Connection board, probe card, and electronic device test apparatus comprising same
    1.
    发明授权
    Connection board, probe card, and electronic device test apparatus comprising same 失效
    连接板,探针卡和包括该连接板的电子设备测试装置

    公开(公告)号:US08134381B2

    公开(公告)日:2012-03-13

    申请号:US12532688

    申请日:2008-03-18

    IPC分类号: G01R31/00

    CPC分类号: G01R31/2886 G01R1/07342

    摘要: A probe card is provided which includes: probe needles electrically contacting input/output terminals of an IC device formed on a semiconductor wafer W; a mount base on which the probe needles are mounted; a support column supporting the mount base, a circuit board having interconnect patterns electrically connected to the probe needles via bonding wires; and a base member and stiffener for reinforcing the probe card. The mount base and the circuit board are noncontact.

    摘要翻译: 提供一种探针卡,其包括:电接触形成在半导体晶片W上的IC器件的输入/输出端的探针; 安装有探针的安装基座; 支撑所述安装基座的支撑柱,具有通过接合线电连接到所述探针的互连图案的电路板; 以及用于加强探针卡的基部构件和加强件。 安装座和电路板是非接触式的。

    CONNECTION BOARD, PROBE CARD, AND ELECTRONIC DEVICE TEST APPARATUS COMPRISING SAME
    2.
    发明申请
    CONNECTION BOARD, PROBE CARD, AND ELECTRONIC DEVICE TEST APPARATUS COMPRISING SAME 失效
    连接板,探针卡和电子装置测试装置

    公开(公告)号:US20100102837A1

    公开(公告)日:2010-04-29

    申请号:US12532688

    申请日:2008-03-18

    IPC分类号: G01R31/02 G01R31/26

    CPC分类号: G01R31/2886 G01R1/07342

    摘要: A probe card is provided which includes: probe needles electrically contacting input/output terminals of an IC device formed on a semiconductor wafer W; a mount base on which the probe needles are mounted; a support column supporting the mount base, a circuit board having interconnect patterns electrically connected to the probe needles via bonding wires; and a base member and stiffener for reinforcing the probe card. The mount base and the circuit board are noncontact.

    摘要翻译: 提供一种探针卡,其包括:电接触形成在半导体晶片W上的IC器件的输入/输出端的探针; 安装有探针的安装基座; 支撑所述安装基座的支撑柱,具有通过接合线电连接到所述探针的互连图案的电路板; 以及用于加强探针卡的基部构件和加强件。 安装座和电路板是非接触式的。

    Interface apparatus for electronic device test apparatus
    3.
    发明授权
    Interface apparatus for electronic device test apparatus 失效
    电子设备测试仪接口装置

    公开(公告)号:US07611377B2

    公开(公告)日:2009-11-03

    申请号:US11896240

    申请日:2007-08-30

    IPC分类号: H01R13/00

    CPC分类号: H01R31/06 G01R31/2889

    摘要: An interface apparatus 5 mounted on a test head 4 comprises: an electrical cable 54 having one end electrically connected to a socket board 66; a device side connector 541 attached to the other end of the electrical cable 54; and a intermediate connector 53 electrically connecting a test head side connector 41 provided on the test head 4 and the device side connector 541 and the intermediate connector 53 having a connector body 531 provided at a bottommost part of the interface apparatus 5; an engagement hole 532 provided at the connector body 531 and having the device side connector 541 detachably connected to it; and an output terminal 537 provided at the connector body 531 and having the test head side connector 41 detachably connected to it.

    摘要翻译: 安装在测试头4上的接口装置5包括:电缆54,其一端电连接到插座板66; 连接到电缆54的另一端的装置侧连接器541; 以及中间连接器53,电连接设置在测试头4上的测试头侧连接器41和设备侧连接器541以及具有设置在接口设备5的最底部的连接器主体531的中间连接器53; 设置在连接器主体531处并具有可拆卸地连接到其的装置侧连接器541的接合孔532; 以及设置在连接器主体531处并具有可拆卸地连接到其的测试头侧连接器41的输出端子537。

    Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus
    4.
    发明授权
    Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus 失效
    测量接触端子,测量装置,探针卡组,晶圆探针装置和测试装置

