Memory module and memory system having the same

    公开(公告)号:US20060176723A1

    公开(公告)日:2006-08-10

    申请号:US11325083

    申请日:2006-01-04

    IPC分类号: G11C5/02

    摘要: A memory module and a memory system are provided. The memory module includes a first circuit board on which at least one memory chip is mounted, a second circuit board on which at least one memory chip is mounted, and a flexible coupler electrically connecting the first circuit board to the second circuit board. The memory module is bendable and is configured to extend around a memory controller. The memory chips are electrically coupled with the memory controller via a respective plurality of signal lines. The bendable memory module is configured to be bent around the memory controller such that respective lengths of the signal lines are equal.

    METHODS OF BOOTING INFORMATION HANDLING SYSTEMS AND INFORMATION HANDLING SYSTEMS PERFORMING THE SAME
    3.
    发明申请
    METHODS OF BOOTING INFORMATION HANDLING SYSTEMS AND INFORMATION HANDLING SYSTEMS PERFORMING THE SAME 审中-公开
    信息处理系统和信息处理系统执行方法

    公开(公告)号:US20120191964A1

    公开(公告)日:2012-07-26

    申请号:US13314666

    申请日:2011-12-08

    IPC分类号: G06F9/00 G06F12/00

    摘要: A method of booting an information handling system including a volatile memory device to be selectively tested during a booting operation, the method comprising a step of reading current system configuration information from the information handling system, a step of comparing the current system configuration information with corresponding prestored system configuration information in a nonvolatile memory device, and a step of selectively performing a test for the volatile memory device according to a result of the comparison.

    摘要翻译: 一种引导包括易失性存储器件的信息处理系统的方法,在引导操作期间被选择性地测试,所述方法包括从信息处理系统读取当前系统配置信息的步骤,将当前系统配置信息与相应的 非易失性存储装置中的预先存储的系统配置信息,以及根据比较结果选择性地对易失性存储装置进行测试的步骤。

    Memory module with parallel testing
    4.
    发明授权
    Memory module with parallel testing 失效
    内存模块并行测试

    公开(公告)号:US07246280B2

    公开(公告)日:2007-07-17

    申请号:US11086059

    申请日:2005-03-22

    IPC分类号: G11C29/00

    摘要: Each memory chip of a memory module tests a total of N data bits from X memory blocks for efficient testing and outputs N/X test data bits from one of the memory blocks. A memory module includes a plurality of memory chips and a plurality of comparison units. Each comparison unit is disposed within a respective memory chip for testing a plurality of test data bits from a plurality of memory blocks. In addition, each comparison unit outputs test data bits from one of the memory blocks within the respective memory chip.

    摘要翻译: 存储器模块的每个存储器芯片测试来自X个存储器块的总共N个数据位用于有效测试,并从其中一个存储器块输出N / X个测试数据位。 存储器模块包括多个存储器芯片和多个比较单元。 每个比较单元设置在相应的存储器芯片内,用于从多个存储器块测试多个测试数据位。 此外,每个比较单元从相应的存储器芯片内的一个存储器块输出测试数据位。

    System controlling interface timing in memory module and related method
    5.
    发明授权
    System controlling interface timing in memory module and related method 有权
    内存模块中的系统控制接口时序及相关方法

    公开(公告)号:US07421558B2

    公开(公告)日:2008-09-02

    申请号:US11256108

    申请日:2005-10-24

    IPC分类号: G06F12/06

    CPC分类号: G06F13/1689 G06F13/1694

    摘要: A memory system for controlling interface timing in a memory module and a related timing control method are disclosed. The memory system comprises a memory module having a memory module controller configured to control interface timing of a plurality of memory devices in accordance with memory information and memory signal information. The memory information includes memory initialization information and interface timing information for the plurality of memory devices.

    摘要翻译: 公开了一种用于控制存储器模块中的接口定时的存储系统和相关的定时控制方法。 存储器系统包括具有存储器模块控制器的存储器模块,存储器模块控制器被配置为根据存储器信息和存储器信号信息来控制多个存储器件的接口定时。 存储器信息包括用于多个存储器件的存储器初始化信息和接口定时信息。

    Memory module with parallel testing
    6.
    发明申请
    Memory module with parallel testing 失效
    内存模块并行测试

    公开(公告)号:US20080005631A1

    公开(公告)日:2008-01-03

    申请号:US11811551

    申请日:2007-06-11

    IPC分类号: G11C29/08

    摘要: Each memory chip of a memory module tests a total of N data bits from X memory blocks for efficient testing and outputs N/X data bits from one of the memory blocks. A memory module includes a plurality of memory chips and a plurality of comparison units. Each comparison unit is disposed within a respective memory chip for testing a plurality of data bits from a plurality of memory blocks. In addition, each comparison unit outputs data bits from one of the memory blocks within the respective memory chip.

