公开(公告)号：US10120430B2

公开(公告)日：2018-11-06

申请号：US15258816

申请日：2016-09-07

Applicant: Advanced Micro Devices, Inc. ,  ATI Technologies ULC

Inventor： Stephen V. Kosonocky ,  Thomas Burd ,  Adam Clark ,  Larry D. Hewitt ,  John Vincent Faricelli ,  John P. Petry

IPC: G06F1/32 ,  G01R31/28 ,  G06F11/00 ,  G06F11/34

Abstract: A system and method for managing operating modes within a semiconductor chip for optimal power and performance while meeting a reliability target are described. A semiconductor chip includes a functional unit and a corresponding reliability monitor. The functional unit provides actual usage values to the reliability monitor. The reliability monitor determines expected usage values based on a reliability target and the age of the semiconductor chip. The reliability monitor compares the actual usage values and the expected usage values. The result of this comparison is used to increase or decrease current operational parameters.

公开(公告)号：US11507158B2

公开(公告)日：2022-11-22

申请号：US16872602

申请日：2020-05-12

Applicant: ADVANCED MICRO DEVICES, INC. ,  ATI TECHNOLOGIES ULC

Inventor： Xiuting Kaleen Cheng Man ,  Erik Swanson ,  Larry D. Hewitt ,  Adam N. C. Clark

IPC: G06F1/26

Abstract: Electrical design current throttling, including: applying an electrical design current (EDC) threshold for each control processing unit component of a plurality of the central processing unit components responsive to the corresponding priority of each central processing unit component, the priority of a central processing unit component responsive to a central processing unit component's current usage data.

公开(公告)号：US10170994B1

公开(公告)日：2019-01-01

申请号：US15682900

申请日：2017-08-22

Applicant: Advanced Micro Devices, Inc.

Inventor： Thomas J. Gibney ,  Larry D. Hewitt ,  Daniel L. Bouvier

IPC: H02M3/158 ,  H02M3/139

Abstract: The described embodiments include an apparatus that controls voltages for an integrated circuit chip having a set of circuits. The apparatus includes a switching voltage regulator separate from the integrated circuit chip and two or more low dropout (LDO) regulators fabricated on the integrated circuit chip. During operation, the switching voltage regulator provides an output voltage that is received as an input voltage by each of the two or more LDO regulators, and each of the two or more LDO regulators provides a local output voltage, each local output voltage received as a local input voltage by a different subset of circuits in the set of circuits.

公开(公告)号：US20220413584A1

公开(公告)日：2022-12-29

申请号：US17358709

申请日：2021-06-25

Applicant: Advanced Micro Devices, Inc.

Inventor： Richard Martin Born ,  Gokul Subramani Ramalingam Lakshmi Devi ,  Michael L. Golden ,  Larry D. Hewitt

IPC: G06F1/3228

Abstract: Methods and systems for facilitating improved power consumption control of a plurality of processing cores are disclosed. The methods improve the power consumption control by performing power throttling based on a determined excess power consumption. The methods include the steps of: monitoring using at least one event count component in the respective processing core a plurality of distributed events; calculating an accumulated weighted sum of the distributed events from the event count component; determining an excess power consumption by comparing the accumulated weighted sum with a threshold power value; and adjusting power consumption of the respective processing core based on the determined excess power consumption.

公开(公告)号：US20180067535A1

公开(公告)日：2018-03-08

申请号：US15258816

申请日：2016-09-07

Applicant: Advanced Micro Devices, Inc. ,  ATI Technologies ULC

Inventor： Stephen V. Kosonocky ,  Thomas Burd ,  Adam Clark ,  Larry D. Hewitt ,  John Vincent Faricelli ,  John P. Petry

IPC: G06F1/32 ,  G01R31/28

CPC classification number: G06F1/3209 ,  G01R31/2856 ,  G01R31/2874 ,  G06F1/3206 ,  G06F1/3234 ,  G06F11/008 ,  G06F11/3409

Abstract: A system and method for managing operating modes within a semiconductor chip for optimal power and performance while meeting a reliability target are described. A semiconductor chip includes a functional unit and a corresponding reliability monitor. The functional unit provides actual usage values to the reliability monitor. The reliability monitor determines expected usage values based on a reliability target and the age of the semiconductor chip. The reliability monitor compares the actual usage values and the expected usage values. The result of this comparison is used to increase or decrease current operational parameters.