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公开(公告)号：US20130130463A1
公开(公告)日：2013-05-23
申请号：US13301255
申请日：2011-11-21
IPC分类号： H01L21/02
CPC分类号： H01L28/92 , H01L27/1085
摘要： A method of manufacturing a charging capacity structure includes steps of: forming a first oxide layer, a support layer and a second oxide layer on a substrate in sequence; forming a plurality of etching holes on the surface of the second oxide layer in a matrix to run through the substrate that are spaced from each other at a selected distance; forming a plurality of pillar layers in the etching holes; removing the second oxide layer by etching; forming an etching protection layer on the surfaces of the support layer and pillar tubes that is formed at a thickness one half of the spaced distance between the etching holes such that the pillar tubes at diagonal locations form a self-calibration hole; and finally removing the first oxide layer from the self-calibration hole by etching. Through the self-calibration hole, the invention needn't to provide extra photoresists to form holes.
摘要翻译： 制造充电容量结构的方法包括以下步骤：依次在基板上形成第一氧化物层，支撑层和第二氧化物层; 在所述第二氧化物层的表面上以矩阵形成多个蚀刻孔以穿过所述基板，所述蚀刻孔以选定距离彼此间隔开; 在蚀刻孔中形成多个柱层; 通过蚀刻去除第二氧化物层; 在支撑层和支柱管的表面上形成蚀刻保护层，其形成为蚀刻孔之间间隔距离的一半的厚度，使得在对角线位置处的柱管形成自校准孔; 最后通过蚀刻从自校准孔中除去第一氧化物层。 通过自校准孔，本发明不需要提供额外的光致抗蚀剂来形成孔。
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公开(公告)号：US20120326740A1
公开(公告)日：2012-12-27
申请号：US13340758
申请日：2011-12-30
申请人： CHI-REN CHEN , CHIANG-CHENG FAN , LI-HSUN CHEN
发明人： CHI-REN CHEN , CHIANG-CHENG FAN , LI-HSUN CHEN
IPC分类号： G01R31/10
CPC分类号： G01R31/2849 , G01R31/2817 , G09G3/006
摘要： A testing apparatus includes a thermal control chamber including a test room, which temperature is controlled within a testing temperature range; a carrier frame including a direction guiding unit installed securely within the test room and formed with one guiding groove and a carrier rod extending through the guiding groove in the direction guiding unit; and a clamping unit mounted on the carrier rod for clamping a display-panel module securely, wherein, movement of the carrier rod transversely within the guiding groove relative to the direction guiding unit results in disposing the display-panel module to extend along one of several testing directions for undergoing a burn-in test.
摘要翻译： 测试装置包括一个包括测试室的热控制室，该温度控制在测试温度范围内; 载体框架，其包括方向引导单元，所述方向引导单元牢固地安装在所述测试室内并且形成有一个引导槽和沿所述方向引导单元延伸穿过所述引导槽的承载杆; 以及安装在所述承载杆上以用于可靠地夹持显示面板模块的夹紧单元，其中，所述承载杆相对于所述方向引导单元横向地在所述引导槽内的运动导致将所述显示面板模块布置成沿着多个 测试方向进行老化测试。
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公开(公告)号：US08673730B2
公开(公告)日：2014-03-18
申请号：US13301255
申请日：2011-11-21
IPC分类号： H01L21/20
CPC分类号： H01L28/92 , H01L27/1085
摘要： A method of manufacturing a charging capacity structure includes steps of: forming a first oxide layer, a support layer and a second oxide layer on a substrate in sequence; forming a plurality of etching holes on the surface of the second oxide layer in a matrix to run through the substrate that are spaced from each other at a selected distance; forming a plurality of pillar layers in the etching holes; removing the second oxide layer by etching; forming an etching protection layer on the surfaces of the support layer and pillar tubes that is formed at a thickness one half of the spaced distance between the etching holes such that the pillar tubes at diagonal locations form a self-calibration hole; and finally removing the first oxide layer from the self-calibration hole by etching. Through the self-calibration hole, the invention needn't to provide extra photoresists to form holes.
摘要翻译： 制造充电容量结构的方法包括以下步骤：依次在基板上形成第一氧化物层，支撑层和第二氧化物层; 在所述第二氧化物层的表面上以矩阵形成多个蚀刻孔以穿过所述基板，所述蚀刻孔以选定距离彼此间隔开; 在蚀刻孔中形成多个柱层; 通过蚀刻去除第二氧化物层; 在支撑层和支柱管的表面上形成蚀刻保护层，其形成为蚀刻孔之间间隔距离的一半的厚度，使得在对角线位置处的柱管形成自校准孔; 最后通过蚀刻从自校准孔中除去第一氧化物层。 通过自校准孔，本发明不需要提供额外的光致抗蚀剂来形成孔。
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公开(公告)号：US08779788B2
公开(公告)日：2014-07-15
申请号：US13340758
申请日：2011-12-30
申请人： Chi-Ren Chen , Chiang-Cheng Fan , Li-Hsun Chen
发明人： Chi-Ren Chen , Chiang-Cheng Fan , Li-Hsun Chen
CPC分类号： G01R31/2849 , G01R31/2817 , G09G3/006
摘要： A testing apparatus includes a thermal control chamber including a test room, which temperature is controlled within a testing temperature range; a carrier frame including a direction guiding unit installed securely within the test room and formed with one guiding groove and a carrier rod extending through the guiding groove in the direction guiding unit; and a clamping unit mounted on the carrier rod for clamping a display-panel module securely, wherein, movement of the carrier rod transversely within the guiding groove relative to the direction guiding unit results in disposing the display-panel module to extend along one of several testing directions for undergoing a burn-in test.
摘要翻译： 测试装置包括一个包括测试室的热控制室，该温度控制在测试温度范围内; 载体框架，其包括方向引导单元，所述方向引导单元牢固地安装在所述测试室内并且形成有一个引导槽和沿所述方向引导单元延伸穿过所述引导槽的承载杆; 以及安装在所述承载杆上以用于可靠地夹持显示面板模块的夹紧单元，其中，所述承载杆相对于所述方向引导单元横向地在所述引导槽内的运动导致将所述显示面板模块布置成沿着多个 测试方向进行老化测试。
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公开(公告)号：US20050021578A1
公开(公告)日：2005-01-27
申请号：US10730114
申请日：2003-12-09
申请人： Li-Hsun Chen , Oscal T. -C. Chen , Teng Wang , Ruey-Liang Ma
发明人： Li-Hsun Chen , Oscal T. -C. Chen , Teng Wang , Ruey-Liang Ma
CPC分类号： G06F9/30014 , G06F7/57 , G06F9/3885 , G06F9/3897 , G06F15/7867
摘要： A reconfigurable apparatus with a high usage rate in hardware is disclosed, which comprises at least one reconfigurable unit that has a plurality of processing units and at least one switch box connected to the processing units. The reconfigurable unit receives at least one reconfiguration signal to dynamically configure the processing units and the switch boxes as a new functional unit.
摘要翻译： 公开了一种在硬件中具有高使用率的可重构设备，其包括具有多个处理单元和至少一个与处理单元连接的开关盒的至少一个可重新配置单元。 可重配置单元接收至少一个重新配置信号，以将处理单元和交换机框动态配置为新的功能单元。
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