摘要:
The present disclosure relates to a semiconductor device and a method of operating the semiconductor device. The semiconductor device includes a ROM for storing a program algorithm, an erase algorithm, a reading algorithm, and a reset algorithm and outputting ROM data corresponding to a selected algorithm, a program counter for outputting a ROM address to the ROM so as to sequentially operate the selected algorithm, an internal circuit for performing an operation corresponding to the selected algorithm in response to a plurality of internal circuit control signals in response to the ROM data, and a reset circuit for stopping progress of a running algorithm by initializing the program counter in response to a reset command input from an outside, and performing the reset algorithm.
摘要:
An operation method of a nonvolatile memory device includes reading information of an erase target block, and performing an erase operation by using a starting erase bias corresponding to the information.
摘要:
A flash memory device comprises a memory cell array having a plurality of blocks. An address register section is configured to receive a start block address of the first block to be erased among a plurality of blocks to be erased and a last block address of the last block to be erased among the plurality of blocks to be erased. A controlling logic circuit is configured to output an erase command signal and an erase block address corresponding to one of the blocks to be erased. A block address comparing section is configured to compare the erase block address output by the controlling logic circuit with the last block address, and output an erase progress signal based on the comparison of the erase block address and the last block address to the controlling logic circuit. The controlling logic circuit outputs an erase block address of to another block to be erased until the erase progress signal indicates that the last block to be erased has been or is being erased.
摘要:
A nonvolatile memory device includes a storage unit configured to store pattern data selected based on a test command set, and a control unit configured to consecutively perform a program operation on a number of pages in response to the pattern data to obtain programmed pages, consecutively perform a read operation on the programmed pages, and provide information about a bit line coupled to a fail memory cell and about a number of fail bit lines checked as a result of the read operation.
摘要:
A nonvolatile memory device includes a control unit configured to measure a threshold voltage distribution of each of selected pages between a start voltage and an end voltage by performing a read operation on each page in response to a command set for analyzing the threshold voltage distribution, to compare the measured threshold voltage distribution with a reference threshold voltage distribution, and to determine a read voltage having a least amount of errors upon the read operation being performed.
摘要:
A flash memory device comprises a memory cell array having a plurality of blocks. An address register section is configured to receive a start block address of the first block to be erased among a plurality of blocks to be erased and a last block address of the last block to be erased among the plurality of blocks to be erased. A controlling logic circuit is configured to output an erase command signal and an erase block address corresponding to one of the blocks to be erased. A block address comparing section is configured to compare the erase block address output by the controlling logic circuit with the last block address, and output an erase progress signal based on the comparison of the erase block address and the last block address to the controlling logic circuit. The controlling logic circuit outputs an erase block address of to another block to be erased until the erase progress signal indicates that the last block to be erased has been or is being erased.
摘要:
A nonvolatile memory device includes a control unit configured to measure a threshold voltage distribution of each of selected pages between a start voltage and an end voltage by performing a read operation on each page in response to a command set for analyzing the threshold voltage distribution, to compare the measured threshold voltage distribution with a reference threshold voltage distribution, and to determine a read voltage having a least amount of errors upon the read operation being performed.
摘要:
The present disclosure relates to a semiconductor device and a method of operating the semiconductor device. The semiconductor device includes a ROM for storing a program algorithm, an erase algorithm, a reading algorithm, and a reset algorithm and outputting ROM data corresponding to a selected algorithm, a program counter for outputting a ROM address to the ROM so as to sequentially operate the selected algorithm, an internal circuit for performing an operation corresponding to the selected algorithm in response to a plurality of internal circuit control signals in response to the ROM data, and a reset circuit for stopping progress of a running algorithm by initializing the program counter in response to a reset command input from an outside, and performing the reset algorithm.
摘要:
A nonvolatile memory device includes a storage unit configured to store pattern data selected based on a test command set, and a control unit configured to consecutively perform a program operation on a number of pages in response to the pattern data to obtain programmed pages, consecutively perform a read operation on the programmed pages, and provide information about a bit line coupled to a fail memory cell and about a number of fail bit lines checked as a result of the read operation.