Systems and methods for generating a key difficult to clone
    1.
    发明授权
    Systems and methods for generating a key difficult to clone 有权
    用于生成难以克隆的密钥的系统和方法

    公开(公告)号:US09438418B1

    公开(公告)日:2016-09-06

    申请号:US13102673

    申请日:2011-05-06

    IPC分类号: H04L9/08 H04L29/06 H04L9/14

    摘要: Systems and methods relating to generating a key that is difficult to clone are described. The methods include receiving a programmable logic device (PLD) with a first key and applying a one-way hash function to a second key or the first key and the second key to create a third key. The application of the one-way hash function is performed using one or more components hardwired into the PLD. The methods further include storing the third key in the PLD only after using the one or more components to apply the one-way hash function.

    摘要翻译: 描述与生成难以克隆的密钥有关的系统和方法。 所述方法包括用第一密钥接收可编程逻辑器件(PLD),并将单向散列函数应用于第二密钥或第一密钥和第二密钥以创建第三密钥。 单向散列函数的应用使用硬连线到PLD中的一个或多个组件来执行。 所述方法还包括仅在使用所述一个或多个组件来应用所述单向散列函数之后将所述第三密钥存储在所述PLD中。

    SOFT ERROR LOCATION AND SENSITIVITY DETECTION FOR PROGRAMMABLE DEVICES
    5.
    发明申请
    SOFT ERROR LOCATION AND SENSITIVITY DETECTION FOR PROGRAMMABLE DEVICES 有权
    可编程器件的软错误位置和灵敏度检测

    公开(公告)号:US20070283193A1

    公开(公告)日:2007-12-06

    申请号:US11737089

    申请日:2007-04-18

    IPC分类号: G06F11/10

    摘要: Circuits, methods, and apparatus that detect whether a soft error that occurs in stored configuration data is a false positive that can be ignored such that reloading configuration data or other remedial measures are not unnecessarily performed. One example provides an integrated circuit including an error detection circuit and a sensitivity processor. The error detection circuit detects the presence of errors. The sensitivity processor determines whether a detected error can be ignored, or whether remedial action, such as providing an error flag, reconfiguring the device, or correcting the error, should be commenced. The sensitivity processor may make this determination based on whether the error occurred in a memory cell that configures unused circuitry. The sensitivity processor may make use of an error log to track known errors that may be ignored, so that this determination does not need to be done each time the configuration data is checked.

    摘要翻译: 检测在存储的配置数据中发生的软错误是否可以被忽略的假阳性的电路,方法和装置,使得不必要地重新加载配置数据或其他补救措施。 一个例子提供了包括错误检测电路和灵敏度处理器的集成电路。 误差检测电路检测出错误。 灵敏度处理器确定是否可以忽略检测到的错误,或者是否开始补救措施,例如提供错误标志,重新配置设备或纠正错误。 灵敏度处理器可以基于是否在配置未使用的电路的存储器单元中发生错误来进行该确定。 灵敏度处理器可以使用错误日志来跟踪可能被忽略的已知错误,使得每次检查配置数据时不需要完成该确定。

    Parallel processing error detection and location circuitry for configuration random-access memory
    6.
    发明授权
    Parallel processing error detection and location circuitry for configuration random-access memory 失效
    用于配置随机存取存储器的并行处理错误检测和位置电路

    公开(公告)号:US08661321B1

    公开(公告)日:2014-02-25

    申请号:US13618097

    申请日:2012-09-14

    申请人: Ninh D. Ngo

    发明人: Ninh D. Ngo

    IPC分类号: G11C29/00

    摘要: Error detection and error location determination circuitry is provided for detecting and locating soft errors in random-access-memory arrays on programmable integrated circuits. The random-access-memory arrays contain rows and columns of random-access-memory cells. Some of the cells are loaded with configuration data and produce static output signals that are used to program associated regions of programmable logic. Cyclic redundancy check error correction check bits are computed for each column of an array. The cyclic redundancy check error correction check bits are stored in corresponding columns of cells in the array. During normal operation of an integrated circuit in a system, the cells are subject to soft errors caused by background radiation strikes. The error detection and error location determination circuitry uses parallel processing to continuously monitor the data to identify the row and column location of each error.

