Buffer and Inverter Transistors Embedded in Interconnect Metal Layers

    公开(公告)号:US20250105134A1

    公开(公告)日:2025-03-27

    申请号:US18883389

    申请日:2024-09-12

    Applicant: Apple Inc.

    Abstract: Integrated circuit devices with buffer transistors or inverter transistors formed between topside BEOL (back end of line) metal layers are described. The buffer or inverter transistors include active regions and source/drains that can be formed in the spaces between topside metal layers. In certain instances, the transistors are formed in between metal layers furthest away from substrate. The transistors connect to routing either above or below the transistors to buffer and/or invert signals passing through the routing. For instance, the transistors may include active regions positioned between power and ground routings and connect to signal routing between the power and ground routings to boost and/or to invert the signal propagating along the signal routing. In various instances, the active regions of the transistors are formed by thin channel materials.

    Stacked FET Standard Cell Architecture
    3.
    发明公开

    公开(公告)号:US20240105709A1

    公开(公告)日:2024-03-28

    申请号:US18448573

    申请日:2023-08-11

    Applicant: Apple Inc.

    CPC classification number: H01L27/0207 H01L27/0922 H10B10/12

    Abstract: A cell layout that implements stacked transistors is disclosed. The cell layout utilizes both topside metal routing and backside metal routing. Various connection routes between components of the transistors (e.g., gates, sources, and drains) and either the topside metal routing or the backside metal routing can be made. The specific connection routes can be determined based on a desired device construction. Thus, the cell layout disclosed enables various devices to be constructed based on a basic cell structure.

    Device Structure for Inducing Layout Dependent Threshold Voltage Shift

    公开(公告)号:US20250107229A1

    公开(公告)日:2025-03-27

    申请号:US18888284

    申请日:2024-09-18

    Applicant: Apple Inc.

    Abstract: Device layouts for integrated circuit devices that include threshold voltage shift induced by placement of alternate work function metals adjacent active gates are disclosed. The device layouts include a single epitaxy for active regions in the device with common source/drain regions among the active region rows in the layouts. Metal gate sections above one or more rows of active regions may be replaced with metal of a different work function in inactive regions of the layout. The different work function metal in the inactive regions will induce threshold voltage shift in adjacent (neighboring) active transistors of the device layouts.

    Stacked SRAM Cell Architecture
    5.
    发明公开

    公开(公告)号:US20240107737A1

    公开(公告)日:2024-03-28

    申请号:US18448607

    申请日:2023-08-11

    Applicant: Apple Inc.

    CPC classification number: H10B10/125

    Abstract: A SRAM cell layout that implements stacked transistors is disclosed. The cell layout utilizes both topside metal routing and backside metal routing along with stacked transistors to provide multiple transistors for implementation of inverters and pass gates in a memory cell. Various connection routes between components of the transistors (e.g., gates, sources, and drains) are made to allow cross-coupling between inverters in the memory cell.

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