公开(公告)号：US07924027B2

公开(公告)日：2011-04-12

申请号：US11855752

申请日：2007-09-14

申请人： Frank Sieckmann ,  Reiner Rygiel

发明人： Frank Sieckmann ,  Reiner Rygiel

IPC分类号： G01R27/26

CPC分类号： G01B7/023

摘要： An arrangement and method are provided for determining the distance between an objective of a microscope and a sample examined with the microscope. Fitted on the objective or in the immediate vicinity of the objective is a capacitive sensor in whose measuring range the sample and/or a microscope slide supporting the sample is located or into which it can be brought. The sample and/or the slide causing a measurable change in the capacitance of the sensor. From the change in the capacitance of the sensor, the distance of the sample and/or of the microscope slide from the sensor is determined, and thus the distance of the sample from the objective. A capacitive distance sensor can be applied in such an arrangement by which a stray field can be generated between at least two electrodes. The capacitance experiences a measurable change owing to an object introduced into the stray field. The electrodes of the sensor are arranged as substantially coaxial lateral surfaces. The electrodes are designed such that the sensor can be plugged onto the objective of the microscope, the lateral surfaces at least partially enclosing and touching the objective.

摘要翻译： 提供了一种用于确定显微镜的物镜与用显微镜检查的样品之间的距离的布置和方法。 根据目标或目标附近，电容传感器的测量范围是支撑样品的样品和/或显微镜载玻片，或者可以将其带入。 样品和/或滑块导致传感器电容的可测量变化。 根据传感器电容的变化，确定样品和/或显微镜载玻片距离传感器的距离，从而确定样品与物镜的距离。 电容距离传感器可以应用于这样的布置，通过该布置可以在至少两个电极之间产生杂散场。 由于引入到杂散场中的物体，电容经历可测量的变化。 传感器的电极被布置为基本上同轴的侧表面。 电极被设计成使得传感器可以插入到显微镜的物镜上，侧表面至少部分地包围并接触物镜。

公开(公告)号：US07477448B2

公开(公告)日：2009-01-13

申请号：US10597069

申请日：2004-11-10

申请人： Reiner Rygiel

发明人： Reiner Rygiel

IPC分类号： G02B21/00

CPC分类号： G02B21/008 ,  G02B21/18 ,  G02B27/62

摘要： A method for adjusting two objective lenses in a 4Pi system of a scanning microscope includes imaging a reference object in respective pupils of the objective lenses so as to form a respective Fourier image for each of the objective lenses from a respective image of the reference object. The respective Fourier images are brought into coincidence by moving at least one of the objective lenses relative to the other.

摘要翻译： 一种用于在扫描显微镜的4Pi系统中调整两个物镜的方法，包括对物镜的各个光瞳中的参考对象进行成像，以便从参考物体的各个图像形成每个物镜的相应的傅立叶图像。 通过相对于另一个移动物镜中的至少一个，相应的傅立叶图像被重合。

公开(公告)号：US20070052972A1

公开(公告)日：2007-03-08

申请号：US10573696

申请日：2004-09-27

申请人： Volker Leimbach ,  Reiner Rygiel

发明人： Volker Leimbach ,  Reiner Rygiel

IPC分类号： G01B11/02

CPC分类号： G02B21/0056 ,  G02B26/001

摘要： A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer and/or used to discharge detection light (41) from the interferometer and to deflect a detection beam path, containing a reflecting means (51) which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.

摘要翻译： 一种具有干涉仪的4Pi显微镜，其中两个透镜（31,33）以使得它们在样品平面（35）的不同侧面上彼此相对的方式排列; 还包括用于将照射光（3）注入到干涉仪中和/或用于从干涉仪中排出检测光（41）并偏转包含反射装置（51）的检测光束路径的光学元件（19） 其将由光学元件放出的照明光反射回干涉仪和/或允许偏转到偏转光束上的检测光通过，也将未被偏转到检测光束路径上的其他放电检测光反射到干涉仪中。

公开(公告)号：US07177058B2

公开(公告)日：2007-02-13

申请号：US10915497

申请日：2004-08-10

申请人： Reiner Rygiel

发明人： Reiner Rygiel

IPC分类号： G02B26/08

CPC分类号： G02B26/0816

摘要： A deflection means which is rotatably and/or pivotably mounted in a bearing which comprises a Ferrofluid. The deflection means is part of an adjustable beam deflection device for deflecting a light beam. The deflection means is rotatable and/or pivotable about several axes.

