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11 条记录 (耗时 0.042 秒)

    Chip to wiring interface with single metal alloy layer applied to surface of copper interconnect
    1.
    发明授权
    Chip to wiring interface with single metal alloy layer applied to surface of copper interconnect 有权
    芯片到布线接口，单个金属合金层应用于铜互连表面

    公开(公告)号：US06573606B2

    公开(公告)日：2003-06-03

    申请号：US09881444

    申请日：2001-06-14

    申请人： Carlos Juan Sambucetti ,  Xiaomeng Chen ,  Soon-Cheon Seo ,  Birenda Nath Agarwala ,  Chao-Kun Hu ,  Naftali Eliahu Lustig ,  Stephen Edward Greco

    发明人： Carlos Juan Sambucetti ,  Xiaomeng Chen ,  Soon-Cheon Seo ,  Birenda Nath Agarwala ,  Chao-Kun Hu ,  Naftali Eliahu Lustig ,  Stephen Edward Greco

    IPC分类号： H01L2144

    CPC分类号： H01L23/53238 ,  H01L21/76849 ,  H01L2924/0002 ,  H01L2924/00

    摘要： In the invention an electrically isolated copper interconnect structural interface is provided involving a single, about 50-300 A thick, alloy capping layer, that controls diffusion and electromigration of the interconnection components and reduces the overall effective dielectric constant of the interconnect; the capping layer being surrounded by a material referred to in the art as hard mask material that can provide a resist for subsequent reactive ion etching operations, and there is also provided the interdependent process steps involving electroless deposition in the fabrication of the structural interface. The single layer alloy metal barrier in the invention is an alloy of the general type A—X—Y, where A is a metal taken from the group of cobalt (Co) and nickel (Ni), X is a member taken from the group of tungsten (W), tin (Sn), and silicon (Si), and Y is a member taken from the group of phosphorous (P) and boron (B); having a thickness in the range of 50 to 300 Angstroms.

    摘要翻译： 在本发明中，提供了电隔离的铜互连结构界面，其涉及单个约50-300A厚的合金覆盖层，其控制互连部件的扩散和电迁移并且降低互连的整体有效介电常数; 封盖层被本领域中称为材料所包围的材料包围，其可以为随后的反应离子蚀刻操作提供抗蚀剂，并且还提供了在结构界面的制造中涉及无电沉积的相互依赖的工艺步骤。 本发明中的单层合金金属阻挡层是一般型AXY的合金，其中A是从钴（Co）和镍（Ni）中取出的金属，X是取自钨（W ），锡（Sn）和硅（Si），Y是从磷（P）和硼（B）取代的成员; 厚度在50至300埃的范围内。

    Fuse and integrated conductor
    4.
    发明授权
    Fuse and integrated conductor 有权
    保险丝和集成导体

    公开(公告)号：US08836124B2

    公开(公告)日：2014-09-16

    申请号：US13414742

    申请日：2012-03-08

    申请人： Griselda Bonilla ,  Kaushik Chanda ,  Samuel Sung Shik Choi ,  Ronald G. Filippi ,  Stephan Grunow ,  Naftali Eliahu Lustig ,  Andrew H. Simon

    发明人： Griselda Bonilla ,  Kaushik Chanda ,  Samuel Sung Shik Choi ,  Ronald G. Filippi ,  Stephan Grunow ,  Naftali Eliahu Lustig ,  Andrew H. Simon

    IPC分类号： H01L23/48 ,  H01L23/52 ,  H01L29/40

    CPC分类号： H01L23/5256 ,  H01L23/53233 ,  H01L23/53238 ,  H01L2924/0002 ,  H01L2924/00

    摘要： A fuse structure includes within an aperture within a dielectric layer located over a substrate that exposes a conductor contact layer within the substrate a seed layer interposed between the conductor contact layer and another conductor layer. The seed layer includes a doped copper material that includes a dopant immobilized predominantly within the seed layer. The fuse structure may be severed while not severing a conductor interconnect structure also located over the substrate that exposes a second conductor contact layer within a second aperture. In contrast with the fuse structure that includes the doped seed layer having the immobilized dopant, the interconnect structure includes a doped seed layer having a mobile dopant.

