公开(公告)号：US20240280514A1

公开(公告)日：2024-08-22

申请号：US18648564

申请日：2024-04-29

申请人： Battelle Memorial Institute

发明人： Rodney Arthur HALLGREN ,  Michael Ryan HAUSLER ,  Allen Kwame ANDERSON

IPC分类号： G01N23/10 ,  G01N23/04 ,  G01N23/046 ,  G01N23/083 ,  G01N23/087 ,  G01V5/22 ,  G06T11/00

CPC分类号： G01N23/10 ,  G01N23/04 ,  G01N23/046 ,  G01N23/083 ,  G01N23/087 ,  G01V5/22 ,  G06T11/001 ,  G01N2223/04 ,  G01N2223/306 ,  G01N2223/3307 ,  G01N2223/401 ,  G01N2223/403 ,  G01N2223/408 ,  G01N2223/639

摘要： In an approach to X-ray inspection image display systems, a colorized X-ray inspection image is received comprising a monochrome X-ray inspection image that is colorized in accordance with an X-ray inspection system false colorization scheme. The colorized X-ray inspection image is filtered by performing pixel shading on the colorized X-ray inspection image to generate a custom colorized X-ray inspection image having a custom false colorization scheme that is different from the X-ray inspection system false colorization scheme.

公开(公告)号：US12007341B2

公开(公告)日：2024-06-11

申请号：US17579644

申请日：2022-01-20

申请人： Battelle Memorial Institute

发明人： Rodney Arthur Hallgren ,  Michael Ryan Hausler ,  Allen Kwame Anderson

IPC分类号： G01N23/04 ,  G01N23/046 ,  G01N23/083 ,  G01N23/087 ,  G01N23/10 ,  G01V5/00 ,  G06T11/00

CPC分类号： G01N23/10 ,  G01N23/04 ,  G01N23/046 ,  G01N23/083 ,  G01N23/087 ,  G01V5/0016 ,  G06T11/001 ,  G01N2223/04 ,  G01N2223/306 ,  G01N2223/3307 ,  G01N2223/401 ,  G01N2223/403 ,  G01N2223/408 ,  G01N2223/639

摘要： In an approach to X-ray inspection image display systems, a colorized X-ray inspection image is received comprising a monochrome X-ray inspection image that is colorized in accordance with an X-ray inspection system false colorization scheme. The colorized X-ray inspection image is filtered by performing pixel shading on the colorized X-ray inspection image to generate a custom colorized X-ray inspection image having a custom false colorization scheme that is different from the X-ray inspection system false colorization scheme.

公开(公告)号：US11913890B1

公开(公告)日：2024-02-27

申请号：US18281237

申请日：2022-01-06

申请人： Halo X Ray Technologies Limited

发明人： Anthony Dicken ,  Daniel Spence

IPC分类号： G01N23/10 ,  G01N23/044 ,  G01N23/087 ,  G01N23/20 ,  G01N23/20008 ,  G01N23/20091 ,  G01N23/205 ,  G01N23/2055

CPC分类号： G01N23/10 ,  G01N23/044 ,  G01N23/087 ,  G01N23/20008 ,  G01N23/20083 ,  G01N23/20091 ,  G01N23/205 ,  G01N23/2055 ,  G01N2223/045 ,  G01N2223/0561 ,  G01N2223/0563 ,  G01N2223/0566 ,  G01N2223/1016 ,  G01N2223/316 ,  G01N2223/3306 ,  G01N2223/401 ,  G01N2223/402 ,  G01N2223/403 ,  G01N2223/41 ,  G01N2223/419 ,  G01N2223/421 ,  G01N2223/423 ,  G01N2223/639

摘要： There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (100), a rotatable platform (310) to receive the item, and a mechanical arrangement (320, 330). The detection apparatus has an emitter portion to generate a primary beam of ionising radiation and a detector portion to detect an absorption signal and at least one of a diffraction signal and a scattering signal. The mechanical arrangement is adapted to translate the detection apparatus along a translation axis to scan the item with the primary beam. The screening system may be used for identifying restricted or illicit substances that may be present in some luggage or in mail.

公开(公告)号：US09541512B2

公开(公告)日：2017-01-10

申请号：US14125934

申请日：2012-06-13

申请人： Ronald Walsworth ,  Jeff Lichtman ,  Narayanan Kasthuri ,  David Glenn ,  Huiliang Zhang ,  Richard Schalek

发明人： Ronald Walsworth ,  Jeff Lichtman ,  Narayanan Kasthuri ,  David Glenn ,  Huiliang Zhang ,  Richard Schalek

IPC分类号： G01N23/225 ,  H01J37/22 ,  H01J37/244 ,  G01N33/543

CPC分类号： G01N23/2254 ,  G01N33/54373 ,  G01N2223/403 ,  G01N2223/418 ,  G01N2223/612 ,  H01J37/22 ,  H01J37/244 ,  H01J2237/225 ,  H01J2237/2808

摘要： Multi-color CL images of nanoparticle samples may be generated, by irradiating with a scanning electron beam a nanoparticle sample that containing a plurality of spectrally distinct optical emitters configured to generate CL light at respective different color channels, then detecting the CL light from the nanoparticles to generate multi-color NP-CL images of the nanoparticle sample. In some embodiments, SE (secondary electron) images of the sample may be acquire, substantially simultaneously with the acquisition of the CL images, so as to generate correlative NP-CL and SE images of the nanoparticle sample. In some embodiments, the nanoparticles may be surface-functionalized so that the nanoparticles selectively bind only to particular structures of interest.

