Semiconductor device and method of manufacturing semiconductor device
    1.
    发明授权
    Semiconductor device and method of manufacturing semiconductor device 有权
    半导体装置及其制造方法

    公开(公告)号:US07795688B2

    公开(公告)日:2010-09-14

    申请号:US11422975

    申请日:2006-06-08

    IPC分类号: H01L29/43

    摘要: A semiconductor device including, on a substrate, a first conduction type MOS transistor having a gate electrode provided in a first trench formed in an insulation film on the substrate, and a second conduction type MOS transistor having a gate electrode provided in a second trench formed in the insulation film, the first conduction type and the second conduction type being opposite types.

    摘要翻译: 一种半导体器件,在基板上包括第一导电型MOS晶体管,该第一导电型MOS晶体管具有形成在基板上的绝缘膜中的第一沟槽中的栅电极,以及第二导电型MOS晶体管,其具有形成在第二沟槽中的栅电极 在绝缘膜中,第一导电类型和第二导电类型是相反的。

    INSULATED GATE FIELD EFFECT TRANSISTOR AND A METHOD OF MANUFACTURING THE SAME
    3.
    发明申请
    INSULATED GATE FIELD EFFECT TRANSISTOR AND A METHOD OF MANUFACTURING THE SAME 有权
    绝缘栅场效应晶体管及其制造方法

    公开(公告)号:US20080185637A1

    公开(公告)日:2008-08-07

    申请号:US12025965

    申请日:2008-02-05

    IPC分类号: H01L29/00 H01L21/336

    摘要: Disclosed herein is an insulated gate field effect transistor including: (A) a source/drain region and a channel formation region; (B) a gate electrode formed above the channel formation region; and (C) a gate insulating film; wherein the gate insulating film is composed of a gate insulating film main body portion formed between the gate electrode and the channel formation region, and a gate insulating film extension portion extending from the insulating film main body portion to a middle of a side surface portion of the gate electrode, and when a height of the gate electrode is HGate and a height of the gate insulating film extension portion is HIns with a surface of the channel formation region as a reference, a relationship of HIns

    摘要翻译: 本文公开了一种绝缘栅场效应晶体管,包括:(A)源/漏区和沟道形成区; (B)形成在沟道形成区域上方的栅电极; 和(C)栅极绝缘膜; 其特征在于,所述栅极绝缘膜由形成在所述栅极电极与所述沟道形成区域之间的栅极绝缘膜主体部分和从所述绝缘膜主体部分延伸到所述栅极绝缘膜主体部分的侧面部分的中部 栅电极,并且当栅电极的高度为H 且栅极绝缘膜延伸部分的高度为沟道形成区域的表面时为H < 作为参考,实现了H Gate 的关系。

    Insulated gate field effect transistor and a method of manufacturing the same
    5.
    发明授权
    Insulated gate field effect transistor and a method of manufacturing the same 有权
    绝缘栅场效应晶体管及其制造方法

    公开(公告)号:US07977751B2

    公开(公告)日:2011-07-12

    申请号:US12025965

    申请日:2008-02-05

    IPC分类号: H01L29/76

    摘要: Disclosed herein is an insulated gate field effect transistor including: (A) a source/drain region and a channel formation region; (B) a gate electrode formed above the channel formation region; and (C) a gate insulating film; wherein the gate insulating film is composed of a gate insulating film main body portion formed between the gate electrode and the channel formation region, and a gate insulating film extension portion extending from the insulating film main body portion to a middle of a side surface portion of the gate electrode, and when a height of the gate electrode is HGate and a height of the gate insulating film extension portion is HIns with a surface of the channel formation region as a reference, a relationship of HIns

    摘要翻译: 本文公开了一种绝缘栅场效应晶体管,包括:(A)源/漏区和沟道形成区; (B)形成在沟道形成区域上方的栅电极; 和(C)栅极绝缘膜; 其特征在于,所述栅极绝缘膜由形成在所述栅极电极与所述沟道形成区域之间的栅极绝缘膜主体部分和从所述绝缘膜主体部分延伸到所述栅极绝缘膜主体部分的侧面部分的中部 栅电极,并且当栅电极的高度为HGate并且栅极绝缘膜延伸部分的高度为沟道形成区域的表面为HIns时,满足HIns

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
    7.
    发明申请
    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE 有权
    半导体器件及制造半导体器件的方法

    公开(公告)号:US20060278934A1

    公开(公告)日:2006-12-14

    申请号:US11422975

    申请日:2006-06-08

    IPC分类号: H01L29/78 H01L21/8238

    摘要: A semiconductor device including, on a substrate, a first conduction type MOS transistor having a gate electrode provided in a first trench formed in an insulation film on the substrate, and a second conduction type MOS transistor having a gate electrode provided in a second trench formed in the insulation film, the first conduction type and the second conduction type being opposite types.

    摘要翻译: 一种半导体器件,在基板上包括第一导电型MOS晶体管,该第一导电型MOS晶体管具有形成在基板上的绝缘膜中的第一沟槽中的栅电极,以及第二导电型MOS晶体管,其具有形成在第二沟槽中的栅电极 在绝缘膜中,第一导电类型和第二导电类型是相反的。