公开(公告)号：US07188054B2

公开(公告)日：2007-03-06

申请号：US11037936

申请日：2005-01-18

申请人： Soichi Kadowaki ,  Kozo Umeda ,  Tomonori Goto

发明人： Soichi Kadowaki ,  Kozo Umeda ,  Tomonori Goto

IPC分类号： G06F15/00 ,  H03F1/26 ,  H04B15/00

CPC分类号： G01D1/00 ,  G01B21/045 ,  G01D3/022 ,  G06T5/002

摘要： A signal processing method is disclosed, where, after inputting a measurement data weighted-spline filter formula is selected to calculate an initial value of a spline filter, weight is adjusted, spline filter output is calculated, convergence is judged thereafter. When the weight is not judged converged, the weight is updated and the weight adjusting and spline filter output calculation are repeated, to conduct a robust spline filtering on the measurement data.

摘要翻译： 公开了一种信号处理方法，其中在输入了测量数据加权样条滤波器公式以选择样条滤波器的初始值之后，调整权重，计算出样条滤波器输出，此后判断收敛。 当权重未被判断收敛时，重量被更新，并重复权重调整和样条滤波器输出计算，以对测量数据进行鲁棒的样条滤波。

公开(公告)号：US08681341B2

公开(公告)日：2014-03-25

申请号：US13208692

申请日：2011-08-12

申请人： Tomonori Goto ,  Jyota Miyakura ,  Hidemitsu Asano ,  Takeshi Saeki

发明人： Tomonori Goto ,  Jyota Miyakura ,  Hidemitsu Asano ,  Takeshi Saeki

IPC分类号： G01B11/02

CPC分类号： G01B11/2441 ,  G01B9/02083 ,  G01B9/0209

摘要： A shape measuring method includes guiding light emitted from a light source to an object to be measured and a reference surface, combining light reflected from the object to be measured with light reflected from the reference surface, and taking a distribution image of an interference light intensity corresponding to each measurement position of the object to be measured, while changing an optical path length difference between a first optical path length and a second optical path length over a whole scanning zone, sequentially storing distribution images of the interference light intensity in the whole scanning zone, and obtaining an interference light intensity string at each measurement position based on the stored distribution images of the interference light intensity, and obtaining a position in an optical axis direction at each measurement position of the object to be measured from a peak position of the interference light intensity string.

摘要翻译： 一种形状测量方法，包括将从光源发射的光引导到待测量对象和参考表面，将从被测量物体反射的光与从参考表面反射的光组合，并获取干涉光强度的分布图像 对应于待测对象的每个测量位置，同时在整个扫描区域上改变第一光程长度和第二光程长度之间的光程长度差，顺序地将干涉光强度的分布图像存储在整个扫描中 并且基于所存储的干涉光强度的分布图像在每个测量位置处获得干涉光强度线，并且从所述干涉光强度的峰值位置获得待测量对象的每个测量位置处的光轴方向上的位置 干涉光强度串。

公开(公告)号：US08504316B2

公开(公告)日：2013-08-06

申请号：US12662737

申请日：2010-04-30

申请人： Toshiyuki Tamai ,  Tomonori Goto

发明人： Toshiyuki Tamai ,  Tomonori Goto

IPC分类号： G06F19/00 ,  G01B1/00

CPC分类号： G01B21/042

摘要： Provided is method of calibrating Y-axis direction position of contact tip of form measuring instrument including: table rotatable about Z-axis; contact tip capable of contacting workpiece; and contact tip driving means to drive contact tip in at least X- and Z-axis directions among X-, Y- and Z-axis directions perpendicular to one another. Method performs tracing measurement of inclined surface or inclined cylinder side surface which is part of workpiece obtained by inclining workpiece placed on table about Y-axis, or side surface of off-centered cylinder having center axis off-centered in X-axis direction by rotating surface to obtain measurement value at each angular position of rotation of table, obtains angular position of rotation at which smallest value among measurement values of tracing measurement is detected as angular position of rotation with smallest detected value, and adjusts Y-axis direction position of contact tip based on angular position of rotation with smallest detected value.

