摘要:
Systems and methods relating to generating a key that is difficult to clone are described. The methods include receiving a programmable logic device (PLD) with a first key and applying a one-way hash function to a second key or the first key and the second key to create a third key. The application of the one-way hash function is performed using one or more components hardwired into the PLD. The methods further include storing the third key in the PLD only after using the one or more components to apply the one-way hash function.
摘要:
A programmable logic array integrated circuit device has a plurality of regions of programmable logic disposed on the device in a two-dimensional array of intersecting rows and columns of regions. The output signals of several regions share a group of drivers for applying region output signals to interconnection conductors that convey signals between regions. This conserves driver resources and increases signal routing flexibility. Various approaches can be used for configuring the interconnection conductors to also conserve interconnection conductor resources. Logic regions may be used to directly drive specific input/output cells, thereby simplifying signal routing to the I/O cells and also possibly simplifying the structure of the I/O cells (e.g., by allowing certain I/O cell functions to be performed in the associated logic region). Region output signal routing flexibility may also be enhanced to facilitate simultaneous performance of combinatorial logic and a separate "lonely register" function in modules of the regions.
摘要:
A programmable logic array integrated circuit device has a plurality of regions of programmable logic disposed on the device in a two-dimensional array of intersecting rows and columns of regions. The output signals of several regions share a group of drivers for applying region output signals to interconnection conductors that convey signals between regions. This conserves driver resources and increases signal routing flexibility. Various approaches can be used for configuring the interconnection conductors to also conserve interconnection conductor resources. Logic regions may be used to directly drive specific input/output cells, thereby simplifying signal routing to the I/O cells and also possibly simplifying the structure of the I/O cells (e.g., by allowing certain I/O cell functions to be performed in the associated logic region). Region output signal routing flexibility may also be enhanced to facilitate simultaneous performance of combinatorial logic and a separate “lonely register” function in modules of the regions.
摘要:
A programmable logic array integrated circuit device includes a plurality of regions of programmable logic disposed on the device in a two-dimensional array of intersecting rows and columns of such regions. Each row has a plurality of adjacent horizontal conductors, and each column has a plurality of adjacent vertical conductors. The regions in a row are interspersed with groups of local conductors which interconnect the adjacent regions and the associated horizontal and vertical conductors. The local conductors can also be used for intra-region communication, as well as communication between adjacent regions. Secondary signals such as clocks and clears for the regions can be drawn either from dedicated secondary signal conductors or normal region inputs. Memory cell requirements for region input signal selection are reduced by various techniques for sharing these memory cells.
摘要:
Circuits, methods, and apparatus that detect whether a soft error that occurs in stored configuration data is a false positive that can be ignored such that reloading configuration data or other remedial measures are not unnecessarily performed. One example provides an integrated circuit including an error detection circuit and a sensitivity processor. The error detection circuit detects the presence of errors. The sensitivity processor determines whether a detected error can be ignored, or whether remedial action, such as providing an error flag, reconfiguring the device, or correcting the error, should be commenced. The sensitivity processor may make this determination based on whether the error occurred in a memory cell that configures unused circuitry. The sensitivity processor may make use of an error log to track known errors that may be ignored, so that this determination does not need to be done each time the configuration data is checked.
摘要:
Error detection and error location determination circuitry is provided for detecting and locating soft errors in random-access-memory arrays on programmable integrated circuits. The random-access-memory arrays contain rows and columns of random-access-memory cells. Some of the cells are loaded with configuration data and produce static output signals that are used to program associated regions of programmable logic. Cyclic redundancy check error correction check bits are computed for each column of an array. The cyclic redundancy check error correction check bits are stored in corresponding columns of cells in the array. During normal operation of an integrated circuit in a system, the cells are subject to soft errors caused by background radiation strikes. The error detection and error location determination circuitry uses parallel processing to continuously monitor the data to identify the row and column location of each error.
摘要:
Error detection and error location determination circuitry is provided for detecting and locating soft errors in random-access-memory arrays on programmable integrated circuits. The random-access-memory arrays contain rows and columns of random-access-memory cells. Some of the cells are loaded with configuration data and produce static output signals that are used to program associated regions of programmable logic. Cyclic redundancy check error correction check bits are computed for each column of an array. The cyclic redundancy check error correction check bits are stored in corresponding columns of cells in the array. During normal operation of an integrated circuit in a system, the cells are subject to soft errors caused by background radiation strikes. The error detection and error location determination circuitry uses parallel processing to continuously monitor the data to identify the row and column location of each error.
摘要:
Error detection and error location determination circuitry is provided for detecting and locating soft errors in random-access-memory arrays on programmable integrated circuits. The random-access-memory arrays contain rows and columns of random-access-memory cells. Some of the cells are loaded with configuration data and produce static output signals that are used to program associated regions of programmable logic. Cyclic redundancy check error correction check bits are computed for each column of an array. The cyclic redundancy check error correction check bits are stored in corresponding columns of cells in the array. During normal operation of an integrated circuit in a system, the cells are subject to soft errors caused by background radiation strikes. The error detection and error location determination circuitry uses parallel processing to continuously monitor the data to identify the row and column location of each error.
摘要:
Error detection and error location determination circuitry is provided for detecting and locating soft errors in random-access-memory arrays on programmable integrated circuits. The random-access-memory arrays contain rows and columns of random-access-memory cells. Some of the cells are loaded with configuration data and produce static output signals that are used to program associated regions of programmable logic. Cyclic redundancy check error correction check bits are computed for each column of each array. The error correction check bits are stored in corresponding columns of cells in the array. During normal operation of an integrated circuit in a system, the cells are subject to soft errors caused by background radiation strikes. The error detection and error location determination circuitry contains linear feedback shift register circuitry that processes columns of array data. The circuitry continuously processes the data to identify the row and column location of each error.
摘要:
Error detection circuitry is provided on a programmable logic resource. Programmable logic resource configuration data is loaded into a cyclic redundancy check (CRC) module where a checksum calculation may be performed. In one embodiment, the checksum may be compared to an expected value, which is a precomputed checksum on data prior to being programmed into or while data is being programmed into a programmable logic resource. In another embodiment, the expected value may be included in the checksum calculation. An output indicating whether an error is detected may be generated depending on the relationship between the checksum and the expected value, or on the value of the checksum. This output may be sent to an output pin that is accessible by user logic.