公开(公告)号：US20090281744A1

公开(公告)日：2009-11-12

申请号：US12430648

申请日：2009-04-27

申请人： Cheng-Yung Teng ,  Li-Jieu Hsu

发明人： Cheng-Yung Teng ,  Li-Jieu Hsu

IPC分类号： G01R19/155 ,  G01R29/02

CPC分类号： G01R31/31924

摘要： A testing device for testing a device under test is disclosed. The testing device includes a microprocessor, a measuring module and a computing module. The microprocessor provides a testing signal to the device under test and determines a testing result for the device under test according to at least one signal measurement result. The device under test further generates at least one measuring signal after receiving the testing signal. The measuring module is coupled to the device under test, and measures the at least one measuring signal and generates at least one voltage measurement result and at least one period measurement result. The computing module obtains the at least one voltage measurement result and the at least one period measurement result according to a predetermined manner and generates the at least one signal measurement result.

摘要翻译： 公开了一种用于测试被测设备的测试装置。 测试装置包括微处理器，测量模块和计算模块。 微处理器向被测设备提供测试信号，并根据至少一个信号测量结果确定被测设备的测试结果。 被测设备在接收到测试信号后还产生至少一个测量信号。 测量模块耦合到被测器件，并测量至少一个测量信号，并产生至少一个电压测量结果和至少一个周期测量结果。 计算模块根据预定方式获得至少一个电压测量结果和至少一个周期测量结果，并产生至少一个信号测量结果。

公开(公告)号：US07908108B2

公开(公告)日：2011-03-15

申请号：US12130588

申请日：2008-05-30

申请人： Cheng-Yung Teng ,  Li-Jieu Hsu

发明人： Cheng-Yung Teng ,  Li-Jieu Hsu

IPC分类号： G01R31/28

CPC分类号： G01R31/31706 ,  G01R31/31715

摘要： A circuit testing apparatus for testing a device under test is disclosed. The device under test comprises a first output end and second output end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines a test result for the device under test according to the first output signal and the second output signal.

摘要翻译： 公开了一种用于测试被测设备的电路测试装置。 被测器件分别包括用于产生第一输出信号和第二输出信号的第一输出端和第二输出端。 电路测试装置根据第一输出信号和第二输出信号确定被测器件的测试结果。

公开(公告)号：US20070024314A1

公开(公告)日：2007-02-01

申请号：US11495515

申请日：2006-07-31

申请人： Cheng-Yung Teng ,  Yi-Chang Hsu ,  Li-Jieu Hsu

发明人： Cheng-Yung Teng ,  Yi-Chang Hsu ,  Li-Jieu Hsu

IPC分类号： G01R31/26

CPC分类号： G01R31/2889

摘要： The present invention relates to a test system, and in particular relates to a test system capable of testing a plurality of chips simultaneously. The test system comprises a single-chip tester and a handler. The single-chip tester further comprises a pattern memory and a micro-processor. The pattern memory comprises a plurality of pattern units for respectively performing a function pattern test on the plurality of chips and generating a test result mapping to the plurality of chips. The micro-processor performs various tests and generating an interface control signal according to the test result. The handler initiates the micro-processor for performing various tests and receives the interface control signal to finish testing the plurality of chips. The pluralities of chips are set to the handler.

摘要翻译： 本发明涉及一种测试系统，特别涉及能同时测试多个芯片的测试系统。 测试系统包括单片测试仪和处理器。 单芯片测试器还包括模式存储器和微处理器。 图案存储器包括多个模式单元，用于分别对多个芯片执行功能模式测试，并产生映射到多个芯片的测试结果。 微处理器根据测试结果执行各种测试并产生接口控制信号。 处理器启动用于执行各种测试的微处理器，并接收接口控制信号以完成多个芯片的测试。 多个芯片被设置为处理程序。

公开(公告)号：US08175824B2

公开(公告)日：2012-05-08

申请号：US12467740

申请日：2009-05-18

申请人： Cheng-Yung Teng ,  Li-Jieu Hsu

发明人： Cheng-Yung Teng ,  Li-Jieu Hsu

IPC分类号： G01R15/00 ,  G01R27/00 ,  G01R31/00 ,  G01R31/12 ,  G01R31/312

CPC分类号： G01R27/2605 ,  G01R31/2637 ,  G01R31/3167 ,  G01R31/31924

摘要： A circuit testing apparatus for testing capacitance of a capacitor of a device under test is provided. The circuit testing apparatus includes a measuring module, a first converting module, a processing module and a second converting module. The measuring module provides a testing signal, and determines the capacitance of the capacitor according to a signal measuring result of the testing signal. The first converting module is coupled to the measuring module for converting the testing signal to generate a testing input signal. The processing module is coupled to the first converting module and the device under test for transmitting the testing input signal to the capacitor, and amplifies an output signal generated by the capacitor to generate an amplified signal. The second converting module is coupled to the processing module and the measuring module for converting the amplified signal to generate the signal measuring result.