    公开(公告)号:US07474109B2

    公开(公告)日:2009-01-06

    申请号:US11438605

    申请日:2006-05-22

    IPC分类号: G01R31/02

    摘要: A contact terminal for measurement is provided, for transmitting a signal between a desired probe pin among a plurality of probe pins arranged in parallel at a predetermined distance in a predetermined direction on the surface of a probe substrate and an external measurement apparatus. The contact terminal for measurement includes: a signal terminal having an width smaller than the distance between the probe pins provided on both sides of one probe pin in the arrangement direction; two ground terminals to which a ground potential is applied, which are provided on both sides of the signal terminal in the arrangement direction and which have each width larger than that of the signal terminal in the arrangement direction; and a signal line electrically connecting the signal terminal to a signal input terminal of the external measurement apparatus.

    摘要翻译: 提供用于测量的接触端子,用于在探针基板的表面上的预定方向上以预定距离平行布置的多个探针之间的期望的探针之间传输信号和外部测量装置。 用于测量的接触端子包括:信号端子,其宽度小于在排列方向上设置在一个探针的两侧上的探针之间的距离; 设置有接地电位的两个接地端子,其设置在信号端子的排列方向的两侧,并且每个接地端子的宽度大于信号端子在布置方向上的宽度; 以及将信号端子与外部测量装置的信号输入端子电连接的信号线。

    CONNECTOR
    6.
    发明申请
    CONNECTOR 有权
    连接器

    公开(公告)号:US20060057874A1

    公开(公告)日:2006-03-16

    申请号:US11268264

    申请日:2005-11-04

    IPC分类号: H01R13/648

    摘要: A connector mounted on a board having a plurality of board signal lines for transmitting a signal and a board ground line grounded. Each of the plurality of board signal lines includes a plurality of signal terminals formed in correspondence to each of the signal lines. Each of the signal terminals comprises: a signal core line formed of conductor by extension in the shape of a line; a shield for core line formed of conductor insulated from the signal core line electrically so as to extend in an axis direction of the signal core line and enclose the signal core line; a signal electrode formed by extension from the signal core line for connecting the signal core line with the board signal line corresponding to the signal terminal; and a plurality of ground electrodes extended from the shield for core line and opposed to each other by intervention of the signal electrode for connecting the shield for core line with the board ground line respectively.

    摘要翻译: 安装在板上的连接器,其具有用于传输信号的多个板信号线和接地的板接地线。 多个板信号线中的每一个包括与每个信号线相对应地形成的多个信号端。 每个信号端子包括:由导线形成的以线形延伸的信号芯线; 用于芯线的屏蔽,由与信号芯线绝缘的导线形成,以沿信号芯线的轴线方向延伸并包围信号芯线; 由信号芯线延伸形成的信号电极,用于将信号芯线与对应于信号端子的电路板信号线相连; 以及从用于芯线的屏蔽件延伸的多个接地电极,并且分别通过用于将芯线的屏蔽与板接地线连接的信号电极彼此相对。

    Device interface apparatus
    7.
    发明申请
    Device interface apparatus 审中-公开
    设备接口设备

    公开(公告)号:US20050159050A1

    公开(公告)日:2005-07-21

    申请号:US11003695

    申请日:2004-12-03

    IPC分类号: G01R1/073 H01R25/00

    CPC分类号: G01R1/07378 G01R31/31905

    摘要: A device interface apparatus for providing a device under test with a test signal to test the device under test and receiving an output signal outputted from the device under test includes a pin electronics board, a board-side connector provided on an end section of the pin electronics board, wherein the board-side connector includes a plurality of board-side core wires and a board-side shield, a socket for holding the device under test, a socket-side connector including a plurality of socket-side core wires and a socket-side shield, and a cable unit for transmitting the transmission signal between the socket and the pin electronics board, wherein the cable unit includes a board fitting connector, a socket fitting connector, and a plurality of transmission cables.

