METHODS AND APPARATUS FOR ANOMALY RESPONSE
    1.
    发明申请

    公开(公告)号:US20190391888A1

    公开(公告)日:2019-12-26

    申请号:US16014154

    申请日:2018-06-21

    Applicant: Arm Limited

    Abstract: Examples of the present disclosure relate to a method for anomaly response in a system on chip. The method comprises measuring a magnitude of a transient anomaly event in an operating condition of the system on chip. Based on the magnitude it is determined, for each of a plurality of components of the system on chip, an indication of susceptibility of that component to an anomaly event of the measured magnitude. Based on the determined indications of susceptibility for each of the plurality of components, an anomaly response action is determined. The method then comprises performing the anomaly response action.

    POST-MANUFACTURING ADAPTATION OF A DATA PROCESSING APPARATUS

    公开(公告)号:US20230185651A1

    公开(公告)日:2023-06-15

    申请号:US17547963

    申请日:2021-12-10

    Applicant: Arm Limited

    CPC classification number: G06F11/0787 G06F13/24 G06F30/20

    Abstract: Methods of performing post-manufacturing adaptation of a data processing apparatus manufactured in accordance with a processor design and corresponding data processing apparatus configurations are provided. Post-manufacturing testing of the data processing apparatus determines any dysfunctional instructions by comparison between component usage profiles for each instruction and a component fault-detection procedure applied to the data processing apparatus. The data processing apparatus can be determined nevertheless to be operationally viable when any dysfunctional instructions can be substituted for by emulation using other functional instructions. The data processing apparatus can be provided with dysfunctional instruction handling circuitry configured to identify occurrence of a program instruction instance of a dysfunctional instruction and to invoke an interrupt handling routine associated with the dysfunctional instruction to emulate the instance of a dysfunctional instruction.

    TECHNIQUE FOR MONITORING A BATTERY CELL
    3.
    发明公开

    公开(公告)号:US20230178819A1

    公开(公告)日:2023-06-08

    申请号:US17541000

    申请日:2021-12-02

    Applicant: Arm Limited

    CPC classification number: H01M10/482 G01R31/392

    Abstract: A battery cell monitoring system comprises a flexible substrate able to conform to a surface of a battery cell to be monitored, and a plurality of first-level prediction units integrated onto the flexible substrate, where each first-level prediction unit is positioned at a different location on the flexible substrate to each other first-level prediction unit. Each first-level prediction unit comprises at least one sensor to generate sensor signals indicative of a physical state of the battery cell, and first-level prediction circuitry to generate a predicted battery cell status value in dependence on the sensor signals received from the at least one sensor of that first-level prediction unit. Second-level prediction circuitry is arranged to determine a prediction result in dependence on the predicted battery cell status values generated by the first-level prediction circuitry of each first-level prediction unit, and a communications device is used to output the prediction result at least when the prediction result indicates an occurrence of a critical event.

    DATA PROCESSING APPARATUS AND METHOD FOR ANALYSING TRANSIENT FAULTS OCCURRING WITHIN STORAGE ELEMENTS OF THE DATA PROCESSING APPARATUS
    4.
    发明申请
    DATA PROCESSING APPARATUS AND METHOD FOR ANALYSING TRANSIENT FAULTS OCCURRING WITHIN STORAGE ELEMENTS OF THE DATA PROCESSING APPARATUS 审中-公开
    数据处理装置和方法,用于分析在数据处理装置的存储元件中发生的瞬时故障

    公开(公告)号:US20140223229A1

    公开(公告)日:2014-08-07

    申请号:US14246162

    申请日:2014-04-07

    Applicant: ARM Limited

    Abstract: A data processing apparatus has a plurality of storage elements residing at different physical locations within the apparatus, and fault history circuitry for detecting local transient faults occurring in each storage element, and for maintaining global transient fault history data based on the detected local transient faults. Analysis circuitry monitors the global transient fault history data to determine, based on predetermined criteria, whether the global transient fault history data is indicative of random transient faults occurring within the data processing apparatus, or is indicative of a coordinated transient fault attack. The analysis circuitry is then configured to initiate a countermeasure action on determination of a coordinated transient fault attack. This provides a simple and effective mechanism for distinguishing between random transient faults that may naturally occur, and a coordinated transient fault attack that may be initiated in an attempt to circumvent the security of the data processing apparatus.

