Electrical Interconnect Structures Having Carbon Nanotubes Therein and Methods of Forming Same
    2.
    发明申请
    Electrical Interconnect Structures Having Carbon Nanotubes Therein and Methods of Forming Same 审中-公开
    具有碳纳米管的电互连结构及其形成方法相同

    公开(公告)号:US20080246148A1

    公开(公告)日:2008-10-09

    申请号:US11972192

    申请日:2008-01-10

    IPC分类号: H01L23/52

    摘要: Integrated circuit devices include electrically conductive interconnects containing carbon nanotubes. An electrical interconnect includes a first metal region. A first electrically conductive barrier layer is provided on an upper surface of the first metal region and a second metal region is provided on the first electrically conductive barrier layer. The first electrically conductive barrier layer includes a material that inhibits out-diffusion of the first metal from the first metal region and the second metal region includes a catalytic metal therein. An electrically insulating layer having an opening therein is provided on the second metal region. A plurality of carbon nanotubes are provided as a vertical electrical interconnect in the opening.

    摘要翻译: 集成电路器件包括含有碳纳米管的导电互连。 电互连包括第一金属区域。 第一导电阻挡层设置在第一金属区域的上表面上,第二金属区域设置在第一导电阻挡层上。 第一导电阻挡层包括抑制第一金属从第一金属区域的扩散扩散的材料,第二金属区域包括催化金属。 其中具有开口的电绝缘层设置在第二金属区域上。 在开口中设置多个碳纳米管作为垂直电互连。