摘要翻译： 提供了形状测量仪器接触尖端的Y轴方向位置的校准方法，包括：可绕Z轴旋转的台面; 能接触工件的接触尖端; 以及接触尖端驱动装置，用于在垂直于X，Y和Z轴方向的至少X轴方向和Z轴方向上驱动接触尖端。 方法进行倾斜表面或倾斜气缸侧面的跟踪测量，该倾斜表面或倾斜气缸侧面是通过将放置在工作台上的工件倾斜在Y轴上的工件的一部分或者具有中心轴的偏心圆筒的侧表面，其中心轴在X轴方向上偏心，通过旋转 表面以获得表的每个旋转角度位置处的测量值，获得旋转角度位置，其中将跟踪测量值的测量值中的最小值检测为检测值最小的旋转角位置，并调整接触的Y轴方向位置 基于具有最小检测值的旋转的角位置的尖端。

公开(公告)号：US20120044503A1

公开(公告)日：2012-02-23

申请号：US13208692

申请日：2011-08-12

申请人： Tomonori Goto ,  Jyota Miyakura ,  Hidemitsu Asano ,  Takeshi Saeki

发明人： Tomonori Goto ,  Jyota Miyakura ,  Hidemitsu Asano ,  Takeshi Saeki

IPC分类号： G01B11/02

CPC分类号： G01B11/2441 ,  G01B9/02083 ,  G01B9/0209

摘要： A shape measuring method includes guiding light emitted from a light source to an object to be measured and a reference surface, combining light reflected from the object to be measured with light reflected from the reference surface, and taking a distribution image of an interference light intensity corresponding to each measurement position of the object to be measured, while changing an optical path length difference between a first optical path length and a second optical path length over a whole scanning zone, sequentially storing distribution images of the interference light intensity in the whole scanning zone, and obtaining an interference light intensity string at each measurement position based on the stored distribution images of the interference light intensity, and obtaining a position in an optical axis direction at each measurement position of the object to be measured from a peak position of the interference light intensity string.

摘要翻译： 一种形状测量方法，包括将从光源发射的光引导到待测量对象和参考表面，将从被测量物体反射的光与从参考表面反射的光组合，并获取干涉光强度的分布图像 对应于待测对象的每个测量位置，同时在整个扫描区域上改变第一光程长度和第二光程长度之间的光程长度差，顺序地将干涉光强度的分布图像存储在整个扫描中 并且基于所存储的干涉光强度的分布图像在每个测量位置处获得干涉光强度线，并且从所述干涉光强度的峰值位置获得待测量对象的每个测量位置处的光轴方向上的位置 干涉光强度串。

公开(公告)号：US09423415B2

公开(公告)日：2016-08-23

申请号：US14356081

申请日：2012-02-07

申请人： Koichiro Nanba ,  Nobuyuki Okada ,  Takahiro Sasauchi ,  Tatsuya Mita ,  Tomohiro Otsuka ,  Tomonori Goto ,  Yasuki Nakakura ,  Naoki Tokuda

发明人： Koichiro Nanba ,  Nobuyuki Okada ,  Takahiro Sasauchi ,  Tatsuya Mita ,  Tomohiro Otsuka ,  Tomonori Goto ,  Yasuki Nakakura ,  Naoki Tokuda

IPC分类号： B61F5/24 ,  G01P21/00 ,  G01D3/08

CPC分类号： G01P21/00 ,  B61F5/24 ,  G01D3/08

摘要： This sensor state determination system is a sensor state monitoring system capable of accurately determining whether or not a detecting sensor used with a railroad vehicle is in an abnormal state. This system includes: a detecting sensor capable of detecting a physical value acting upon the railroad vehicle; and an electronic control device. A monitoring sensor equivalent to the detection sensor is installed at a position equivalent to the position of the detection sensor. The electronic control device is provided with a determination means (coherence calculation section, state determination section) that computes, based on a first signal detected by the detecting sensor and a second signal detected by the monitoring sensor, a coherence value indicating a correlation between the signals. The electronic control device determines that the detecting sensor is in an abnormal state if the coherence value is smaller than a preset abnormality determination value.