    摘要翻译： 熔丝结构包括在位于衬底之上的电介质层内的孔内，孔暴露在衬底内的导体接触层，介于导体接触层和另一导体层之间的晶种层。 种子层包括掺杂的铜材料，其包括主要在种子层内固定的掺杂剂。 可以切断熔丝结构，同时不切断也位于衬底上的导体互连结构，所述导体互连结构在第二孔内暴露第二导体接触层。 与包括具有固定化掺杂剂的掺杂种子层的熔丝结构相反，互连结构包括具有可移动掺杂剂的掺杂种子层。

    Fuse and Integrated Conductor
    8.
    发明申请
    Fuse and Integrated Conductor 有权
    保险丝和集成导体

    公开(公告)号：US20130234284A1

    公开(公告)日：2013-09-12

    申请号：US13414742

    申请日：2012-03-08

    申请人： Griselda Bonilla ,  Kaushik Chanda ,  Samuel Sung Shik Choi ,  Ronald G. Filippi ,  Stephan Grunow ,  Naftali Eliahu Lustig ,  Andrew H. Simon

    发明人： Griselda Bonilla ,  Kaushik Chanda ,  Samuel Sung Shik Choi ,  Ronald G. Filippi ,  Stephan Grunow ,  Naftali Eliahu Lustig ,  Andrew H. Simon

    IPC分类号： H01L23/525 ,  H01L21/02

    CPC分类号： H01L23/5256 ,  H01L23/53233 ,  H01L23/53238 ,  H01L2924/0002 ,  H01L2924/00

    摘要： A fuse structure includes within an aperture within a dielectric layer located over a substrate that exposes a conductor contact layer within the substrate a seed layer interposed between the conductor contact layer and another conductor layer. The seed layer includes a doped copper material that includes a dopant immobilized predominantly within the seed layer. The fuse structure may be severed while not severing a conductor interconnect structure also located over the substrate that exposes a second conductor contact layer within a second aperture. In contrast with the fuse structure that includes the doped seed layer having the immobilized dopant, the interconnect structure includes a doped seed layer having a mobile dopant.

    摘要翻译： 熔丝结构包括在位于衬底之上的电介质层内的孔内，孔暴露在衬底内的导体接触层，介于导体接触层和另一导体层之间的晶种层。 种子层包括掺杂的铜材料，其包括主要在种子层内固定的掺杂剂。 可以切断熔丝结构，同时不切断也位于衬底上的导体互连结构，所述导体互连结构在第二孔内暴露第二导体接触层。 与包括具有固定化掺杂剂的掺杂种子层的熔丝结构相反，互连结构包括具有可移动掺杂剂的掺杂种子层。

    Method and apparatus for in-line oxide thickness determination in chemical-mechanical polishing
    9.
    发明授权
    Method and apparatus for in-line oxide thickness determination in chemical-mechanical polishing 失效
    化学机械抛光中在线氧化物厚度测定的方法和装置

