Time of flight estimation using a convolutional neural network

    公开(公告)号:US10051423B1

    公开(公告)日:2018-08-14

    申请号:US15612553

    申请日:2017-06-02

    Applicant: Apple Inc.

    Abstract: Embodiments herein relate to using a convolutional neural network (CNN) for time-of-flight estimation in a wireless communication system. A wireless device may receive, from a remote device, wireless communications including a first transmission time value associated with the transmission of the wireless communications. The wireless device may perform a coarse time-of-arrival (TOA) estimation on the wireless communications received from the remote device. The coarse TOA estimation may be used to generate an estimated impulse response, which may be input to a CNN associated with the wireless device to calculate a line-of-sight estimate. The wireless device may determine a range between the wireless device and the remote device based on the transmission time value and the line-of-sight estimate.

    Classifying memory cells to multiple impairment profiles based on readout bit-flip counts

    公开(公告)号:US10438683B2

    公开(公告)日:2019-10-08

    申请号:US15810166

    申请日:2017-11-13

    Applicant: Apple Inc.

    Abstract: A storage apparatus includes a plurality of memory cells and storage circuitry. The storage circuitry is configured to store a mapping that maps sets of readout bit-flip counts to respective predefined impairment profiles. The impairment profiles specify two or more severity levels of respective impairment types, including read disturb, retention and endurance. Each of the bit-flip counts includes a one-to-zero error count or a zero-to-one error count. The storage circuitry is configured to read data from a group of the memory cells using given readout parameters, to evaluate an actual set of bit-flip counts corresponding to the read data, to classify the group of the memory cells to a respective impairment profile by mapping the actual set of the bit-flip counts using the mapping, and to adapt the readout parameters based on the impairment profile to which the group of the memory cells was classified.

    Classifying Memory Cells to Multiple Impairment Profiles Based on Readout Bit-Flip Counts

    公开(公告)号:US20180075926A1

    公开(公告)日:2018-03-15

    申请号:US15810166

    申请日:2017-11-13

    Applicant: Apple Inc.

    CPC classification number: G11C29/44 G11C29/028 G11C29/38

    Abstract: A storage apparatus includes a plurality of memory cells and storage circuitry. The storage circuitry is configured to store a mapping that maps sets of readout bit-flip counts to respective predefined impairment profiles. The impairment profiles specify two or more severity levels of respective impairment types, including read disturb, retention and endurance. Each of the bit-flip counts includes a one-to-zero error count or a zero-to-one error count. The storage circuitry is configured to read data from a group of the memory cells using given readout parameters, to evaluate an actual set of bit-flip counts corresponding to the read data, to classify the group of the memory cells to a respective impairment profile by mapping the actual set of the bit-flip counts using the mapping, and to adapt the readout parameters based on the impairment profile to which the group of the memory cells was classified.

    Classifying memory cells to multiple impairment profiles based on readout bit-flip counts

    公开(公告)号:US09847141B1

    公开(公告)日:2017-12-19

    申请号:US15225863

    申请日:2016-08-02

    Applicant: APPLE INC.

    CPC classification number: G11C29/44 G11C29/028 G11C29/38

    Abstract: A storage apparatus includes a plurality of memory cells and storage circuitry. The storage circuitry is configured to store a mapping that maps sets of readout bit-flip counts to respective predefined impairment profiles. The impairment profiles specify two or more severity levels of respective impairment types, including read disturb, retention and endurance. Each of the bit-flip counts includes a one-to-zero error count or a zero-to-one error count. The storage circuitry is configured to read data from a group of the memory cells using given readout parameters, to evaluate an actual set of bit-flip counts corresponding to the read data, to classify the group of the memory cells to a respective impairment profile by mapping the actual set of the bit-flip counts using the mapping, and to adapt the readout parameters based on the impairment profile to which the group of the memory cells was classified.

Patent Agency Ranking