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1.发明申请METHOD OF STORING DATA IN NONVOLATILE MEMORY DEVICE AND METHOD OF TESTING NONVOLATILE MEMORY DEVICE 有权在非易失性存储器件中存储数据的方法和测试非易失性存储器件的方法公开(公告)号：US20140198581A1
公开(公告)日：2014-07-17
申请号：US14153140
申请日：2014-01-13
Applicant: EUN-KYOUNG KIM , MYOUNG-WON YOON , JONG-CHUL LEE , OH-SUK KWONG , WON-CHUL LEE
Inventor： EUN-KYOUNG KIM , MYOUNG-WON YOON , JONG-CHUL LEE , OH-SUK KWONG , WON-CHUL LEE
CPC classification number: G11C16/3459 , G11C16/3418 , G11C16/349 , G11C29/08 , G11C29/50016
Abstract: A method of storing data in a nonvolatile memory device comprises performing a program operation on target memory cells among multiple memory cells, performing a first verify operation to determine whether the target memory cells are in a program pass state or a program fail state, and as a consequence of determining that the target memory cells are in the program pass state, performing a second verify operation to determine whether the target memory cells exhibit a program error symptom.
Abstract translation: 一种在非易失性存储器件中存储数据的方法包括对多个存储器单元中的目标存储器单元执行编程操作，执行第一验证操作以确定目标存储器单元是处于程序通过状态还是程序失败状态，以及作为 确定目标存储器单元处于程序通过状态的结果，执行第二验证操作以确定目标存储器单元是否呈现程序错误症状。
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2.发明授权Semiconductor device having moisture-proof dam and method of fabricating the same 有权具有防潮堤的半导体装置及其制造方法公开(公告)号：US07659601B2
公开(公告)日：2010-02-09
申请号：US11823558
申请日：2007-06-28
Applicant: Ji-Suk Park , Won-Chul Lee
Inventor： Ji-Suk Park , Won-Chul Lee
IPC: H01L29/93
CPC classification number: H01L23/585 , H01L23/5258 , H01L23/564 , H01L2924/0002 , H01L2924/00
Abstract: A semiconductor device having a moisture-proof dam and a method of fabricating the same are provided. The semiconductor device includes an interlayer insulating layer provided on a substrate having a fuse region. A fuse guard dam is provided on the interlayer insulating layer to surround the fuse region. A cover insulating layer is provided on the interlayer insulating layer to cover the fuse guard dam and have a fuse window exposing a middle part of the fuse region, and at least two upper extension dams are provided in the cover insulating layer to sequentially surround the fuse region and be connected to the fuse guard dam.
Abstract translation: 提供了具有防潮堤的半导体装置及其制造方法。 半导体器件包括设置在具有熔丝区域的衬底上的层间绝缘层。 在层间绝缘层上设置保险丝保护罩，以围绕保险丝区域。 覆盖绝缘层设置在层间绝缘层上以覆盖保险丝保护堤，并具有暴露熔丝区域的中间部分的保险丝窗口，并且至少两个上部延伸堤坝设置在覆盖绝缘层中以依次围绕保险丝 区域并连接到保险丝防护堤。
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公开(公告)号：US20120089767A1
公开(公告)日：2012-04-12
申请号：US13193638
申请日：2011-07-29
Applicant: Won-chul Lee , Jeong-woo Lee
Inventor： Won-chul Lee , Jeong-woo Lee
IPC: G06F12/02
CPC classification number: G06F12/0246 , G06F2212/7204
Abstract: A storage device comprises at least one nonvolatile memory and a lock mode management module. The lock mode management module places the storage device in a soft lock mode in which only predetermined writing operations are allowed, upon determining that a number of reserved blocks in a flash memory is less than or equal to a reference value.
