METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
    1.
    发明申请
    METHOD AND APPARATUS FOR INSPECTION AND METROLOGY 有权
    检验和计量方法与装置

    公开(公告)号:US20160266503A1

    公开(公告)日:2016-09-15

    申请号:US15065674

    申请日:2016-03-09

    Abstract: A method of position control of an optical component relative to a surface is disclosed. The method may include: obtaining a first signal by a first position measurement process; controlling relative movement between the optical component and the surface for a first range of motion using the first signal; obtaining a second signal by a second position measurement process different than the first position measurement process; and controlling relative movement between the optical component and the surface for a second range of motion using the second signal, the second range of motion being nearer the surface than the first range of motion.

    Abstract translation: 公开了一种光学部件相对于表面的位置控制的方法。 该方法可以包括:通过第一位置测量处理获得第一信号; 使用所述第一信号来控制所述光学部件和所述表面之间的第一运动范围的相对运动; 通过与第一位置测量处理不同的第二位置测量处理获得第二信号; 以及使用所述第二信号来控制所述光学部件和所述表面之间的相对运动的第二运动范围,所述第二运动范围比所述第一运动范围更靠近所述表面。

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