicit substances that may be present in some luggage or in mail.

公开(公告)号：US20240044813A1

公开(公告)日：2024-02-08

申请号：US18281237

申请日：2022-01-06

Applicant: Halo X Ray Technologies Limited

Inventor： Anthony DICKEN ,  Daniel SPENCE

IPC: G01N23/10 ,  G01N23/20008

CPC classification number: G01N23/10 ,  G01N23/20008 ,  G01N2223/045 ,  G01N2223/639

Abstract: There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (100), a rotatable platform (310) to receive the item, and a mechanical arrangement (320, 330). The detection apparatus has an emitter portion to generate a primary beam of ionising radiation and a detector portion to detect an absorption signal and at least one of a diffraction signal and a scattering signal. The mechanical arrangement is adapted to translate the detection apparatus along a translation axis to scan the item with the primary beam. The screening system may be used for identifying restricted or illicit substances that may be present in some luggage or in mail.

公开(公告)号：US20230118850A1

公开(公告)日：2023-04-20

申请号：US17909683

申请日：2021-02-22

Applicant: Halo X Ray Technologies Limited

Inventor： Anthony DICKEN

IPC: G01N23/207

Abstract: A sample inspection system and a corresponding method for inspecting a sample is provided. The sample inspection system includes a beam former, a beam modulator an energy resolving detector and a collimator. The beam former is adapted to receive an electromagnetic radiation from an electromagnetic source to generate a primary beam of electromagnetic radiation. The beam modulator is provided at a distance from the beam former to define a sample chamber. The collimator is provided between the beam modulator and the energy resolving detector. The collimator has a plurality of channels adapted to receive diffracted or scattered radiation. Upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation. The energy resolving detector is arranged to detect the reference beam.