摘要:
An (SST) driver circuit having additional circuitry for minimizing data-dependent jitter in the SST driver and increasing frequency amplitude in the SST driver. The additional circuity comprises a plurality of switches configured to be turned on or pulsed on momentarily during operation to discharge a node in the SST output stage for the purpose of removing the stored charge before the next transition cycle of the output stage.
摘要:
A design structure embodied in a machine readable storage medium for designing, manufacturing, and/or testing a design for protection for the transmission of higher amplitude outputs required of differential amplifiers formed by thin oxide transistors with limited maximum voltage tolerance used where compliance with communication protocol standards requires handling voltages which may, in transition, exceed desirable levels is provided by limiting the voltage across any two device terminals under power down conditions.
摘要:
A high speed serial data communication system includes provisions for the correction of equalization errors, particularly those errors introduced by equalizer non-idealities. The equalization is achieved at the data transmitter, and is based on dynamic current subtraction at the output of a differential pair. When bit time>0, the error current is removed or subtracted from the total driver current, thereby maintaining a constant total current from bit time 0 to bit time>0. The same result can also be achieved by subtracting current when bit time>0 using field effect transistors of the opposite gender. The error current can be determined empirically from simulation or through feedback using a replica of the driver. The circuits for achieving equalization error correction and the resulting electrical network analysis are shown and described.
摘要:
A high speed serial link structure and method are provided, comprising a data driver and a replica driver structure, the replica driver structure comprising a replica driver, a calibration engine and a peak level detector. The calibration engine compares a peak level detector output to a reference value and responsively performs a data driver adjustment, wherein the data driver adjustment comprises at least one of a driver biasing adjustment, a driver intermediate stage bandwidth adjustment and a driver equalization setting adjustment. In some embodiments, the calibration engine incorporates a comparator and a digital state machine; in other embodiments, it incorporates an analog operational amplifier.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.
摘要:
Protection for the transmission of higher amplitude outputs required of differential amplifiers formed by thin oxide transistors with limited maximum voltage tolerance used where compliance with communication protocol standards requires handling voltages which may, in transition, exceed desirable levels is provided by limiting the voltage across any two device terminals under power down conditions.
摘要:
A method for manufacturing a calibration device for an active circuit on a chip, comprises: providing an active circuit that is capable of exhibiting a desired electrical characteristic; and providing a calibration mechanism on-chip with the active circuit. The calibration mechanism generates a control output and comprises a device under test (DUT) configured as a replica of at least one segment of the active circuit, and which generates a test output that causes finite adjustments to the control output, based on a comparison of the electrical characteristics exhibited by the DUT with a known electrical characteristic. The method further comprises: attaching to each control input terminal of the active circuit a corresponding control output from the calibration mechanism. The control output of the calibration mechanism dynamically adjusts control input applied to devices of the active circuit to force the active circuit to exhibit the desired electrical characteristic.
摘要:
A method for matching receiver and transmitter common-mode voltages for a high-speed direct current (DC) serial connection between the receiver and the transmitter includes measuring, at the receiver, a common-mode voltage of the transmitter. The common-mode voltage of the transmitter is an average of a voltage signal transmitted by the transmitter and received by the receiver. The method further includes comparing the common-mode voltage of the transmitter with a common-mode voltage of the receiver. The method further includes maintaining the common-mode voltage of the receiver at a first level at which the common-mode voltage of the receiver substantially matches the common-mode voltage of the transmitter.
摘要:
A high speed serial link method is provided, using a data driver and a replica driver structure, the replica driver structure comprising a replica driver, a calibration engine and a peak level detector. The calibration engine compares a peak level detector output to a reference value and responsively performs a data driver adjustment, wherein the data driver adjustment comprises at least one of a driver biasing adjustment, a driver intermediate stage bandwidth adjustment and a driver equalization setting adjustment. In some embodiments, the calibration engine incorporates a comparator and a digital state machine; in other embodiments, it incorporates an analog operational amplifier.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.