摘要翻译： 提供了一种用于测试被测器件电容器电容的电路测试装置。 电路测试装置包括测量模块，第一转换模块，处理模块和第二转换模块。 测量模块提供测试信号，并根据测试信号的信号测量结果确定电容器的电容。 第一转换模块耦合到测量模块，用于转换测试信号以产生测试输入信号。 处理模块耦合到第一转换模块和被测设备，用于将测试输入信号传输到电容器，并放大由电容器产生的输出信号以产生放大信号。 第二转换模块耦合到处理模块和测量模块，用于转换放大的信号以产生信号测量结果。

公开(公告)号：US07830163B2

公开(公告)日：2010-11-09

申请号：US12247040

申请日：2008-10-07

申请人： Cheng-Yung Teng ,  Li-Jieu Hsu ,  Wei-Fen Chiang ,  Yung-Yu Wu ,  Hung-Wei Chen ,  Huei-Huang Chen

发明人： Cheng-Yung Teng ,  Li-Jieu Hsu ,  Wei-Fen Chiang ,  Yung-Yu Wu ,  Hung-Wei Chen ,  Huei-Huang Chen

IPC分类号： G01R31/02

CPC分类号： G01R31/2889

摘要： The invention discloses a testing circuit board for placing a device under test and further testing the device under test according to a plurality of testing signals generated by a tester. The testing circuit board includes a circuit board and a plurality of sets of sockets. The circuit board includes a plurality of connecting holes. The plurality of sets of sockets are located on a plurality of connecting holes and electrically connects to the device under test via a plurality of connecting interfaces for transferring the plurality of testing signals to test the device under test.

摘要翻译： 本发明公开了一种用于放置被测器件的测试电路板，并根据由测试仪产生的多个测试信号进一步测试被测器件。 测试电路板包括电路板和多套插座。 电路板包括多个连接孔。 多组插座位于多个连接孔上，并通过多个连接接口与被测设备电连接，用于传送多个测试信号以测试待测设备。

公开(公告)号：US20090254296A1

公开(公告)日：2009-10-08

申请号：US12130588

申请日：2008-05-30

申请人： Cheng-Yung Teng ,  Li-Jieu Hsu

发明人： Cheng-Yung Teng ,  Li-Jieu Hsu

IPC分类号： G01R31/28

CPC分类号： G01R31/31706 ,  G01R31/31715

摘要： A circuit testing apparatus for testing a device under test is disclosed. The device under test comprises a first output end and second output end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines a test result for the device under test according to the first output signal and the second output signal.

摘要翻译： 公开了一种用于测试被测设备的电路测试装置。 被测器件分别包括用于产生第一输出信号和第二输出信号的第一输出端和第二输出端。 电路测试装置根据第一输出信号和第二输出信号确定被测器件的测试结果。

公开(公告)号：US07706999B2

公开(公告)日：2010-04-27

申请号：US11806499

申请日：2007-05-31

申请人： Cheng-Yung Teng ,  Li-Jieu Hsu ,  Jie-Wei Huang ,  Huei-Huang Chen

发明人： Cheng-Yung Teng ,  Li-Jieu Hsu ,  Jie-Wei Huang ,  Huei-Huang Chen

IPC分类号： G01R31/26 ,  G06F17/40 ,  G06F19/00

CPC分类号： G01R31/3167

摘要： The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.