    摘要翻译: 一种用于提供被测器件的测试信号以测试被测器件并接收从被测器件输出的输出信号的器件接口设备,包括引脚电子板,设置在引脚端部上的电路板侧连接器 电子板,其中所述电路板侧连接器包括多个板侧芯线和板侧屏蔽,用于保持被测器件的插座,具有多个插座侧芯线的插座侧连接器和 插座侧屏蔽和电缆单元,用于在插座和引脚电子板之间传输传输信号,其中电缆单元包括板配件连接器,插座配件连接器和多个传输电缆。

    Pin connector, pin connector holder and packaging board for mounting electronic component
    8.
    再颁专利
    Pin connector, pin connector holder and packaging board for mounting electronic component 失效
    针连接器,针连接器支架和用于安装电子元件的包装板

    公开(公告)号:USRE37961E1

    公开(公告)日:2003-01-07

    申请号:US09794646

    申请日:2001-02-27

    申请人: Shigeru Matsumura

    发明人: Shigeru Matsumura

    IPC分类号: H01R1122

    CPC分类号: H05K7/103 H01R12/523

    摘要: A pin connector has an outer contact bent outwardly from at least a portion of a side wall of a metallic slender sleeve and an inner contact bent inwardly from at least a portion of a side wall of the metallic slender sleeve. The outer contact and the inner contact are resilient radially of the metallic slender sleeve. An electronic component packaging board comprises a board having a through hole defined therein in alignment with an external lead of an electronic component, the pin connector being inserted and held in the through hold. The electronic component packaging board also has another board disposed on the reverse side of the board and having a through hole defined therein. An end portion of the pin connector projects from the through hole in the board and is soldered to the other board in the through hole thereof. A positioning structure such as a pin positions the pin connector inserted in the through hole in the board with respect to the through hole in the other board.

    摘要翻译: 销连接器具有从金属细长套筒的侧壁的至少一部分向外弯曲的外部接触件和从金属细长套筒的侧壁的至少一部分向内弯曲的内部接触件。 外部接触件和内部接触件在金属细长套筒的径向上是弹性的。 电子部件包装板包括:板,其具有与电子部件的外部引线对准的通孔,所述销连接器插入并保持在通过保持部中。 电子部件封装板还具有设置在板的反面上并且具有限定在其中的通孔的另一个板。 销连接器的端部从板的通孔突出,并且在其通孔中焊接到另一个板。 诸如针的定位结构将插入插入板中的通孔中的针连接器相对于另一个板中的通孔定位。

    Socket for measuring a ball grid array semiconductor
    9.
    发明授权
    Socket for measuring a ball grid array semiconductor 失效
    用于测量球栅阵列半导体的插座

    公开(公告)号:US6069481A

    公开(公告)日:2000-05-30

    申请号:US875205

    申请日:1998-01-21

    申请人: Shigeru Matsumura

    发明人: Shigeru Matsumura

    IPC分类号: G01R1/04 G01R31/02 G01R1/073

    CPC分类号: G01R1/0483

    摘要: A ball grid array semiconductor measuring socket is provided in which a contact pressure force to a solder ball is generated in the direction substantially orthogonal to the longitudinal direction of a forked contact pin and the length of the forked contact pin can be designed to the required minimum length independently of the contact pressure force. The forked contact pin formed by stamping out a sheet metal having a resilience into a tuning fork shape is mounted in a receiving hole formed through an insulating housing. Each forked contact pin is constructed so that the tip portions of a pair of elastic forked portions form contact portions for contacting with a solder ball 12 and that the tip portions contact with a solder ball at two points. In addition, the direction of opposed areas in which a pair of elastic forked portions of the forked contact pin is accommodated is selected to be oblique to the direction of the alignment of the receiving holes, and thus the mounting density of the forked contact pins can be improved.

    摘要翻译: PCT No.PCT / JP95 / 02224 Sec。 371日期1998年1月21日 102(e)1998年1月21日PCT PCT 1995年10月31日PCT公布。 公开号WO97 / 16874 日期1997年5月9日提供了一种球栅阵列半导体测量插座,其中在与分叉接触针的纵向方向基本正交的方向上产生对焊球的接触压力,并且可以设计叉形接触针的长度 独立于接触压力而达到所需的最小长度。 通过将具有弹性的金属板冲压成音叉形成的叉形接触销被安装在通过绝缘壳体形成的接收孔中。 每个分叉接触销被构造成使得一对弹性叉形部分的末端部分形成用于与焊球12接触的接触部分,并且尖端部分在两点与焊球接触。 另外,叉状接触销的一对弹性叉状部的相对区域的方向被选择为与接收孔的对准方向倾斜,因此叉形接触销的安装密度 要改进