    摘要翻译: 提供错误检测和错误位置确定电路,用于检测和定位可编程集成电路上的随机存取存储器阵列中的软错误。 随机存取存储器阵列包含随机访问存储器单元的行和列。 一些单元载入配置数据,并产生用于编程可编程逻辑的相关区域的静态输出信号。 对阵列的每列计算循环冗余校验错误校正位。 循环冗余校验错误校正位存储在阵列中相应的单元格列中。 在系统中的集成电路的正常操作期间,单元受到由背景辐射引起的软错误。 错误检测和错误位置确定电路使用并行处理来连续监视数据以识别每个错误的行和列位置。

    Parallel processing error detection and location circuitry for configuration random-access memory
    7.
    发明授权
    Parallel processing error detection and location circuitry for configuration random-access memory 失效
    用于配置随机存取存储器的并行处理错误检测和位置电路

    公开(公告)号:US08281215B1

    公开(公告)日:2012-10-02

    申请号:US12917441

    申请日:2010-11-01

    申请人: Ninh D. Ngo

    发明人: Ninh D. Ngo

    IPC分类号: H03M13/00

    摘要: Error detection and error location determination circuitry is provided for detecting and locating soft errors in random-access-memory arrays on programmable integrated circuits. The random-access-memory arrays contain rows and columns of random-access-memory cells. Some of the cells are loaded with configuration data and produce static output signals that are used to program associated regions of programmable logic. Cyclic redundancy check error correction check bits are computed for each column of an array. The cyclic redundancy check error correction check bits are stored in corresponding columns of cells in the array. During normal operation of an integrated circuit in a system, the cells are subject to soft errors caused by background radiation strikes. The error detection and error location determination circuitry uses parallel processing to continuously monitor the data to identify the row and column location of each error.

    摘要翻译: 提供错误检测和错误位置确定电路,用于检测和定位可编程集成电路上的随机存取存储器阵列中的软错误。 随机存取存储器阵列包含随机访问存储器单元的行和列。 一些单元载入配置数据,并产生用于编程可编程逻辑的相关区域的静态输出信号。 对阵列的每列计算循环冗余校验错误校正位。 循环冗余校验错误校正位存储在阵列中相应的单元格列中。 在系统中的集成电路的正常操作期间,单元受到由背景辐射引起的软错误。 错误检测和错误位置确定电路使用并行处理来连续监视数据以识别每个错误的行和列位置。

    Parallel processing error detection and location circuitry for configuration random-access memory
    8.
    发明授权
    Parallel processing error detection and location circuitry for configuration random-access memory 有权
    用于配置随机存取存储器的并行处理错误检测和位置电路

    公开(公告)号:US07844886B1

    公开(公告)日:2010-11-30

    申请号:US11436967

    申请日:2006-05-16

    申请人: Ninh D. Ngo

    发明人: Ninh D. Ngo

    IPC分类号: H03M13/00

    摘要: Error detection and error location determination circuitry is provided for detecting and locating soft errors in random-access-memory arrays on programmable integrated circuits. The random-access-memory arrays contain rows and columns of random-access-memory cells. Some of the cells are loaded with configuration data and produce static output signals that are used to program associated regions of programmable logic. Cyclic redundancy check error correction check bits are computed for each column of an array. The cyclic redundancy check error correction check bits are stored in corresponding columns of cells in the array. During normal operation of an integrated circuit in a system, the cells are subject to soft errors caused by background radiation strikes. The error detection and error location determination circuitry uses parallel processing to continuously monitor the data to identify the row and column location of each error.