    Abstract translation: 数据处理装置具有驻留在装置内的不同物理位置的多个存储元件,以及故障历史电路,用于检测每个存储元件中发生的局部瞬态故障,并且用于基于检测到的局部瞬态故障来维护全局瞬态故障历史数据。 分析电路监视全局瞬态故障历史数据,以基于预定标准确定全局瞬态故障历史数据是否表示在数据处理装置内发生的随机瞬态故障,或指示协调的瞬时故障攻击。 分析电路然后被配置为启动对协调的瞬态故障攻击的确定的对策动作。 这提供了一种用于区分可能自然发生的随机瞬态故障的简单和有效的机制,以及可以在试图绕过数据处理设备的安全性时发起的协调的瞬态故障攻击。

    INTEGRITY MONITORING FOR FLEXIBLE MATERIAL
    6.
    发明公开

    公开(公告)号:US20230172287A1

    公开(公告)日:2023-06-08

    申请号:US17543070

    申请日:2021-12-06

    Applicant: Arm Limited

    CPC classification number: A41D1/002 G06F1/163 A61F6/04 A41D19/015

    Abstract: Wearable items and methods of monitoring wearable items are disclosed. The wearable item comprises a flexible base material forming at least a portion of the wearable item, plural conductive traces traversing the flexible base material, and conductivity sensing circuitry coupled to the plural conductive traces. The conductivity sensing circuitry is configured to distinguish conductivity from non-conductivity of the plural conductive traces, and configured to generate a conductivity indication for at least one of the plural conductive traces. The plural conductive traces follow indirect paths across the flexible base material, allowing the flexible material to flex and stretch normally without breaking the conductive traces.

    DATA TRANSFER BETWEEN USER-WORN DEVICES
    7.
    发明公开

    公开(公告)号:US20230367394A1

    公开(公告)日:2023-11-16

    申请号:US18313102

    申请日:2023-05-05

    Applicant: Arm Limited

    CPC classification number: G06F3/015 A61B5/256 A61B5/7285

    Abstract: Wearable devices, systems of wearable devices, and methods of operating the same are disclosed. A first wearable device worn in contact with the user’s skin monitors the user and comprises a transmission electrode in contact with the user’s skin. A second wearable device comprises a reception electrode worn in contact with the user’s skin. The first wearable device can apply an alert signal to the transmission electrode and measures a transmission current at the transmission electrode. The second wearable device monitors an electrical status of the reception electrode and when the alert signal is detected applies an alert response signal to the receiver electrode. The first wearable device identifies application of the alert response signal to the receiver electrode by measurement of a variation of the transmission current at the transmission electrode whilst the alert signal is applied to the transmission electrode.

    CLASS PREDICTION BASED ON MULTIPLE ITEMS OF FEATURE DATA

    公开(公告)号:US20220398409A1

    公开(公告)日:2022-12-15

    申请号:US17805610

    申请日:2022-06-06

    Applicant: Arm Limited

    Inventor: Emre OZER

    Abstract: Apparatuses and methods for supporting class prediction based on multiple items of feature data are provided. Learning phase training data with known classification are used as inputs. Each event of the training data maps multiple items of feature data to encodings, where a range of values for each feature input are mapped to a given encoding. The concatenated encoding for the event form a joint feature item. Class counters are used to count class known to associated with the training event for the joint feature item in a table. At the conclusion of the training phase the class counter values enable a predicted class to be associated with each joint feature item in the table. In the inference phase the table is used for class prediction generation for new data events. The inference phase may be implemented in hardware which has less data handling capability than in the learning phase.

    ERROR DETECTION
    9.
    发明申请
    ERROR DETECTION 审中-公开

    公开(公告)号:US20180129573A1

    公开(公告)日:2018-05-10

    申请号:US15800145

    申请日:2017-11-01

    Applicant: ARM Limited

    Abstract: An apparatus 2 comprises at least three processing circuits 4 to perform redundant processing of a common thread of program instructions. Error detection circuitry 16 is provided comprising a number of comparators 22 for detecting a mismatch between signals on corresponding signal nodes 20 in the processing circuits 4. When a comparator 22 detects a mismatch, this triggers a recovery process. The error detection circuitry 16 generates an unresolvable error signal 36 indicating that a detected area is unresolvable by the recovery process when, during the recovery process, a mismatch is detected by one of the proper subset 34 of the comparators 22. By considering fewer comparators 22 during the recovery process than during normal operation, the chances of unrecoverable errors being detected can be reduced, increasing system availability.

    INTEGRATED CIRCUIT WITH ERROR REPAIR AND FAULT TOLERANCE
    10.
    发明申请
    INTEGRATED CIRCUIT WITH ERROR REPAIR AND FAULT TOLERANCE 审中-公开
    具有错误维修和故障保修的集成电路

    公开(公告)号:US20140068371A1

    公开(公告)日:2014-03-06

    申请号:US14079276

    申请日:2013-11-13

    Applicant: ARM Limited

    CPC classification number: G06F11/0793 G01R31/31816 G06F11/1076 G06F11/1608

    Abstract: An integrated circuit is provided with error detection circuitry and error repair circuitry. Error tolerance circuitry is responsive to a control parameter to selectively disable the error repair circuitry. The control parameter is dependent on the processing performed within the circuit. For example, the control parameter may be generated in dependence upon the program instruction being executed, the output signal value which is in error, the previous behavior of the circuit or in other ways.

    Abstract translation: 集成电路具有错误检测电路和错误修复电路。 误差容限电路响应于控制参数来选择性地禁用错误修复电路。 控制参数取决于电路内执行的处理。 例如,控制参数可以根据执行的程序指令,错误的输出信号值,电路的先前行为或其他方式来生成。

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