Abstract translation: 存储装置包括至少一个非易失性存储器和锁模式管理模块。 一旦确定闪速存储器中的多个保留块小于或等于参考值，锁定模式管理模块将存储设备置于仅允许预定写入操作的软锁定模式。
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公开(公告)号：US20120065082A1
公开(公告)日：2012-03-15
申请号：US13224064
申请日：2011-09-01
Applicant: Franciscus Albertus Kuypers , Won Chul Lee , Albert P. Pisano
Inventor： Franciscus Albertus Kuypers , Won Chul Lee , Albert P. Pisano
CPC classification number: G01N15/1484 , G01N15/1056 , G01N15/1475 , G01N2015/0069 , G01N2015/1486
Abstract: An apparatus for analyzing individual cell composition in a heterogeneous cell population may include, in one embodiment, a deposition plate having an array of microwells disposed therein, and a cover plate substantially overlying the deposition plate. A pair of electrodes may be associated with one or more of the microwells, and may be configured to generate an electric field within the associated microwell.
Abstract translation: 在一个实施例中，用于分析异种细胞群体中的个体细胞组成的装置可以包括其中布置有微孔阵列的沉积板和基本上覆盖沉积板的盖板。 一对电极可以与一个或多个微孔相关联，并且可以被配置为在相关联的微孔内产生电场。
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5.发明授权Integrated circuit fuse structures including spatter shields within opening of an insulating layer and spaced apart from a sidewall of the opening 失效集成电路保险丝结构，包括在绝缘层的开口内并与开口的侧壁间隔开的飞溅屏蔽公开(公告)号：US07671443B2
公开(公告)日：2010-03-02
申请号：US11682076
申请日：2007-03-05
Applicant: Won-Chul Lee
Inventor： Won-Chul Lee
CPC classification number: H01L23/5258 , H01L2924/0002 , H01L2924/00
Abstract: At least one fuse pattern extending in a first direction is formed on a fuse region of a substrate. A preliminary first insulating pattern is formed on the fuse region to cover the fuse pattern. A conductive layer is formed on the preliminary first insulating pattern. The conductive layer and the preliminary first insulating pattern are etched to form at least one fence extending in a second direction substantially perpendicular to the first direction. Related fuse structures are also disclosed.
Abstract translation: 在基板的熔丝区域上形成有沿第一方向延伸的至少一个熔丝图案。 在熔丝区域上形成初步的第一绝缘图案以覆盖熔丝图形。 在初步第一绝缘图案上形成导电层。 蚀刻导电层和预备的第一绝缘图案，以形成沿基本上垂直于第一方向的第二方向延伸的至少一个栅栏。 还公开了相关的熔丝结构。
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Patent Agency Ranking
6.发明申请INTEGRATED CIRCUIT FUSE STRUCTURES INCLUDING SPATTER SHIELDS AND METHODS OF FORMING THE SAME 失效集成电路保险丝结构，包括散热片及其形成方法公开(公告)号：US20070290295A1
公开(公告)日：2007-12-20
申请号：US11682076
申请日：2007-03-05
Applicant: Won-Chul Lee
Inventor： Won-Chul Lee
IPC: H01L21/44
CPC classification number: H01L23/5258 , H01L2924/0002 , H01L2924/00
Abstract: At least one fuse pattern extending in a first direction is formed on a fuse region of a substrate. A preliminary first insulating pattern is formed on the fuse region to cover the fuse pattern. A conductive layer is formed on the preliminary first insulating pattern. The conductive layer and the preliminary first insulating pattern are etched to form at least one fence extending in a second direction substantially perpendicular to the first direction. Related fuse structures are also disclosed.
Abstract translation: 在基板的熔丝区域上形成有沿第一方向延伸的至少一个熔丝图案。 在熔丝区域上形成初步的第一绝缘图案以覆盖熔丝图形。 在初步第一绝缘图案上形成导电层。 蚀刻导电层和预备的第一绝缘图案，以形成沿基本上垂直于第一方向的第二方向延伸的至少一个栅栏。 还公开了相关的熔丝结构。
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公开(公告)号：US20070170545A1
公开(公告)日：2007-07-26
申请号：US11457787
申请日：2006-07-14
Applicant: Eung-Youl Kang , Won-Chul Lee
Inventor： Eung-Youl Kang , Won-Chul Lee
IPC: H01L29/00
CPC classification number: H01L23/5258 , H01L2924/0002 , H01L2924/00
Abstract: In one embodiment a fuse region includes an insulating layer disposed on a substrate, a fuse disposed on the insulating layer and including a fuse barrier pattern and a fuse conductive pattern, which are stacked, and a supporting plug disposed beneath the fuse, and penetrating the insulating layer and the fuse barrier pattern.