    摘要翻译: 提供错误检测和错误位置确定电路,用于检测和定位可编程集成电路上的随机存取存储器阵列中的软错误。 随机存取存储器阵列包含随机访问存储器单元的行和列。 一些单元载入配置数据,并产生用于编程可编程逻辑的相关区域的静态输出信号。 对阵列的每列计算循环冗余校验错误校正位。 循环冗余校验错误校正位存储在阵列中相应的单元格列中。 在系统中的集成电路的正常操作期间,单元受到由背景辐射引起的软错误。 错误检测和错误位置确定电路使用并行处理来连续监视数据以识别每个错误的行和列位置。

    Error detection and location circuitry for configuration random-access memory
    9.
    发明授权
    Error detection and location circuitry for configuration random-access memory 有权
    用于配置随机存取存储器的错误检测和位置电路

    公开(公告)号:US08032817B2

    公开(公告)日:2011-10-04

    申请号:US12608835

    申请日:2009-10-29

    申请人: Ninh D. Ngo

    发明人: Ninh D. Ngo

    IPC分类号: H03M13/00

    摘要: Error detection and error location determination circuitry is provided for detecting and locating soft errors in random-access-memory arrays on programmable integrated circuits. The random-access-memory arrays contain rows and columns of random-access-memory cells. Some of the cells are loaded with configuration data and produce static output signals that are used to program associated regions of programmable logic. Cyclic redundancy check error correction check bits are computed for each column of each array. The error correction check bits are stored in corresponding columns of cells in the array. During normal operation of an integrated circuit in a system, the cells are subject to soft errors caused by background radiation strikes. The error detection and error location determination circuitry contains linear feedback shift register circuitry that processes columns of array data. The circuitry continuously processes the data to identify the row and column location of each error.

    摘要翻译: 提供错误检测和错误位置确定电路,用于检测和定位可编程集成电路上的随机存取存储器阵列中的软错误。 随机存取存储器阵列包含随机访问存储器单元的行和列。 一些单元载入配置数据,并产生用于编程可编程逻辑的相关区域的静态输出信号。 对每个阵列的每列计算循环冗余校验错误校正位。 纠错校验位存储在阵列中相应的单元格列中。 在系统中的集成电路的正常操作期间,单元受到由背景辐射引起的软错误。 误差检测和误差位置确定电路包含处理阵列数据列的线性反馈移位寄存器电路。 电路连续处理数据以识别每个错误的行和列位置。

    Error detection on programmable logic resources
    10.
    发明授权
    Error detection on programmable logic resources 有权
    可编程逻辑资源的错误检测

    公开(公告)号:US07907460B2

    公开(公告)日:2011-03-15

    申请号:US12503637

    申请日:2009-07-15

    IPC分类号: G11C29/00

    CPC分类号: H03K19/17764 G06F11/1004

    摘要: Error detection circuitry is provided on a programmable logic resource. Programmable logic resource configuration data is loaded into a cyclic redundancy check (CRC) module where a checksum calculation may be performed. In one embodiment, the checksum may be compared to an expected value, which is a precomputed checksum on data prior to being programmed into or while data is being programmed into a programmable logic resource. In another embodiment, the expected value may be included in the checksum calculation. An output indicating whether an error is detected may be generated depending on the relationship between the checksum and the expected value, or on the value of the checksum. This output may be sent to an output pin that is accessible by user logic.

    摘要翻译: 在可编程逻辑资源上提供错误检测电路。 可编程逻辑资源配置数据被加载到可以执行校验和计算的循环冗余校验(CRC)模块中。 在一个实施例中,校验和可以与预期值进行比较,期望值是在被编程到数据被编程到可编程逻辑资源之前或数据被编程到数据之前的预计算校验和。 在另一个实施例中,期望值可以包括在校验和计算中。 可以根据校验和和期望值之间的关系或校验和的值来生成指示是否检测到错误的输出。 该输出可以被发送到用户逻辑可访问的输出引脚。