摘要翻译： 该传感器状态确定系统是能够精确地确定与铁路车辆一起使用的检测传感器是否处于异常状态的传感器状态监视系统。 该系统包括：能够检测作用在铁路车辆上的物理值的检测传感器; 和电子控制装置。 与检测传感器相当的监视传感器安装在与检测传感器的位置相当的位置。 电子控制装置设置有：基于由检测传感器检测到的第一信号和由监视传感器检测到的第二信号的计算装置（相干计算部，状态判定部），指示相关性的相干值 信号。 如果相干值小于预设的异常判定值，则电子控制装置判定检测传感器处于异常状态。

公开(公告)号：US08520216B2

公开(公告)日：2013-08-27

申请号：US13192595

申请日：2011-07-28

申请人： Tomonori Goto ,  Jyota Miyakura

发明人： Tomonori Goto ,  Jyota Miyakura

IPC分类号： G01B11/02

CPC分类号： G01B9/02083 ,  G01B9/0207 ,  G01B9/0209 ,  G01B11/2441

摘要： A shape measuring apparatus includes: an optical system configured to guide a light from a light source having a wideband spectrum to an object to be measured and a reference face; an imaging unit configured to image the interfering light intensity distribution image output from the optical system; an optical path length difference changing unit configured to change the optical path length difference; and an arithmetic processing unit configured to obtain the peak value of an interfering light intensity sequence indicating the change in the interfering light intensity due to the change in the optical path length difference at each measurement position of the interfering light intensity distribution images stored in the image storing unit, and configured to obtain the peak value as the position in the direction of the optical axis at each measurement position of the object to be measured.

摘要翻译： 一种形状测量装置，包括：光学系统，被配置为将来自具有宽带光谱的光源的光引导到待测量对象和参考面; 成像单元，被配置为对从所述光学系统输出的干涉光强度分布图像进行成像; 光路长度差改变单元，被配置为改变光程长度差; 以及算术处理单元，被配置为获得指示由于在存储在图像中的干涉光强度分布图像的每个测量位置处的光程长度差的变化引起的干扰光强度的变化的干扰光强度序列的峰值 并且被配置为获得峰值作为在待测量对象的每个测量位置处的光轴方向上的位置。

公开(公告)号：US08290740B2

公开(公告)日：2012-10-16

申请号：US12662615

申请日：2010-04-26

申请人： Toshiyuki Tamai ,  Tomonori Goto

发明人： Toshiyuki Tamai ,  Tomonori Goto

IPC分类号： G01B21/02

CPC分类号： G01B21/04 ,  G01B5/008 ,  G05B19/401 ,  G05B2219/37194 ,  G05B2219/37197

摘要： Form measuring instrument includes: first measuring means which moves contact piece from first position in parallel with second axis to trace surface of workpiece, measure amount of displacement of contact piece, to obtain first profile; second placing means which rotates workpiece about first axis by 90 degrees to place workpiece at second position from first position; second measuring means which moves contact piece from second position in parallel with second axis to trace surface of workpiece, measure amount of displacement of contact piece, to obtain second profile; extremum position calculating means which fits circles to first and second profiles and calculate positions, in direction parallel with second axis, of first and second extremums indicating circles' extremums; and moving means which moves workpiece in direction parallel with second axis and direction parallel with third axis such that positions, in direction parallel with second axis, of first and second extremums become 0.

摘要翻译： 形状测量仪器包括：第一测量装置，使接触片从第一位置平行于第二轴线移动到工件的轨迹表面，测量接触片的位移量，以获得第一轮廓; 第二放置装置，其将工件围绕第一轴旋转90度，以将工件从第一位置放置在第二位置; 第二测量装置，使接触片从与第二轴平行的第二位置移动到工件的迹线表面，测量接触片的位移量，以获得第二轮廓; 极点位置计算装置，其将圆适合于第一和第二轮廓，并计算指示圆的极值的第一和第二极值的平行于第二轴的方向的位置; 以及移动装置，其使工件沿与第二轴平行的方向和与第三轴平行的方向移动，使得在第一和第二极值的平行于第二轴的方向上的位置变为0。

公开(公告)号：US07366637B2

公开(公告)日：2008-04-29

申请号：US11593081

申请日：2006-11-06

申请人： Tomonori Goto ,  Toshiyuki Tamai

发明人： Tomonori Goto ,  Toshiyuki Tamai

IPC分类号： G06F15/00

CPC分类号： G01B21/30

摘要： A form measuring instrument comprising: a roughness sensor placed on the table, and for outputting measurement data that includes information on the cross-sectional shape; a relative movement mechanism for relatively moving the table and the roughness sensor such that the position of the roughness sensor on the workpiece is relatively moved along the surface to be evaluated, and for outputting the amount of relative movement at a movement resolution Δθ as indexed-movement-amount information; a time sampler for sampling the measurement data output from the roughness sensor, at a constant time interval ts; and a data processing mechanism for converting the measurement data sampled at the constant time interval ts by the time sampler to measurement data having a fixed interval according to the indexed-movement-amount information output from the relative movement mechanism.