Abstract translation: 在一个实施例中，熔丝区域包括设置在基板上的绝缘层，设置在绝缘层上的熔丝，并且包括堆叠的熔丝阻挡图案和熔丝导电图案，以及设置在保险丝下方的支撑插头， 绝缘层和熔丝屏障图案。
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公开(公告)号：US10247656B2
公开(公告)日：2019-04-02
申请号：US13224064
申请日：2011-09-01
Applicant: Franciscus Albertus Kuypers , Won Chul Lee , Albert P. Pisano
Inventor： Franciscus Albertus Kuypers , Won Chul Lee , Albert P. Pisano
Abstract: An apparatus for analyzing individual cell composition in a heterogeneous cell population may include, in one embodiment, a deposition plate having an array of microwells disposed therein, and a cover plate substantially overlying the deposition plate. A pair of electrodes may be associated with one or more of the microwells, and may be configured to generate an electric field within the associated microwell.
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公开(公告)号：US20050019723A1
公开(公告)日：2005-01-27
申请号：US10658672
申请日：2003-09-09
Applicant: Dae-Woong Kim , Won-Chul Lee
Inventor： Dae-Woong Kim , Won-Chul Lee
CPC classification number: A61C9/002
Abstract: Disclosed is a fixing pin for a model teeth die connecting a model teeth die to a model base. The fixing pin includes a model base inserting portion having a side expansion portion and being inserted into the model base, and a die inserting portion being fixedly inserted into the model teeth die. The model base inserting portion is a taper type, and the side expansion portion is a streamline and expands from one side of the model base inserting portion. Further, the die inserting portion is formed on the upper surface of the model base inserting portion neighboring to the side expansion portion. Thereby, when the model teeth die is connected to the model base, it is prevented from being rotated. Further, the fixing pin may be easily manufactured.
Abstract translation: 公开了一种用于将型号牙模与模型基座连接的模型牙齿模具的固定销。 固定销包括具有侧部膨胀部分并插入到模型基座中的模型基部插入部分，并且模具插入部分固定地插入到模型牙齿模具中。 模型基础插入部分是锥形的，侧面扩张部分是流线并从模型基础插入部分的一侧膨胀。 此外，模具插入部分形成在与侧面扩张部分相邻的模型基部插入部分的上表面上。 因此，当模型齿模连接到模型基座时，防止其旋转。 此外，可以容易地制造固定销。
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10.发明授权Method of storing data in nonvolatile memory device and method of testing nonvolatile memory device 有权在非易失性存储器件中存储数据的方法和非易失性存储器件的测试方法公开(公告)号：US09183946B2
公开(公告)日：2015-11-10
申请号：US14153140
申请日：2014-01-13
Applicant: Eun-Kyoung Kim , Myoung-Won Yoon , Jong-Chul Lee , Oh-Suk Kwong , Won-Chul Lee
Inventor： Eun-Kyoung Kim , Myoung-Won Yoon , Jong-Chul Lee , Oh-Suk Kwong , Won-Chul Lee
CPC classification number: G11C16/3459 , G11C16/3418 , G11C16/349 , G11C29/08 , G11C29/50016
Abstract: A method of storing data in a nonvolatile memory device comprises performing a program operation on target memory cells among multiple memory cells, performing a first verify operation to determine whether the target memory cells are in a program pass state or a program fail state, and as a consequence of determining that the target memory cells are in the program pass state, performing a second verify operation to determine whether the target memory cells exhibit a program error symptom.
Abstract translation: 一种在非易失性存储器件中存储数据的方法包括对多个存储器单元中的目标存储器单元执行编程操作，执行第一验证操作以确定目标存储器单元是处于程序通过状态还是程序失败状态，以及作为 确定目标存储器单元处于程序通过状态的结果，执行第二验证操作以确定目标存储器单元是否呈现程序错误症状。
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