摘要翻译： 本发明公开了一种用于测试被测设备的电路测试装置。 电路测试装置包括精密测量单元，信号变换模块和微处理器。 精密测量单元耦合到被测设备，以提供测试信号并接收根据测试信号产生的测量信号。 信号变换模块耦合到精度测量单元，用于接收测量信号，并根据预定方式将测量信号变换成信号测量结果。 微处理器耦合到精密测量单元和信号变换模块，用于检查信号测量结果，以确定被测器件的测试结果。

公开(公告)号：US20090326844A1

公开(公告)日：2009-12-31

申请号：US12467740

申请日：2009-05-18

申请人： Cheng-Yung Teng ,  Li-Jieu Hsu

发明人： Cheng-Yung Teng ,  Li-Jieu Hsu

IPC分类号： G01R27/26 ,  G06F19/00

CPC分类号： G01R27/2605 ,  G01R31/2637 ,  G01R31/3167 ,  G01R31/31924

摘要： A circuit testing apparatus for testing capacitance of a capacitor of a device under test is provided. The circuit testing apparatus includes a measuring module, a first converting module, a processing module and a second converting module. The measuring module provides a testing signal, and determines the capacitance of the capacitor according to a signal measuring result of the testing signal. The first converting module is coupled to the measuring module for converting the testing signal to generate a testing input signal. The processing module is coupled to the first converting module and the device under test for transmitting the testing input signal to the capacitor, and amplifies an output signal generated by the capacitor to generate an amplified signal. The second converting module is coupled to the processing module and the measuring module for converting the amplified signal to generate the signal measuring result.

摘要翻译： 提供了一种用于测试被测器件电容器电容的电路测试装置。 电路测试装置包括测量模块，第一转换模块，处理模块和第二转换模块。 测量模块提供测试信号，并根据测试信号的信号测量结果确定电容器的电容。 第一转换模块耦合到测量模块，用于转换测试信号以产生测试输入信号。 处理模块耦合到第一转换模块和被测设备，用于将测试输入信号传送到电容器，并且放大由电容器产生的输出信号以产生放大信号。 第二转换模块耦合到处理模块和测量模块，用于转换放大的信号以产生信号测量结果。

公开(公告)号：US20090140877A1

公开(公告)日：2009-06-04

申请号：US12100208

申请日：2008-04-09

申请人： Cheng-Yung TENG ,  Li-Jieu Hsu

发明人： Cheng-Yung TENG ,  Li-Jieu Hsu

IPC分类号： G05B19/02

CPC分类号： G08C17/00

摘要： A remote controller including buttons, an input module including resistors and switches, and a control module including a determining module, a storage module, and a modulation module. Each resistor is coupled to a power source and provides a current path corresponding to one button. The switches are coupled to the resistors. The corresponding switch provides the corresponding current path when one button is pushed. The input module accords with the corresponding current path to generate an input signal. The control module generates an output signal according to the input signal. When the input module transmits the input signal, the determining module obtains the pushed button according to the input signal and generates a determining signal according to the obtained result. The storage module generates a control signal according to the determining signal. The modulation module modulates the control signal to generate the output signal.

摘要翻译： 包括按钮的遥控器，包括电阻和开关的输入模块，以及包括确定模块，存储模块和调制模块的控制模块。 每个电阻器耦合到电源并且提供对应于一个按钮的电流路径。 开关耦合到电阻器。 当按下一个按钮时，相应的开关提供相应的当前路径。 输入模块符合相应的电流路径以产生输入信号。 控制模块根据输入信号产生输出信号。 当输入模块发送输入信号时，确定模块根据输入信号获得推压按钮，并根据获得的结果生成确定信号。 存储模块根据确定信号产生控制信号。 调制模块调制控制信号以产生输出信号。

公开(公告)号：US20080243409A1

公开(公告)日：2008-10-02

申请号：US11806499

申请日：2007-05-31

申请人： Cheng-Yung Teng ,  Li-Jieu Hsu ,  Jie-Wei Huang ,  Huei-Huang Chen

发明人： Cheng-Yung Teng ,  Li-Jieu Hsu ,  Jie-Wei Huang ,  Huei-Huang Chen

IPC分类号： G01R13/00 ,  G01R13/02

CPC分类号： G01R31/3167

摘要： The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.

摘要翻译： 本发明公开了一种用于测试被测设备的电路测试装置。 电路测试装置包括精密测量单元，信号变换模块和微处理器。 精密测量单元耦合到被测设备，以提供测试信号并接收根据测试信号产生的测量信号。 信号变换模块耦合到精度测量单元，用于接收测量信号，并根据预定方式将测量信号变换成信号测量结果。 微处理器耦合到精密测量单元和信号变换模块，用于检查信号测量结果，以确定被测器件的测试结果。