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公开(公告)号:US06494361B1
公开(公告)日:2002-12-17
申请号:US09770861
申请日:2001-01-26
申请人: Christopher Scanlan , Jon G. Aday
发明人: Christopher Scanlan , Jon G. Aday
IPC分类号: B23K3102
CPC分类号: H01L24/81 , B23K2101/40 , H01L21/4853 , H01L2224/81801 , H01L2924/01006 , H01L2924/01013 , H01L2924/01029 , H01L2924/01033 , H01L2924/0105 , H01L2924/01079 , H01L2924/01082 , H01L2924/01322 , H01L2924/01327 , H01L2924/014 , H01L2924/14 , H01L2924/15311 , H05K3/282 , H05K3/3484
摘要: Organic solderability protectant (OSP) is applied to copper bond pads. The copper bond pads include flip chip bond pads and SMD bond pads on a dielectric upper surface and BGA bond pads on a dielectric lower surface. Solder paste is applied to the flip chip bond pads. This solder paste is reflowed in an inert atmosphere to form solder-on-pads (SOPs) on the flip chip bond pads. Flux residue from the solder paste is then removed with water. By reflowing the solder paste in an inert atmosphere and removing the flux residue with water, degradation of the OSP and oxidation of the SMD and BGA bond pads is inhibited.
摘要翻译: 有机可焊性保护剂(OSP)应用于铜焊盘。 铜接合焊盘包括在电介质上表面上的倒装芯片接合焊盘和SMD接合焊盘,以及介电下表面上的BGA接合焊盘。 将焊膏施加到倒装芯片接合焊盘。 该焊膏在惰性气氛中回流以在倒装芯片接合焊盘上形成焊接焊盘(SOP)。 然后用水去除焊膏中的焊剂残留物。 通过在惰性气氛中回流焊膏并用水除去助焊剂残留物,抑制OSP的降解和SMD和BGA接合焊盘的氧化。
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公开(公告)号:US5969461A
公开(公告)日:1999-10-19
申请号:US057144
申请日:1998-04-08
申请人: Michael J. Anderson , Gregory Kennison , Jeffrey E. Christensen , Gary C. Johnson , Jon G. Aday
发明人: Michael J. Anderson , Gregory Kennison , Jeffrey E. Christensen , Gary C. Johnson , Jon G. Aday
CPC分类号: H03H9/059 , H01L24/32 , H01L2224/16225 , H01L2224/27013 , H01L2224/32225 , H01L2224/73203 , H01L2224/73204 , H01L2224/83051 , H01L2924/01006 , H01L2924/01013 , H01L2924/0102 , H01L2924/01023 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01087 , H01L2924/14 , H01L2924/181 , H01L2924/3025 , Y10T29/49146
摘要: A method for packaging an acoustic wave device (10) without contaminating an active area (12) disposed on a face (14) thereof, including steps of: providing a substrate with a top (30) having conductive pads (18), bonding stud bumps (20) to a periphery (22) of the face (14) of the acoustic wave device, disposing a dam (26) onto the top (30) of the substrate and inside of the location of the conductive pads (18), aligning and connecting the stud bumps (20) to the conductive pads (18) on the top of the substrate to form electrically conductive interconnections between the acoustic wave device (10) and the substrate (16), flowing an underfill material (28) at the periphery (22) of the acoustic wave device and around the interconnections such that the underfill material (28) stops at a boundary (32) defined by the dam (26), and curing the underfill material (28) to mechanically reinforce and protectively encapsulate the interconnections.
摘要翻译: 一种用于封装声波装置(10)而不污染设置在其表面(14)上的有源区域(12)的方法,包括以下步骤:为基板提供具有导电焊盘(18)的顶部(30),接合螺柱 将突起(20)连接到声波装置的面(14)的周边(22),将堤(26)设置在基板的顶部(30)上并且在导电垫(18)的位置的内部, 将凸块(20)对准并连接到衬底的顶部上的导电焊盘(18),以在声波器件(10)和衬底(16)之间形成导电互连,使底部填充材料(28)在 声波装置的周边(22)和互连周围,使得底部填充材料(28)在由坝(26)限定的边界(32)处停止,并且固化底部填充材料(28)以机械加强和保护 封装互连。
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公开(公告)号:US06445075B1
公开(公告)日:2002-09-03
申请号:US09770859
申请日:2001-01-26
申请人: Christopher Scanlan , Jon G. Aday
发明人: Christopher Scanlan , Jon G. Aday
IPC分类号: H01L2348
CPC分类号: H01L24/81 , H01L2224/81801 , H01L2924/01006 , H01L2924/01013 , H01L2924/01029 , H01L2924/01033 , H01L2924/0105 , H01L2924/01079 , H01L2924/01082 , H01L2924/01322 , H01L2924/01327 , H01L2924/014 , H01L2924/14 , H01L2924/15311 , H05K3/282
摘要: A substrate includes a flip chip bond pad and a first bond pad on a dielectric substrate layer. First and second organic solderability protectant (OSP) layers are on the flip chip bond and first bond pad, respectively. A solder paste is on the first OSP layer. The solder paste is reflowed in an inert atmosphere to form a solder-on-pad (SOP) directly on and in contact with the flip chip bond pad. A sufficient thickness of the second OSP layer remains after reflow to inhibit oxidation of the first bond pad.
摘要翻译: 衬底包括倒装芯片接合焊盘和电介质基底层上的第一接合焊盘。 第一和第二有机可焊性保护剂(OSP)层分别在倒装芯片接合和第一接合焊盘上。 焊膏位于第一个OSP层上。 焊膏在惰性气氛中回流,直接在倒装芯片接合焊盘上并与其接触形成焊锡焊盘(SOP)。 第二OSP层的足够的厚度在回流之后保留以抑制第一接合焊盘的氧化。
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