摘要翻译： 一种形状测量仪器，包括：放置在工作台上的粗糙度传感器，用于输出包括横截面形状信息的测量数据; 用于相对移动工作台和粗糙度传感器的相对运动机构，使得工件上的粗糙度传感器的位置沿着要评估的表面相对移动，并且用于以移动分辨率Deltatheta输出相对运动的量， 运动量信息; 时间采样器，用于以恒定的时间间隔t S采样从粗糙度传感器输出的测量数据; 以及数据处理机构，用于根据从相对运动输出的索引运动量信息，将由时间采样器以恒定时间间隔t 1采样的测量数据转换成具有固定间隔的测量数据 机制。

公开(公告)号：US20070198212A1

公开(公告)日：2007-08-23

申请号：US11701438

申请日：2007-02-02

申请人： Soichi Kadowaki ,  Tsukasa Kojima ,  Tomonori Goto

发明人： Soichi Kadowaki ,  Tsukasa Kojima ,  Tomonori Goto

IPC分类号： G06F17/40

CPC分类号： G01B5/008 ,  G01B21/042

摘要： A form measuring instrument measures a form of a surface of an object to be measured using a contact to follow the surface. A pseudo-measurement point acquirer acquires positional coordinates of the reference point of the contact as pseudo-measurement points when the contact touches the object at a plurality of locations. A normal vector generator estimates a surface or line along the pseudo-measurement points from the pseudo-measurement points to calculate normal vectors extending from the pseudo-measurement points to the surface or line. A contact model locator locates contact models which specify the surface form of the contact so as to coincide the pseudo-measurement points with reference points of the contact models and so as to coincide attitudes of the contact on measurement with attitudes of the contact models. A measurement point calculator calculates cross points as measurement points, at which the normal vectors cross the surfaces of the located contact models.

摘要翻译： 表面测量仪器使用触点跟随表面来测量要测量的物体的表面的形式。 伪测量点获取器获取接触点的参考点的位置坐标作为在多个位置处接触物体时的伪测量点。 法线向量生成器沿着来自伪测量点的伪测量点估计表面或线，以计算从伪测量点延伸到表面或线的法向矢量。 接触模型定位器定位指定接触面的表面形状的接触模型，以便使伪测量点与接触模型的参考点重合，以便使测量接触的态度与接触模型的态度一致。 测量点计算器计算交叉点作为测量点，在该点处法线向量与定位的联系人模型的表面交叉。

公开(公告)号：US20050159931A1

公开(公告)日：2005-07-21

申请号：US11037936

申请日：2005-01-18

申请人： Soichi Kadowaki ,  Kozo Umeda ,  Tomonori Goto

发明人： Soichi Kadowaki ,  Kozo Umeda ,  Tomonori Goto

IPC分类号： G01B21/20 ,  G01B21/04 ,  G01B21/30 ,  G01D1/00 ,  G01D3/02 ,  G06F15/00 ,  G06F17/00 ,  G06F17/10 ,  G06T5/00

CPC分类号： G01D1/00 ,  G01B21/045 ,  G01D3/022 ,  G06T5/002

摘要： A signal processing method is disclosed, where, after inputting a measurement data weighted-spline filter formula is selected to calculate an initial value of a spline filter, weight is adjusted, spline filter output is calculated, convergence is judged thereafter. When the weight is not judged converged, the weight is updated and the weight adjusting and spline filter output calculation are repeated, to conduct a robust spline filtering on the measurement data.

摘要翻译： 公开了一种信号处理方法，其中在输入了测量数据加权样条滤波器公式以选择样条滤波器的初始值之后，调整权重，计算出样条滤波器输出，此后判断收敛。 当权重未被判断收敛时，重量被更新，并重复权重调整和样条滤波器输出计算，以对测量数据进行鲁棒的样条滤波。