摘要:
A method for manufacturing a calibration device for an active circuit on a chip, comprises: providing an active circuit that is capable of exhibiting a desired electrical characteristic; and providing a calibration mechanism on-chip with the active circuit. The calibration mechanism generates a control output and comprises a device under test (DUT) configured as a replica of at least one segment of the active circuit, and which generates a test output that causes finite adjustments to the control output, based on a comparison of the electrical characteristics exhibited by the DUT with a known electrical characteristic. The method further comprises: attaching to each control input terminal of the active circuit a corresponding control output from the calibration mechanism. The control output of the calibration mechanism dynamically adjusts control input applied to devices of the active circuit to force the active circuit to exhibit the desired electrical characteristic.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.
摘要:
Disclosed are a receiver circuit, method and design architecture of a decision feedback equalizer (DFE) Clock-And-Data Recovery (CDR) architecture that utilizes/produces one sample-per-bit in the receiver and reduces bit-error-rate (BER). An integrating receiver is combined with a decision feedback equalizer along with the appropriate (CDR) loop phase detector to maintain a single sample per bit requirement. The incoming voltage is converted to a current and connected to a current summing node. Weighted currents determined by the values of previously detected bits and their respective feedback coefficients are also connected to this node. Additionally, the summed currents is integrated and converted to a voltage. A sampler is utilized to make a bit decision based on the resulting voltage. After sampling, the integrator is reset before analysis of the next bit. The necessary amplification is achieved by maximizing the sensitivity of the latch, using integration in front of the data latch.
摘要:
A method and system for testing a high-speed circuit is disclosed. The method and system include obtaining a high-speed statistical signature of the high-speed circuit using a conventional tester. The method and system further include comparing the high-speed statistical signature of the high-speed circuit to an expected signature. Consequently, it can be determined whether the high-speed circuit functions within the desired parameters.
摘要:
Aspects of providing automatic adaptation to frequency offsets in high speed serial links are described. First signals for phase adjusts in a receiver link are adjusted by detecting trends in the first signals to generate second signals, the second signals improving a rate of compensation for the frequency offsets by the phase adjusts. An up/down counter is included for counting signals for phase adjustments by a clock-data-recovery loop of a serial receiver. An adder is coupled to the up/down counter and outputs accumulated data indicative of a trend in the phase adjustments. Combinatorial logic coupled to the adder adapts the signals based on the accumulated data.
摘要:
A system and method is disclosed for evaluating a data group of oversampled bits to detect edge transitions and for improving use of information available from a sampled data while maintaining acceptable noise rejection. An edge detection system for receiving a serial data stream includes a sampler for collecting a sample pattern from the serial data stream, the sample pattern including a succession of a plurality of data samples from the data stream with the plurality of data samples including multiple samples during a bit time associated with the data stream; a memory, coupled to the sampler, for storing one or more successive sample patterns; and a correlator, coupled to the memory, for producing a sample condition signal using a set of predefined patterns by comparing the stored sampled patterns to the predefined patterns.
摘要:
A receiver for clock and data recovery includes n sampling latches (SL1 . . . SLn) for determining n sample values (SV1 . . . SVn) of a reference signal (Ref2) at n sampling phases (φ1a . . . (φna) having sampling latch inputs and sampling latch outputs. The receiver further includes a phase position analyzer (5) connected to the sampling latch outputs for generating an adjusting signal (AS) for adjusting the sampling phase (φ1a . . . φna), if the sample value (SV1 . . . SVn) deviates from a set point and a phase interpolator (9) for generating sampling phases (φ1u . . . φnu). A sampling phase adjusting unit (6) connected with its inputs to the phase position analyzer (5) and the phase interpolator (9) and with its outputs to the sampling latches (SL1 . . . SLn) is provided for generating adjusted sampling phases (φ1a . . . φna) depending on the sampling phases (φ1u . . . φnu) and said adjusting signal (AS).