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公开(公告)号:US11996281B1
公开(公告)日:2024-05-28
申请号:US18206910
申请日:2023-06-07
发明人: Graham Wright , Ori Noked , Craig R. Chaney , Adam M. McLaughlin
摘要: An ion source that may be used to introduce a dopant material into the arc chamber is disclosed. A component containing the dopant material is disposed in the path of an etching gas, which also enters the arc chamber. In some embodiments, the dopant material is in liquid form, and the etching gas travels through the liquid. In other embodiments, the dopant material is a solid material. In some embodiments, the solid material is formed as a porous structure, such that the etching gas flows through the solid material. In other embodiments, one or more components of the ion source are manufactured using a material that includes the dopant material, such that the etching gas etches the component to release the dopant material.
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公开(公告)号:US11664192B2
公开(公告)日:2023-05-30
申请号:US17403223
申请日:2021-08-16
发明人: Shreyansh P. Patel , Graham Wright , Daniel Alvarado , Daniel R. Tieger , Brian S. Gori , William R. Bogiages, Jr. , Benjamin Oswald , Craig R. Chaney
IPC分类号: H01J37/302 , H01J37/08 , H01J37/317
CPC分类号: H01J37/302 , H01J37/08 , H01J37/3171
摘要: An ion source with a target holder for holding a solid dopant material is disclosed. The ion source comprises a thermocouple disposed proximate the target holder to monitor the temperature of the solid dopant material. In certain embodiments, a controller uses this temperature information to vary one or more parameters of the ion source, such as arc voltage, cathode bias voltage, extracted beam current, or the position of the target holder within the arc chamber. Various embodiments showing the connections between the controller and the thermocouple are shown. Further, embodiments showing various placement of the thermocouple on the target holder are also presented.
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公开(公告)号:US20230260745A1
公开(公告)日:2023-08-17
申请号:US18136738
申请日:2023-04-19
发明人: Shreyansh P. Patel , Graham Wright , Daniel Alvarado , Daniel R. Tieger , Brian S. Gori , William R. Bogiages, Jr. , Benjamin Oswald , Craig R. Chaney
IPC分类号: H01J37/302 , H01J37/08
CPC分类号: H01J37/302 , H01J37/08 , H01J37/3171
摘要: An ion source with a target holder for holding a solid dopant material is disclosed. The ion source comprises a thermocouple disposed proximate the target holder to monitor the temperature of the solid dopant material. In certain embodiments, a controller uses this temperature information to vary one or more parameters of the ion source, such as arc voltage, cathode bias voltage, extracted beam current, or the position of the target holder within the arc chamber. Various embodiments showing the connections between the controller and the thermocouple are shown. Further, embodiments showing various placement of the thermocouple on the target holder are also presented.
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公开(公告)号:US11239040B2
公开(公告)日:2022-02-01
申请号:US17078262
申请日:2020-10-23
IPC分类号: H01J27/02
摘要: An ion source having a thermally isolated repeller is disclosed. The repeller comprises a repeller disk and a plurality of spokes originating at the back surface of the repeller disk and terminating in a post. In certain embodiments, the post may be hollow through at least a portion of its length. The use of spokes rather than a central stem may reduce the thermal conduction from the repeller disk to the post. By incorporating a hollow post, the thermal conduction is further reduced. This configuration may increase the temperature of the repeller disk by more than 100° C. In certain embodiments, radiation shields are provided on the back surface of the repeller disk to reduce the amount of radiation emitted from the sides of the repeller disk. This may also help increase the temperature of the repeller. A similar design may be utilized for other electrodes in the ion source.
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公开(公告)号:US20230402247A1
公开(公告)日:2023-12-14
申请号:US17835107
申请日:2022-06-08
发明人: Craig R. Chaney , Graham Wright
CPC分类号: H01J37/08 , H01J27/08 , H01J37/3435
摘要: An ion source with a crucible is disclosed. In some embodiments, the crucible contains a solid dopant material, such as a metal. A porous wicking tip is disposed in the crucible in contact with the solid dopant material. The porous wicking tip may be a tube with one or more interior conduits. Alternatively, the porous tip may be two concentric cylinders with a plurality of rods disposed in the annular ring between the two cylinders. Alternatively, the porous tip may be one or more foil layers wound together. In each of these embodiments, the wicking tip can be used to control the flow rate of molten dopant material to the arc chamber.
