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1.发明申请公开(公告)号：US20170164624A1
公开(公告)日：2017-06-15
申请号：US14964193
申请日：2015-12-09
CPC分类号： A21B1/40 , A21D13/42 , F23N1/002 , F23N5/022 , F23N2023/36 , F23N2023/44 , F23N2025/14 , F23N2035/12 , F23N2037/02 , F23N2041/08
摘要： A heat controlled oven system includes a plurality of oven levels, including an oven belt and gas burners; a gas flow network, including a gas supply line, a variable flow control valve, and on/off flow control valves; and a heat control unit, including a processor, a non-transitory memory, and input/output component, a heat modeler, a heat manager, a feedback controller, and a valve controller, such that the heat control unit is configured to calculate an estimated heat demand to adjust to a temperature set point, based on a heat model of the at least one oven level, and further calculates an optimized heat demand using a control loop feedback algorithm. Also disclosed is a method of heat calculation for an oven, including defining a heat model, calculating and optimizing the estimated heat demand, calculating and setting a variable valve position for the gas burners.
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公开(公告)号：US10893679B2
公开(公告)日：2021-01-19
申请号：US16017412
申请日：2018-06-25
申请人： Brian E. Bartlett
发明人： Brian E. Bartlett
摘要： A production system for moisture and texture detection and control in tortilla and tortilla chip production includes a production line, including a cooker/grinder, a sheeter/cutter, an oven, an equalizer, a fryer, and a cooler/packaging machine; and a production control unit, including a processor, non-transitory memory, an input/output component, a moisture controller, a temperature controller, a belt speed controller, a masa moisture sensor, a chip moisture sensor, laser sensors for measuring surface texture of baked and fried chips, a laser controller, a texture classifier, a feedback controller. Also disclosed is a method for production control, including controlling moisture content, measuring masa moisture, controlling oven, measuring baked surfaces, measuring fried surfaces, classifying baked surfaces, classifying fried surfaces, optimizing oven temperature, optimizing oven belt speed, storing and characterizing historical records.
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公开(公告)号：US4578145A
公开(公告)日：1986-03-25
申请号：US416210
申请日：1982-09-09
IPC分类号： C30B13/00 , C30B29/48 , H01L21/02 , H01L21/208 , H01L21/368 , C30B11/02
CPC分类号： C30B13/00 , C30B29/48 , Y10S117/90
摘要： A significant problem in making monocrystalline ternary semiconductor compound material, for example cadmium mercury telluride, is to produce useful quantities of the material which have electrical properties within a narrow band of values, and this depends on the material having a composition within a narrow range. Monocrystalline cadmium mercury telluride may be made by preparing a melt of the material, quenching this melt so as to produce a polycrystalline ingot 16, sealing the ingot 16 in an ampoule 13, and then forming a molten zone 20 at one end of the ingot 16 and passing this molten zone through the ingot 16 so as to form monocrystalline cadmium mercury telluride 21. The length of the molten zone 20 is from 25 to 40% of the length of the ingot 16.
摘要翻译： 制造单晶三元半导体复合材料（例如碲化镉镉）的重要问题是产生有用量的具有在窄带内的电性能的材料，这取决于具有在窄范围内的组成的材料。 单晶碲化镉可以通过制备材料的熔体，淬火该熔体以制造多晶锭16，将锭16密封在安瓿13中，然后在锭16的一端形成熔融区20 并使该熔融区通过锭16，以便形成单晶碲化汞镉21.熔池20的长度为锭16长度的25-40％。
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4.发明授权公开(公告)号：US10244766B2
公开(公告)日：2019-04-02
申请号：US14964193
申请日：2015-12-09
摘要： A heat controlled oven system includes a plurality of oven levels, including an oven belt and gas burners; a gas flow network, including a gas supply line, a variable flow control valve, and on/off flow control valves; and a heat control unit, including a processor, a non-transitory memory, and input/output component, a heat modeler, a heat manager, a feedback controller, and a valve controller, such that the heat control unit is configured to calculate an estimated heat demand to adjust to a temperature set point, based on a heat model of the at least one oven level, and further calculates an optimized heat demand using a control loop feedback algorithm. Also disclosed is a method of heat calculation for an oven, including defining a heat model, calculating and optimizing the estimated heat demand, calculating and setting a variable valve position for the gas burners.
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5.发明申请公开(公告)号：US20170251679A1
公开(公告)日：2017-09-07
申请号：US15058640
申请日：2016-03-02
申请人： Brian E. Bartlett
发明人： Brian E. Bartlett
摘要： A production system for moisture and texture detection and control in tortilla and tortilla chip production includes a production line, including a cooker/grinder, a sheeter/cutter, an oven, an equalizer, a fryer, and a cooler/packaging machine; and a production control unit, including a processor, non-transitory memory, an input/output component, a moisture controller, a temperature controller, a belt speed controller, a masa moisture sensor, a chip moisture sensor, laser sensors for measuring surface texture of baked and fried chips, a laser controller, a texture classifier, a feedback controller. Also disclosed is a method for production control, including controlling moisture content, measuring masa moisture, controlling oven, measuring baked surfaces, measuring fried surfaces, classifying baked surfaces, classifying fried surfaces, optimizing oven temperature, optimizing oven belt speed, storing and characterizing historical records.
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6.发明申请公开(公告)号：US20180303103A1
公开(公告)日：2018-10-25
申请号：US16017412
申请日：2018-06-25
申请人： Brian E. Bartlett
发明人： Brian E. Bartlett
摘要： A production system for moisture and texture detection and control in tortilla and tortilla chip production includes a production line, including a cooker/grinder, a sheeter/cutter, an oven, an equalizer, a fryer, and a cooler/packaging machine; and a production control unit, including a processor, non-transitory memory, an input/output component, a moisture controller, a temperature controller, a belt speed controller, a masa moisture sensor, a chip moisture sensor, laser sensors for measuring surface texture of baked and fried chips, a laser controller, a texture classifier, a feedback controller. Also disclosed is a method for production control, including controlling moisture content, measuring masa moisture, controlling oven, measuring baked surfaces, measuring fried surfaces, classifying baked surfaces, classifying fried surfaces, optimizing oven temperature, optimizing oven belt speed, storing and characterizing historical records.
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公开(公告)号：US10028513B2
公开(公告)日：2018-07-24
申请号：US15058640
申请日：2016-03-02
申请人： Brian E. Bartlett
发明人： Brian E. Bartlett
摘要： A production system for moisture and texture detection and control in tortilla and tortilla chip production includes a production line, including a cooker/grinder, a sheeter/cutter, an oven, an equalizer, a fryer, and a cooler/packaging machine; and a production control unit, including a processor, non-transitory memory, an input/output component, a moisture controller, a temperature controller, a belt speed controller, a masa moisture sensor, a chip moisture sensor, laser sensors for measuring surface texture of baked and fried chips, a laser controller, a texture classifier, a feedback controller. Also disclosed is a method for production control, including controlling moisture content, measuring masa moisture, controlling oven, measuring baked surfaces, measuring fried surfaces, classifying baked surfaces, classifying fried surfaces, optimizing oven temperature, optimizing oven belt speed, storing and characterizing historical records.
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