摘要:
A memory cell device having a vertical channel and a double gate structure is provided. More specifically, a memory cell device having a vertical channel and a double gate structure is characterized by having a pillar active region with a predetermined height, which is including a first semiconductor layer forming a first source/drain region, a second semiconductor layer being placed under the first semiconductor layer with a predetermined distance and forming a second source/drain region, and a third semiconductor layer forming a body region and a channel region between the first semiconductor layer and the second semiconductor layer, and therefore, there is no need for unnecessary contacts when it is used as a unit cell for any type of memory array, not to speak of NOR type flash memory array. And the present invention makes to program/erase more effectively and increase the read speed and the amount of sensing current.
摘要:
A nonvolatile memory device includes; a memory cell array designating a first memory cell group including first memory cells connected with a word line and disposed less than a reference distance from a word line voltage source in a word line direction, and a second memory cell group including second memory cells connected to the word line and disposed more than the reference distance from the word line voltage source in the word line direction, and control logic configured during a data processing operation to provide a first word line voltage to a first target memory cell among the first memory cells, and a second word line voltage different from the first word line voltage to a second target memory cell among the second memory cells.
摘要:
A flash memory device can include a semiconductor fin protruding from a semiconductor substrate of a first conductive type to extend in one direction, a first doped layer and a second doped layer provided to an upper portion and a lower portion of the semiconductor fin, respectively, to be vertically spaced apart from each other, the first and second doped layers having a second conductive type, and a plurality of word lines extending over a top and a sidewall of the semiconductor fin to intersect the direction. The word lines overlap the first doped layer and the second doped layer to have vertical channels.
摘要:
A NAND type flash memory array which is composed of a plurality of memory cells with a shallow junction on an SOI substrate to make the body region depleted fully when each channel of the memory cells is turned on is provided. The invention improves the efficiency of a reading operation, enables an erasing operation on the SOI structure and enables use of a low voltage VPASS instead of a high voltage VPASS, which is used for a programming operation in a conventional NAND type flash memory array, and therefore it diminishes programming disturbance more effectively than a conventional array.
摘要:
A fusing device for an image forming apparatus including a cylindrical fusing roller, a pressure roller installed opposite to the fusing roller and pressing a sheet of paper passing therebetween, and an inductive heating element simultaneously heating the fusing roller and the pressure roller. The fusing device reduces the time to reach a fusing temperature by heating both the fusing roller and the pressure roller with a closed magnetic core extending between hollow portions of each.
摘要:
The present invention relates to a semiconductor device, a memory array and a fabrication method thereof, and more particularly to a semiconductor device having a stacked array structure (referred to as a STAR structure: a STacked ARray structure) applicable to not only a switch device but also a memory device, a NAND flash memory array using the same as a memory device and a fabrication method thereof.
摘要:
According to example embodiments, a nonvolatile memory device includes a first memory cell configured to store a first data pattern, a second memory cell configured to be programmed using a program voltage, and a coupling program control unit. The coupling program control unit may be configured to perform a verification operation for verifying whether the first memory cell is programmed with the first data pattern. The verification operation may provide to the first memory cell a verification voltage corresponding to the first data pattern. The coupling program control unit may be configured to end programming the second memory cell when the verification operation on the first memory cell indicates a pass.
摘要:
A nonvolatile memory device, includes a semiconductor substrate having a bottom part, a second vertical part positioned vertically on the bottom part, and a first vertical part having a width smaller than a width of the second vertical part and positioned on the second vertical part to have a boundary step therebetween; a charge trap layer disposed on a lateral surface of the first vertical part and on an upper surface of the boundary step; and a control gate electrode disposed on an upper surface of the bottom part and on lateral surfaces of the second vertical part and the charge trap layer.
摘要:
A fusing device of an image forming apparatus and method thereof are provided. The fusing device and method include a conductive member having a linear portion for contacting a printing medium, a fusing film for sliding on a circumference of the conductive member, a pressing roller for contacting the fusing film in the linear portion, forming a fusing nip area, and rotating the fusing film, and an induction heating unit for heating the conductive member by induction and generating heat. The thickness of the conductive member in the fusing nip area is smaller than the thickness of the conductive member in other areas.
摘要:
Provided is a read method for a nonvolatile memory device for reading data with an optimum read voltage. The read method includes reading data of a first set of memory cells connected to a first word line, by dividing the data of the first set of memory cells into M pages and individually reading data from the M pages. The reading data includes performing an on-chip valley search (OVS) operation on a first valley of two adjacent threshold voltage distributions of the first set of memory cells when reading each of the M pages, and performing a data recover read operation via a read operation on a second word line adjacent to the first word line, based on a result of the OVS operation. In the data recover read operation, a read operation on the first word line is not performed.