摘要翻译： 一种可旋转和/或可枢转地安装在包含铁磁流体的轴承中的偏转装置。 偏转装置是用于偏转光束的可调节光束偏转装置的一部分。 偏转装置绕几个轴线可旋转和/或枢转。

公开(公告)号：US20070153366A1

公开(公告)日：2007-07-05

申请号：US10597069

申请日：2004-11-10

申请人： Reiner Rygiel

发明人： Reiner Rygiel

IPC分类号： G02B23/00 ,  G02B17/00

CPC分类号： G02B21/008 ,  G02B21/18 ,  G02B27/62

摘要： A method for adjusting two objective lenses in a 4Pi system of a scanning microscope includes imaging a reference object in respective pupils of the objective lenses so as to form a respective Fourier image for each of the objective lenses from a respective image of the reference object. The respective Fourier images are brought into coincidence by moving at least one of the objective lenses relative to the other.

摘要翻译： 一种用于在扫描显微镜的4Pi系统中调整两个物镜的方法，包括对物镜的各个光瞳中的参考对象进行成像，以便从参考物体的各个图像形成每个物镜的相应的傅立叶图像。 通过相对于另一个移动物镜中的至少一个，相应的傅立叶图像被重合。

公开(公告)号：US06611338B1

公开(公告)日：2003-08-26

申请号：US09713076

申请日：2000-11-15

申请人： Alexander Knuttel ,  Paul Welker ,  Christian Kugler ,  Reiner Rygiel

发明人： Alexander Knuttel ,  Paul Welker ,  Christian Kugler ,  Reiner Rygiel

IPC分类号： G01B902

CPC分类号： G01B9/02014 ,  G01B9/02007 ,  G01B9/02083 ,  G01B9/02091 ,  G01B11/2441

摘要： The invention proposes a method for the optimization of the interferometric examination of scattering objects, wherein intensity-modulated light is divided, one beam is directed into an object and the other beam is directed to a reference mirror, the reflected light is guided to a detector module, where it is converted to an interference signal and this signal is evaluated. The method is characterized by the fact that light of at least two different central wavelengths is irradiated and the converted interference signals of both central wavelengths are phase-shifted in order to compensate for their expected dispersion.

摘要翻译： 本发明提出了一种用于优化散射物体的干涉测量的方法，其中强度调制光被分割，一个光束被引导到物体中，另一个光束被引导到参考反射镜，反射光被引导到检测器 模块，将其转换为干扰信号，并对该信号进行评估。 该方法的特征在于照射至少两个不同中心波长的光，并且两个中心波长的转换的干扰信号被相移以便补偿它们的预期色散。

公开(公告)号：US08922776B2

公开(公告)日：2014-12-30

申请号：US13988784

申请日：2011-11-22

申请人： Reiner Rygiel

发明人： Reiner Rygiel

IPC分类号： G01N21/00 ,  G01J3/02 ,  G01J3/14 ,  G01J3/36 ,  G02B21/00 ,  G02B27/14

CPC分类号： G01J3/0205 ,  G01J3/0229 ,  G01J3/0237 ,  G01J3/14 ,  G01J3/36 ,  G02B21/0076 ,  G02B21/008 ,  G02B27/141

摘要： A confocal laser scanning microscope for examining a sample has a light source, which generates an illumination light beam, and a scanning unit which deflects the illumination light beam such that it optically scans the sample. A main beam splitter separates the illumination light beam from detection light emerging from the sample. The detection light separated from the illumination light beam passes at least partially through a detection pinhole diaphragm. At least two detector units detect the detection light passing through the detection pinhole diaphragm. An optical element is arranged in the beam direction between the detection pinhole diaphragm and the detector units and splits the detection light into at least two beam bundles and spectrally decomposes it within the beam bundles.

