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公开(公告)号:US20230221651A1
公开(公告)日:2023-07-13
申请号:US18124350
申请日:2023-03-21
Applicant: ASML NETHERLANDS B.V.
Inventor: Catharinus DE SCHIFFART , Michael Jozef Mathijs RENKENS , Gerard VAN SCHOTHORST , Andre Bernardus JEUNINK , Gregor Edward VAN BAARS , Sander Frederik WUISTER , Yvonne Wendela KRUIJT-STEGEMAN , Norbert Erwin Therenzo JANSEN , Toon HARDEMAN , George Arie Jan DE FOCKERT , Johan Frederik DIJKSMAN
CPC classification number: G03F7/7035 , G03F7/709 , G03F9/7042 , G03F7/70825 , G03F7/70775 , G03F7/7085 , G03F7/0002
Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.
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公开(公告)号:US20210096468A1
公开(公告)日:2021-04-01
申请号:US17120506
申请日:2020-12-14
Applicant: ASML NETHERLANDS B.V.
Inventor: Catharinus DE SCHIFFART , Michael Jozef Mathijs RENKENS , Gerard VAN SCHOTHORST , Andre Bernardus JEUNINK , Gregor Edward VAN BAARS , Sander Frederik WUISTER , Yvonne Wendela KRUIJT-STEGEMAN , Norbert Erwin Therenzo JANSEN , Toon HARDEMAN , George Arie Jan DE FOCKERT , Johan Frederik DIJKSMAN
Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.
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公开(公告)号:US20180088468A1
公开(公告)日:2018-03-29
申请号:US15828523
申请日:2017-12-01
Applicant: ASML NETHERLANDS B.V.
Inventor: Catharinus DE SCHIFFART , Michael Jozef Mathijs RENKENS , Gerard VAN SCHOTHORST , Andre Bernardus JEUNINK , Gregor Edward VAN BAARS , Sander Frederik WUISTER , Yvonne Wendela KRUIJT-STEGEMAN , Norbert Erwin Therenzo JANSEN , Toon HARDEMAN , George Arie Jan DE FOCKERT , Johan Frederik DIJKSMAN
CPC classification number: G03F7/7035 , B29C43/021 , B29C43/04 , B29C43/14 , B29C2043/142 , B82Y10/00 , B82Y40/00 , G03F7/0002 , G03F7/70775 , G03F7/70825 , G03F7/7085 , G03F7/709 , G03F9/7042
Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.
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公开(公告)号:US20180368241A1
公开(公告)日:2018-12-20
申请号:US15781885
申请日:2016-11-22
Applicant: ASML NETHERLANDS B.V.
Inventor: Johan Frederik DIJKSMAN , Wilhelmus Henricus Theodorus Maria AANGENENT , Ronald Johannes HULTERMANS , Bastiaan Lambertus Wilhelmus Marinus VAN DE VEN , Peter Wilhelm Hendrik VAN PUTTEN
IPC: H05G2/00
Abstract: An EUV source for generating a beam of EUV radiation, has a droplet generator with a nozzle assembly to emit droplets of fuel from a nozzle towards a plasma formation location. The nozzle assembly receives the fuel from a reservoir. The nozzle assembly has a pump chamber receiving the fuel from the reservoir and an actuator to vibrate a membrane that forms a wall of the pump chamber. The wall is oriented perpendicularly to a direction wherein the nozzle emits the fuel. The nozzle assembly has first and second nozzle filters non-adjacently arranged in series in a path of the fuel from the pump chamber to the nozzle.
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