公开(公告)号：US06369985B1

公开(公告)日：2002-04-09

申请号：US09507816

申请日：2000-02-22

申请人： Akio Gouo ,  Hidehiko Kira ,  Norio Kainuma ,  Takeshi Ohwe

发明人： Akio Gouo ,  Hidehiko Kira ,  Norio Kainuma ,  Takeshi Ohwe

IPC分类号： G11B548

CPC分类号： G11B5/4853 ,  G11B5/4806 ,  G11B5/486 ,  G11B33/121

摘要： A head slider and head IC are mounted on a head suspension, the head IC being mounted on a head IC mounting surface. One or more through holes are provided on the head IC mounting surface of the head suspension and the head IC is mounted by injecting a bonding agent between the mounting surface and the head IC through the through holes. The bonding agent is evenly distributed beneath the head IC, so that the head suspension is well balanced.

摘要翻译： 头部滑块和头部IC安装在头部悬挂上，头部IC安装在头部IC安装表面上。 一个或多个通孔设置在头悬架的头部IC安装表面上，并且通过通孔在安装表面和头部IC之间注入粘合剂来安装头部IC。 粘合剂均匀地分布在头部IC下面，使得头部悬挂体系平衡良好。

公开(公告)号：US06781794B2

公开(公告)日：2004-08-24

申请号：US10443306

申请日：2003-05-22

申请人： Takeshi Ohwe ,  Akio Gouo

发明人： Takeshi Ohwe ,  Akio Gouo

IPC分类号： G11B548

CPC分类号： G11B5/6005

摘要： In the present invention, an intermediate member having a hardness different than that of a pivot is provided. According to this structure, the pivot is in contact with the intermediate member, and rubs the intermediate member to control the sliding of the pivot. Since the intermediate member has a different hardness than the pivot, these elements can better bear the acceleration of a head suspension in high speed operation. Moreover, generation of dust can be controlled and reliability can also be improved.

摘要翻译： 在本发明中，提供硬度不同于枢轴的中间部件。 根据该结构，枢轴与中间构件接触，并且摩擦中间构件以控制枢轴的滑动。 由于中间构件具有与枢轴不同的硬度，因此这些元件可以更好地承受高速操作中的头悬架的加速度。 此外，可以控制灰尘的产生，并且还可以提高可靠性。

公开(公告)号：US06594116B1

公开(公告)日：2003-07-15

申请号：US09546970

申请日：2000-04-11

申请人： Takeshi Ohwe ,  Akio Gouo

发明人： Takeshi Ohwe ,  Akio Gouo

IPC分类号： G11B548

CPC分类号： G11B5/6005

摘要： In the present invention, an intermediate member having a hardness different than that of a pivot is provided. According to this structure, the pivot is in contact with the intermediate member, and rubs the intermediate member to control the sliding of the pivot. Since the intermediate member has a different hardness than the pivot, these elements can better bear the acceleration of a head suspension in high speed operation. Moreover, generation of dust can be controlled and reliability can also be improved.

摘要翻译： 在本发明中，提供硬度不同于枢轴的中间部件。 根据该结构，枢轴与中间构件接触，并且摩擦中间构件以控制枢轴的滑动。 由于中间构件具有与枢轴不同的硬度，因此这些元件可以更好地承受高速操作中的头悬架的加速度。 此外，可以控制灰尘的产生，并且还可以提高可靠性。

公开(公告)号：US06690546B2

公开(公告)日：2004-02-10

申请号：US09748918

申请日：2000-12-27

申请人： Akio Gouo

发明人： Akio Gouo

IPC分类号： G11B560

CPC分类号： G11B5/486 ,  G11B5/455 ,  G11B33/121 ,  G11B33/122 ,  G11B2005/001 ,  G11B2005/0013 ,  Y10T29/49025 ,  Y10T29/49028 ,  Y10T29/4903

摘要： This invention relates to a head suspension with a head IC and makes it possible to simplify checking of the head IC and reduce the cost of the head suspension. A first connection terminal 21 that electrically connects to the head 4; a second connection terminal 22 that connects to external circuits; third and fourth connection terminals 23, 24 that electrically connect to the head IC 20, which processes the electrical signal from the head; a first conductive path 28 that connects the first connection terminal 21 with the third connection terminal 23; a second conductive path 26 that connects the second connection terminal 22 with the fourth connection terminal 24; and a measurement terminal 25 that is located between the second connection terminal 22 and fourth connection terminal 24 are formed on the head suspension 9. With this invention, contact of the probes for checking the head IC when the head IC has been installed before installing the head becomes easier.

摘要翻译： 本发明涉及具有头IC的磁头悬架，并且能够简化磁头IC的检查并降低磁头悬架的成本。 电连接到头4的第一连接端子21; 连接到外部电路的第二连接端子22; 电连接到头IC20的第三和第四连接端子23,24，其处理来自头部的电信号; 将第一连接端子21与第三连接端子23连接的第一导电路径28; 将第二连接端子22与第四连接端子24连接的第二导电路径26; 并且位于第二连接端子22和第四连接端子24之间的测量端子25形成在磁头悬架9上。利用本发明，在安装头部IC之前，安装头部IC时用于检查头部IC的探针的接触 头变得更容易了

公开(公告)号：US07051423B2

公开(公告)日：2006-05-30

申请号：US10659624

申请日：2003-09-10

申请人： Akio Gouo

发明人： Akio Gouo

IPC分类号： G11B5/127 ,  H04R31/00

CPC分类号： G11B5/486 ,  G11B5/455 ,  G11B33/121 ,  G11B33/122 ,  G11B2005/001 ,  G11B2005/0013 ,  Y10T29/49025 ,  Y10T29/49028 ,  Y10T29/4903

摘要： This invention relates to a testing method for a head IC which makes it possible to simplify checking of the head. The head IC is installed on a head suspension, and probes are placed on terminals of the head suspension to check electric characteristics of the head IC. With this invention, contact of the probes for checking the head IC when the head IC has been installed, but before installing the head, becomes easier.

摘要翻译： 本发明涉及一种用于头IC的测试方法，其使得可以简化头的检查。 磁头IC安装在磁头悬架上，并将探头放置在磁头悬架的端子上，以检查磁头IC的电气特性。 利用本发明，当头部IC已经安装，但安装头部之前用于检查头IC的探针的接触变得更容易。