摘要:
Embodiments of a memory are disclosed that may reduce the likelihood of a miss-read while reading a weak data storage cell. The memory may include a number of data storage cells, a column multiplexer, a first sense amplifier and a second sense amplifier, and an output circuit. The gain level of the first sense amplifier may be higher than the gain level of the second sense amplifier. The output circuit may include a multiplexer and the multiplexer may be operable to controllably select one of the outputs of the first and second sense amplifiers and pass the value of the selected sense amplifier. The output circuit may include a node that couples the outputs of the first and second sense amplifiers and the outputs of the first and second sense amplifiers may be able to be set to a high impedance state.
摘要:
A memory circuit 300 is provided which includes first and second banks 201a and 201b of memory cells arranged in rows and columns. Row decoder circuitry 210 is provided for selecting a row in at least one of the banks in response to row address. Row address circuitry 208, 209 is included for providing a sequence of row addresses to the row decoder circuitry in response to a single row address received at an address port to memory circuitry 300. Column decoder circuitry 213 is provided for selecting columns in each of the banks 201 in response to a column address. Column address circuitry 211, 212 is provided for presenting a sequence of column addresses to the column decoder circuitry in response to a single column address received at the address port.
摘要:
A digital voltage shifter 101 is provided which includes an input buffer 200 having an input for receiving data logic high signals at a first voltage, a true output and a complementary output. A static random access memory cell 220 is also included which operates in response to a voltage supply providing a second voltage differing from the first voltage and having a first input coupled to the true output of the input buffer and a second input coupled to the complementary output of the input buffer. An output driver 230 is further included which operates in response to the second supply voltage and is coupled to an output of the memory cell, the output driver outputting the received logic signals at the second voltage.
摘要:
Embodiments of a memory are disclosed that may allow for the detection of weak data storage cells or may allow operation of data storage cells under conditions that may represent the effects of transistor ageing. The memory may include data storage cells, a column multiplexer, a sense amplifier, and a current injector. The current injector may be configured to generate multiple current levels and may be operable to controllably select one of the current levels to either source current to or sink current from the input of the sense amplifier.
摘要:
Embodiments of a memory are disclosed that may allow for the detection and compensation of weak data storage cells. The memory may include data storage cells, a selection circuit, a sense amplifier, and a timing and control block. The timing and control block may be operable to controllably select differing time periods between the activation of the selection circuit and the activation of the sense amplifier.
摘要:
A scannable pulse dynamic logic gate may include an evaluation network that evaluates dynamic inputs in response to assertion of an evaluate pulse. The evaluate pulse may be generated from a clock signal such that it is shorter in duration than the clock signal. During a normal mode of operation, when the evaluate pulse is asserted, the evaluation network may discharge a dynamic node depending on the state of the dynamic inputs. The dynamic node may then drive output device(s). When the evaluate pulse is deasserted, the dynamic node may be precharged. The gate may also include scan input devices, which, during a scan mode of operation, may load scan input data onto the output node in response to assertion of a scan master clock. A storage element of the gate may receive and capture a value of the output node in response to assertion of a slave scan clock.
摘要:
A system and method for reducing power consumption within clock distribution on a semiconductor chip. A 4-phase clock generator within a clock distribution network provides 4 non-overlapping clock signals dependent upon a received input clock. A reduced voltage swing clock generator receives the non-overlapping clock signals and charges and discharges a second set of clock lines in a manner sequenced by the non-overlapping clock signals. The sequencing prevents a voltage range from reaching a magnitude equal to a power supply voltage for each of the second set of clock lines. In one embodiment, the magnitude reaches half of the power supply voltage. The reduced voltage swing latch receives the second set of clock lines. The reduced voltage swing latch updates and maintains logical state based at least upon the received second set of clock lines.
摘要:
Substrate bias control circuitry 100 is provided which includes a bias sensor 101 for measuring a bias voltage of a substrate and generating a control signal and response. A master oscillator 102 is provided for generating a first driving signal, a frequency of the first driving signal adjusted by the control signal generated by the bias sensor 101. A first charge pump 103 is provided for pumping electrons into a substrate in response to the first driving signal. A slave oscillator generates a second driving signal, a frequency of the second driving signal is determined from the frequency of the first driving signal using a phase-locked loop. A second charge pump 105 is provided for pumping electrons into the substrate in response to the second driving signal.
摘要:
A line driver 202 is provided for transmitting signals across a line 201. Line driver 202 receives an input signal having a first voltage swing between a first high voltage level and a first low voltage level. Line driver 202 reduces power dissipation in line 201 by transmitting an output signal on line 201 having a second voltage swing between a second low voltage level greater than the first low voltage level and a second high voltage level less than the first high voltage level.
摘要:
A memory that may allow for the detection of weak data storage cells may include data storage cells, a column multiplexer, a sense amplifier, and a load circuit. The load circuit may include one or more capacitive loads and may be operable to controllably select one or more of the capacitive loads to couple to the input of the sense amplifier.