摘要翻译： 可以通过用扫描电子束照射纳米颗粒样品来产生纳米颗粒样品的多色CL图像，所述纳米颗粒样品包含被配置为在各个不同颜色通道产生CL光的多个光谱不同的光发射器，然后检测来自纳米颗粒的CL光 以产生纳米颗粒样品的多色NP-CL图像。 在一些实施例中，样本的SE（二次电子）图像可以在获取CL图像的同时获取，以便产生纳米颗粒样品的相关NP-CL和SE图像。 在一些实施方案中，纳米颗粒可以被表面官能化，使得纳米颗粒选择性地仅结合特定的感兴趣结构。

公开(公告)号：US11703465B2

公开(公告)日：2023-07-18

申请号：US17168491

申请日：2021-02-05

申请人： Kioxia Corporation

发明人： Nobuhito Kuge ,  Toshihisa Fujiwara ,  Yui Fujiwara ,  Chisaki Usui

IPC分类号： G01N23/207 ,  G01N23/2055

CPC分类号： G01N23/207 ,  G01N23/2055 ,  G01N2223/0561 ,  G01N2223/0566 ,  G01N2223/1016 ,  G01N2223/3037 ,  G01N2223/331 ,  G01N2223/3308 ,  G01N2223/403 ,  G01N2223/607 ,  G01N2223/6116

摘要： An apparatus for inspecting a semiconductor device according to an embodiment includes an X-ray irradiation unit configured to make monochromatic X-rays obliquely incident on the semiconductor device, which is an object at a predetermined angle of incidence, a detection unit configured to detect observed X-rays observed from the object using a plurality of two-dimensionally disposed photodetection elements, an analysis apparatus configured to generate X-ray diffraction images obtained by photoelectrically converting the observed X-rays, and a control unit configured to change an angle of incidence and a detection angle of the X-rays, in which the analysis apparatus acquires an X-ray diffraction image every time the angle of incidence is changed, extracts a peak X-ray diffraction image, X-ray intensity of which becomes maximum for each of pixels and compares the peak X-ray diffraction image among the pixels to thereby estimate a stress distribution of the object.

公开(公告)号：US20140194314A1

公开(公告)日：2014-07-10

申请号：US14125934

申请日：2012-06-13

申请人： Ronald Walsworth ,  Jeff Lichtman ,  Narayanan Kasthuri ,  David Glenn ,  Huiliang Zhang ,  Richard Schalek

发明人： Ronald Walsworth ,  Jeff Lichtman ,  Narayanan Kasthuri ,  David Glenn ,  Huiliang Zhang ,  Richard Schalek

IPC分类号： G01N23/225 ,  G01N33/543

CPC分类号： G01N23/2254 ,  G01N33/54373 ,  G01N2223/403 ,  G01N2223/418 ,  G01N2223/612 ,  H01J37/22 ,  H01J37/244 ,  H01J2237/225 ,  H01J2237/2808

摘要： Multi-color CL images of nanoparticle samples may be generated, by irradiating with a scanning electron beam a nanoparticle sample that containing a plurality of spectrally distinct optical emitters configured to generate CL light at respective different color channels, then detecting the CL light from the nanoparticles to generate multi-color NP-CL images of the nanoparticle sample. In some embodiments, SE (secondary electron) images of the sample may be acquire, substantially simultaneously with the acquisition of the CL images, so as to generate correlative NP-CL and SE images of the nanoparticle sample. In some embodiments, the nanoparticles may be surface-functionalized so that the nanoparticles selectively bind only to particular structures of interest.

摘要翻译： 可以通过用扫描电子束照射纳米颗粒样品来产生纳米颗粒样品的多色CL图像，所述纳米颗粒样品包含被配置为在各个不同颜色通道产生CL光的多个光谱不同的光发射器，然后检测来自纳米颗粒的CL光 以产生纳米颗粒样品的多色NP-CL图像。 在一些实施例中，样本的SE（二次电子）图像可以在获取CL图像的同时获取，以便产生纳米颗粒样品的相关NP-CL和SE图像。 在一些实施方案中，纳米颗粒可以被表面官能化，使得纳米颗粒选择性地仅结合特定的感兴趣结构。