Optical system and lithography apparatus

    公开(公告)号:US12130557B2

    公开(公告)日:2024-10-29

    申请号:US17885353

    申请日:2022-08-10

    IPC分类号: G03F7/00

    摘要: An optical system comprises at least one mirror having a mirror body and a mirror surface, and at least one actuator device coupled to the mirror body and serving for deforming the mirror surface. The actuator device comprises at least one electrostrictive actuator element for generating a mechanical stress in the mirror body for deforming the mirror surface depending on an electrical drive voltage, and at least one electrostrictive sensor element for outputting a sensor signal depending on a deformation of the sensor element. The at least one sensor element is arranged directly adjacent to the actuator element and/or is arranged in such a way that it is configured at least partly for transferring the mechanical stress generated by the actuator element to the mirror body.

    SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD

    公开(公告)号:US20240329547A1

    公开(公告)日:2024-10-03

    申请号:US18612976

    申请日:2024-03-21

    IPC分类号: G03F7/00

    摘要: A substrate processing apparatus includes: a base including a drive mechanism; a cover enclosing the base; a lifting body protruding from an internal region enclosed by the cover to an external region outside the internal region, and moving up and down with respect to the base by the drive mechanism; a processing body that is connected to the lifting body in the external region, and processes a substrate; and a suction tube with a suction port for sucking particles generated from the drive mechanism.

    MASK EXPOSURE SYSTEM AND MASK EXPOSURE METHOD

    公开(公告)号:US20240152062A1

    公开(公告)日:2024-05-09

    申请号:US18354207

    申请日:2023-07-18

    IPC分类号: G03F7/00 G03F7/20

    摘要: A mask exposure system includes a chamber, a stage configured to receive a mask, one or more mask temperature sensors, a beam source configured to irradiate an electron beam on the mask, a deflector configured to adjust a position at which the electron beam is irradiated on the mask by deflecting the electron beam based on a voltage level applied to the deflector, in the chamber, a chamber temperature sensor configured to measure an internal temperature of the chamber, and a controller configured to control a direction of deflection and a degree of deflection of the electron beam the deflector. The controller is configured to correct the voltage level applied to the deflector based on a difference between the temperature of the mask and the chamber.

    MASK INSPECTION APPARATUS WITH A PLATFORM MODULE

    公开(公告)号:US20240027922A1

    公开(公告)日:2024-01-25

    申请号:US18224063

    申请日:2023-07-20

    申请人: STEK CO., LTD.

    发明人: Ming-Sheng Chen

    IPC分类号: G03F7/00 G03F1/84

    摘要: A mask inspection machine includes a platform unit for carrying a transparent container. The transparent container includes a lower window and an upper window. The platform unit includes a platform and a carrier. The platform includes a slot. The carrier is movable on the platform along the slot. The carrier includes a plate and guiding elements. The plate includes a support face including an inspection window corresponding to the lower window of the transparent container. The guiding elements are connected to the support face for guiding the transparent container onto the support face.

    WORKPIECE SUPPORT
    6.
    发明公开
    WORKPIECE SUPPORT 审中-公开

    公开(公告)号:US20230375945A1

    公开(公告)日:2023-11-23

    申请号:US17749037

    申请日:2022-05-19

    IPC分类号: G03F7/20

    CPC分类号: G03F7/70825 H01L21/67742

    摘要: The present disclosure is directed to workpiece support for supporting a workpiece during semiconductor processing. The workpiece support includes one or more support frame bodies including a plurality of spaced apart spacers on a first surface of the support frame bodies. The spacers include a first surface spaced apart from the first surface of the support frame body. The spacing between the first surface of the spacers and the first surface of the support frame body results in the underside of the workpiece contacting the spacers but not contacting the first surface of the support frame body. Portions of the underside of the workpiece that do not contact the first surface of the support frame body are less susceptible to damage or accumulation of unwanted debris.

    Compensation of creep effects in an imaging device

    公开(公告)号:US11703770B2

    公开(公告)日:2023-07-18

    申请号:US17354212

    申请日:2021-06-22

    IPC分类号: G03F7/20 G03F7/00

    摘要: An arrangement of a microlithographic optical imaging device includes first and supporting structures. The first supporting structure supports an optical element of the imaging device. The first supporting structure supports the second supporting structure via supporting spring devices of a vibration decoupling device. The supporting spring devices act kinematically parallel to one another between the first and second supporting structures. Each supporting spring device defines a supporting force direction and a supporting length along the supporting force direction. The second supporting structure supports a measuring device configured to measure the position and/or orientation of the optical element in relation to a reference in at least one degree of freedom and up to all six degrees of freedom in space. A creep compensation device compensates a change in a static relative situation between the first and second supporting structures in at least one correction degree of freedom.

    Multi-volume baking chamber for mask clean

    公开(公告)号:US11644748B2

    公开(公告)日:2023-05-09

    申请号:US17226775

    申请日:2021-04-09

    IPC分类号: G03F1/82 G03F7/20 G03F7/16

    摘要: Embodiments of baking chambers for baking a photomask are provided herein. In some embodiments, a baking chamber includes: a chamber body enclosing a first interior volume and a second interior volume, disposed beneath and fluidly independent from the first interior volume; a radiant heat source disposed in the first interior volume; a photomask support structure configured to support a photomask disposed in the second interior volume; a window disposed between the first interior volume the second interior volume, wherein the window is made of a material that is transparent to thermal radiation; a first gas inlet and a first gas outlet coupled to the first interior volume; and a second gas inlet and a second gas outlet coupled to the second interior volume on opposite ends thereof to facilitate flow of a process gas laterally through the second interior volume and across the photomask support structure.