    公开(公告)号：US6020264A

    公开(公告)日：2000-02-01

    申请号：US792082

    申请日：1997-01-31

    申请人： Naftali Eliahu Lustig ,  William L. Guthrie ,  Thomas E. Sandwick

    发明人： Naftali Eliahu Lustig ,  William L. Guthrie ,  Thomas E. Sandwick

    IPC分类号： G01B7/06 ,  B24B37/013 ,  B24B49/04 ,  G01N27/22 ,  H01L21/304 ,  H01L21/3105 ,  H01L21/66 ,  C23F1/00

    CPC分类号： G01B7/085 ,  B24B37/013 ,  B24B49/04 ,  H01L21/31053 ,  H01L22/20 ,  H01L22/12

    摘要： In-line thickness measurement of a dielectric film layer on a surface of a workpiece subsequent to a polishing on a chemical-mechanical polishing machine in a polishing slurry is disclosed. The workpiece includes a given level of back-end-of-line (BEOL) structure including junctions. The measurement apparatus includes a platen and an electrode embedded within the platen. A positioning mechanism positions the workpiece above the electrode with the dielectric layer facing in a direction of the electrode. A slurry dam is used for maintaining a prescribed level of a conductive polishing slurry above the electrode, the prescribed level to ensure a desired slurry coverage of the workpiece. A capacitance sensor senses a system capacitance C in accordance with an RC equivalent circuit model, wherein the RC equivalent circuit includes a resistance R representative of the slurry and workpiece resistances and the system capacitance C representative of the dielectric material and junction capacitances. Lastly, a capacitance-to-thickness converter converts the sensed capacitance to a dielectric thickness in accordance with a prescribed system capacitance/optical thickness calibration, wherein the prescribed calibration corresponds to the given level of BEOL structure of the workpiece.

    摘要翻译： 公开了在抛光浆料中的化学机械抛光机上的抛光后的工件表面上的电介质膜层的在线厚度测量。 工件包括给定水平的包括路口的后端行（BEOL）结构。 测量装置包括压板和嵌入在压板内的电极。 定位机构将工件定位在电极上方，电介质层面向电极的方向。 浆料坝用于在电极上方保持规定水平的导电抛光浆料，其规定水平以确保工件的期望的浆料覆盖。 电容传感器根据RC等效电路模型感测系统电容C，其中RC等效电路包括代表浆料和工件电阻的电阻R和代表电介质材料和结电容的系统电容C。 最后，电容 - 厚度转换器根据规定的系统电容/光学厚度校准将感测到的电容转换成电介质厚度，其中规定的校准对应于工件的给定水平的BEOL结构。

    Semiconductor structure
    10.
    发明授权
    Semiconductor structure 失效
    半导体结构

    公开(公告)号：US08030707B2

    公开(公告)日：2011-10-04

    申请号：US12390741

    申请日：2009-02-23

    申请人： Kangguo Cheng ,  Naftali Eliahu Lustig ,  Daewon Yang

    发明人： Kangguo Cheng ,  Naftali Eliahu Lustig ,  Daewon Yang

    IPC分类号： H01L27/01 ,  H01L27/12 ,  H01L31/0392

    CPC分类号： H01L21/84 ,  H01L27/10829 ,  H01L27/1087 ,  H01L27/1203

    摘要： A method of forming a silicon-on-insulator (SOI) semiconductor structure in a substrate having a bulk semiconductor layer, a buried oxide (BOX) layer and an SOI layer. During the formation of a trench in the structure, the BOX layer is undercut. The method includes forming a dielectric material on the upper wall of the trench adjacent to the undercutting of the BOX layer and then etching the dielectric material to form a spacer. The spacer fixes the BOX layer undercut and protects it during subsequent steps of forming a bottle-shaped portion of the trench, forming a buried plate in the deep trench; and then forming a trench capacitor. There is also a semiconductor structure, preferably an SOI eDRAM structure, having a spacer which fixes the undercutting in the BOX layer.

    摘要翻译： 一种在具有体半导体层，掩埋氧化物（BOX）层和SOI层的衬底中形成绝缘体上硅（SOI）半导体结构的方法。 在结构中形成沟槽时，BOX层被切削。 该方法包括在邻近BOX层的底切的沟槽的上壁上形成介电材料，然后蚀刻电介质材料以形成间隔物。 间隔件固定BOX层底切并在形成沟槽的瓶形部分的后续步骤期间保护它，在深沟槽中形成掩埋板; 然后形成沟槽电容器。 还存在半导体结构，优选为SOI eDRAM结构，其具有将底切固定在BOX层中的间隔物。