摘要:
An evaluation device and method for DUT boards and probe cards which increase the reproducibility of the measured values and decrease the abrasion of pads in evaluation tests. A connection box is provided with contact pins, mounting mechanisms used to mount the DUT boards, and a plurality of connectors which feed signals from the contact pins to the outside.
摘要:
A print circuit board includes: a first surface; a guard plane disposed on an inner layer; a high insulated region formed on the first surface of the board so as to be opposed to the guard plane, the high insulated region being substantially surrounded by one or more first guard patterns; and a quasi-high insulated region formed on the first surface of the board so as to be disposed adjacent to the high insulated region. The quasi-high insulated region is substantially surrounded by at least a part of the one or more first guard patterns and by one or more second guard patterns, in which the one or more first guard patterns and the one or more second guard patterns are each formed by forming one or more trenches in the first surface of the board so as to expose the guard plane on a bottom surface of the trenches.
摘要:
A method for finding the impedance of a device under test using an impedance measuring apparatus having a modem-type auto-balancing bridge, two or more measurement signals, each of which has a different phase with respect to the reference signals supplied to the modem inside said auto-balancing bridge, are applied to a device under test; the impedance of this device under test is measured when each of the measurement signals is applied to the device under test; and the impedance of this device under test is found using the above-mentioned phase and the impedance measurement value of each of these measurements.
摘要:
A print circuit board includes: a first surface; a guard plane disposed on an inner layer; a high insulated region formed on the first surface of the board so as to be opposed to the guard plane, the high insulated region being substantially surrounded by one or more first guard patterns; and a quasi-high insulated region formed on the first surface of the board so as to be disposed adjacent to the high insulated region. The quasi-high insulated region is substantially surrounded by at least a part of the one or more first guard patterns and by one or more second guard patterns, in which the one or more first guard patterns and the one or more second guard patterns are each formed by forming one or more trenches in the first surface of the board so as to expose the guard plane on a bottom surface of the trenches.
摘要:
A method for finding the impedance of a device under test using an impedance measuring apparatus having a modem-type auto-balancing bridge, two or more measurement signals, each of which has a different phase with respect to the reference signals supplied to the modem inside said auto-balancing bridge, are applied to a device under test; the impedance of this device under test is measured when each of the measurement signals is applied to the device under test; and the impedance of this device under test is found using the above-mentioned phase and the impedance measurement value of each of these measurements.