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公开(公告)号:US20210375585A1
公开(公告)日:2021-12-02
申请号:US17403223
申请日:2021-08-16
发明人: Shreyansh P. Patel , Graham Wright , Daniel Alvarado , Daniel R. Tieger , Brian S. Gori , William R. Bogiages, JR. , Benjamin Oswald , Craig R. Chaney
IPC分类号: H01J37/302 , H01J37/08
摘要: An ion source with a target holder for holding a solid dopant material is disclosed. The ion source comprises a thermocouple disposed proximate the target holder to monitor the temperature of the solid dopant material. In certain embodiments, a controller uses this temperature information to vary one or more parameters of the ion source, such as arc voltage, cathode bias voltage, extracted beam current, or the position of the target holder within the arc chamber. Various embodiments showing the connections between the controller and the thermocouple are shown. Further, embodiments showing various placement of the thermocouple on the target holder are also presented.
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公开(公告)号:US11170973B2
公开(公告)日:2021-11-09
申请号:US16735125
申请日:2020-01-06
发明人: Shreyansh P. Patel , Graham Wright , Daniel Alvarado , Daniel R. Tieger , Brian S. Gori , William R. Bogiages, Jr. , Benjamin Oswald , Craig R. Chaney
IPC分类号: H01J37/302 , H01J37/08 , H01J37/317
摘要: An ion source with a target holder for holding a solid dopant material is disclosed. The ion source comprises a thermocouple disposed proximate the target holder to monitor the temperature of the solid dopant material. In certain embodiments, a controller uses this temperature information to vary one or more parameters of the ion source, such as arc voltage, cathode bias voltage, extracted beam current, or the position of the target holder within the arc chamber. Various embodiments showing the connections between the controller and the thermocouple are shown. Further, embodiments showing various placement of the thermocouple on the target holder are also presented.
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公开(公告)号:US20240112883A1
公开(公告)日:2024-04-04
申请号:US17957095
申请日:2022-09-30
IPC分类号: H01J37/317 , H01L21/265
CPC分类号: H01J37/3171 , H01L21/26513 , H01J2237/31701
摘要: An insulator that has a helical protrusion spiraling around the shaft is disclosed. A lip is disposed on the distal end of the helical protrusion, creating regions on the shaft that are shielded from material deposition by the lip. By proper sizing of the threads, the helical protrusion and the lip, the line-of-sight to the interior wall of the shaft can be greatly reduced. This results in longer times before failure. This insulator may be used in an ion implantation system to physically and electrically separate two components.
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公开(公告)号:US20210110995A1
公开(公告)日:2021-04-15
申请号:US16735125
申请日:2020-01-06
发明人: Shreyansh P. Patel , Graham Wright , Daniel Alvarado , Daniel R. Tieger , Brian S. Gori , William R. Bogiages, JR. , Benjamin Oswald , Craig R. Chaney
IPC分类号: H01J37/302 , H01J37/08
摘要: An ion source with a target holder for holding a solid dopant material is disclosed. The ion source comprises a thermocouple disposed proximate the target holder to monitor the temperature of the solid dopant material. In certain embodiments, a controller uses this temperature information to vary one or more parameters of the ion source, such as arc voltage, cathode bias voltage, extracted beam current, or the position of the target holder within the arc chamber. Various embodiments showing the connections between the controller and the thermocouple are shown. Further, embodiments showing various placement of the thermocouple on the target holder are also presented.
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公开(公告)号:US20240177960A1
公开(公告)日:2024-05-30
申请号:US18070640
申请日:2022-11-29
IPC分类号: H01J37/147 , H01J37/317
CPC分类号: H01J37/147 , H01J37/3171 , H01J2237/032 , H01J2237/038
摘要: An insulator that has a lattice is disclosed. The insulator may have a shaft with two ends. The lattice may be disposed on the outer surface of the shaft. In some embodiments, one or more sheaths are used to cover portions of the shaft. A lattice may also be disposed on the inner wall and/or outer walls of the sheaths. The lattice serves to increase the tracking length between the two ends of the shaft. This results in longer times before failure. This insulator may be used in an ion implantation system to physically and electrically separate two components.
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