摘要翻译： 用于检查样品的共聚焦激光扫描显微镜具有产生照明光束的光源和使照明光束偏转以使其光学扫描样品的扫描单元。 主分束器将照明光束与从样品出射的检测光分离。 与照明光束分离的检测光至少部分地通过检测针孔膜片。 至少两个检测器单元检测通过检测针孔隔膜的检测光。 在检测针孔光阑和检测器单元之间沿光束方向布置光学元件，并将检测光分裂成至少两束光束束，并在束束内对其进行光谱分解。

公开(公告)号：US20130342834A1

公开(公告)日：2013-12-26

申请号：US13988784

申请日：2011-11-22

申请人： Reiner Rygiel

发明人： Reiner Rygiel

IPC分类号： G01J3/02

CPC分类号： G01J3/0205 ,  G01J3/0229 ,  G01J3/0237 ,  G01J3/14 ,  G01J3/36 ,  G02B21/0076 ,  G02B21/008 ,  G02B27/141

摘要： A confocal laser scanning microscope for examining a sample has a light source, which generates an illumination light beam, and a scanning unit which deflects the illumination light beam such that it optically scans the sample. A main beam splitter separates the illumination light beam from detection light emerging from the sample. The detection light separated from the illumination light beam passes at least partially through a detection pinhole diaphragm. At least two detector units detect the detection light passing through the detection pinhole diaphragm. An optical element is arranged in the beam direction between the detection pinhole diaphragm and the detector units and splits the detection light into at least two beam bundles and spectrally decomposes it within the beam bundles.

摘要翻译： 用于检查样品的共聚焦激光扫描显微镜具有产生照明光束的光源和使照明光束偏转以使其光学扫描样品的扫描单元。 主分束器将照明光束与从样品出射的检测光分离。 与照明光束分离的检测光至少部分地通过检测针孔膜片。 至少两个检测器单元检测通过检测针孔隔膜的检测光。 在检测针孔光阑和检测器单元之间沿光束方向布置光学元件，并将检测光分裂成至少两束光束束，并在束束内对其进行光谱分解。

公开(公告)号：US07583436B2

公开(公告)日：2009-09-01

申请号：US10694287

申请日：2003-10-27

申请人： Reiner Rygiel

发明人： Reiner Rygiel

IPC分类号： G01N21/01 ,  G02B21/34

CPC分类号： G02B21/0024 ,  G02B21/0076 ,  G02B21/34

摘要： A sample carrier (30) for microscopy, in particular for confocal microscopy, and a method for producing the sample carrier (30), are disclosed. The sample carrier (30) has a first coverslip (32) and a second coverslip (33). The second coverslip (33) carries an mirror (29) which is equipped in such a way that it surrounds a sample region (34). Also provided is a frame (35) that retains the first and the second coverslip (32 and 33). The coverslips located in the frame (35) form a cavity (38), that cavity (38) being filled with a medium which has approximately the same refractive index as the first and the second coverslip (32 and 33).

摘要翻译： 公开了一种用于显微镜，特别是用于共聚焦显微镜的样品载体（30）和用于制备样品载体（30）的方法。 样品载体（30）具有第一盖玻片（32）和第二盖玻片（33）。 第二盖玻片（33）装有以包围样品区域（34）的方式装备的反射镜（29）。 还提供了一种保持第一和第二盖玻片（32和33）的框架（35）。 位于框架（35）中的盖玻片形成空腔（38），空腔（38）填充有与第一和第二盖玻片（32和33）大致相同的折射率的介质。

公开(公告)号：US07453578B2

公开(公告)日：2008-11-18

申请号：US10573696

申请日：2004-09-27

申请人： Volker Leimbach ,  Reiner Rygiel

发明人： Volker Leimbach ,  Reiner Rygiel

IPC分类号： G01B11/02

CPC分类号： G02B21/0056 ,  G02B26/001

摘要： A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer and/or used to discharge detection light (41) from the interferometer and to deflect a detection beam path, containing a reflecting means (51) which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.

摘要翻译： 一种具有干涉仪的4Pi显微镜，其中两个透镜（31,33）以使得它们在样品平面（35）的不同侧面上彼此相对的方式排列; 还包括用于将照射光（3）注入到干涉仪中和/或用于从干涉仪中排出检测光（41）并偏转包含反射装置（51）的检测光束路径的光学元件（19） 其将由光学元件放出的照明光反射回干涉仪和/或允许偏转到偏转光束上的检测光通过，也将未被偏转到检测光束路径上的其他放电检测光反射到干涉仪中。