    摘要翻译: 存储器模块的每个存储器芯片测试来自X个存储器块的总共N个数据位用于有效测试,并从其中一个存储器块输出N / X数据位。 存储器模块包括多个存储器芯片和多个比较单元。 每个比较单元设置在相应的存储器芯片内,用于从多个存储器块测试多个数据位。 此外,每个比较单元从相应的存储器芯片内的一个存储块输出数据位。

    System controlling interface timing in memory module and related method
    7.
    发明申请
    System controlling interface timing in memory module and related method 有权
    内存模块中的系统控制接口时序及相关方法

    公开(公告)号:US20060090054A1

    公开(公告)日:2006-04-27

    申请号:US11256108

    申请日:2005-10-24

    IPC分类号: G06F13/00

    CPC分类号: G06F13/1689 G06F13/1694

    摘要: A memory system for controlling interface timing in a memory module and a related timing control method are disclosed. The memory system comprises a memory module having a memory module controller configured to control interface timing of a plurality of memory devices in accordance with memory information and memory signal information. The memory information includes memory initialization information and interface timing information for the plurality of memory devices.

    摘要翻译: 公开了一种用于控制存储器模块中的接口定时的存储系统和相关的定时控制方法。 存储器系统包括具有存储器模块控制器的存储器模块,存储器模块控制器被配置为根据存储器信息和存储器信号信息来控制多个存储器件的接口定时。 存储器信息包括用于多个存储器件的存储器初始化信息和接口定时信息。

    Memory module with parallel testing
    8.
    发明申请
    Memory module with parallel testing 失效
    内存模块并行测试

    公开(公告)号:US20050216809A1

    公开(公告)日:2005-09-29

    申请号:US11086059

    申请日:2005-03-22

    摘要: Each memory chip of a memory module tests a total of N data bits from X memory blocks for efficient testing and outputs N/X test data bits from one of the memory blocks. A memory module includes a plurality of memory chips and a plurality of comparison units. Each comparison unit is disposed within a respective memory chip for testing a plurality of test data bits from a plurality of memory blocks. In addition, each comparison unit outputs test data bits from one of the memory blocks within the respective memory chip.

    摘要翻译: 存储器模块的每个存储器芯片测试来自X个存储器块的总共N个数据位用于有效测试,并从其中一个存储器块输出N / X个测试数据位。 存储器模块包括多个存储器芯片和多个比较单元。 每个比较单元设置在相应的存储器芯片内,用于从多个存储器块测试多个测试数据位。 此外,每个比较单元从相应的存储器芯片内的一个存储器块输出测试数据位。

    METHOD OPTIMIZING DRIVING VOLTAGE AND ELECTRONIC SYSTEM
    9.
    发明申请
    METHOD OPTIMIZING DRIVING VOLTAGE AND ELECTRONIC SYSTEM 审中-公开
    方法优化驱动电压和电子系统

    公开(公告)号:US20110001467A1

    公开(公告)日:2011-01-06

    申请号:US12791241

    申请日:2010-06-01

    IPC分类号: G01R19/00

    摘要: A method of optimizing a driving voltage of an electronic device includes; iteratively varying the level of a driving voltage provided to the electronic device and performing an operation of the electronic device with each iteration until the operation fails, and then selecting as an operating level for the driving voltage, a level of the driving voltage for an iteration just prior to an iteration in which the operation fails.

    摘要翻译: 优化电子设备的驱动电压的方法包括: 迭代地改变提供给电子设备的驱动电压的电平,并且每次迭代执行电子设备的操作,直到操作失败,然后选择驱动电压的操作电平,用于迭代的驱动电压的电平 就在操作失败的迭代之前。

    Memory module and memory system having the same
    10.
    发明授权
    Memory module and memory system having the same 有权
    内存模块和内存系统具有相同的功能

    公开(公告)号:US07583509B2

    公开(公告)日:2009-09-01

    申请号:US11325083

    申请日:2006-01-04

    IPC分类号: H05K1/00

    摘要: A memory module and a memory system are provided. The memory module includes a first circuit board on which at least one memory chip is mounted, a second circuit board on which at least one memory chip is mounted, and a flexible coupler electrically connecting the first circuit board to the second circuit board. The memory module is bendable and is configured to extend around a memory controller. The memory chips are electrically coupled with the memory controller via a respective plurality of signal lines. The bendable memory module is configured to be bent around the memory controller such that respective lengths of the signal lines are equal.

    摘要翻译: 提供了存储器模块和存储器系统。 存储器模块包括其上安装有至少一个存储器芯片的第一电路板,安装至少一个存储器芯片的第二电路板和将第一电路板电连接到第二电路板的柔性耦合器。 存储器模块是可弯曲的并且被配置为围绕存储器控制器延伸。 存储器芯片通过相应的多个信号线与存储器控制器电耦合。 可弯曲存储器模块被配置为围绕存储器控制器弯曲,使得信号线的相应长度相等。