Abstract:
A D/A converter range calibration system in an A/D converter structure including a set of comparators with associated calibrating D/A converters includes means (RCC) for determining the offset error range for the entire set of comparators and means (R-DAC) for adjusting the dynamic range of each calibrating D/A converter to this offset error range.
Abstract:
An A/D converter includes a calibration apparatus handling occurrences of thermometer code bubbles in an A/D sub-converter in at least one A/D converter stage. The calibration apparatus includes means (30) for detecting two A/D sub-converter comparators causing a bubble, means (32, 34, 36) for increasing the threshold of the bubble causing comparator having the lowest threshold by a first predetermined voltage and means (32, 34, 36) for decreasing the threshold of the bubble causing comparator having the highest threshold by a second predetermined voltage.
Abstract:
The invention relates to a method of producing transgenic plant material by transforming a plant with a vector comprising an essential gene having mutations at two sites at least. The method is exemplified with EPSPS as the essential gene. The method makes it possible to use an antisense molecule directed to the native form of said gene for selection of transformed plants. The application relates further to a plant obtainable by the method, a binary vector system containing the mutated essential gene, said mutations being silent mutations. Furthermore, the application discloses the use of an antisense molecule directed to an essential gene as a herbicide in particular using an aqueous solution comprising a saccharide such as sucrose, fructose and glucose.
Abstract:
A latched comparator circuit comprises an input amplification unit, a buffer unit, and a control unit. The input amplification unit comprises a first and a second input terminal for receiving a first and a second input voltage, respectively, of the latched comparator circuit. The input amplification unit further comprises a first and a second output terminal for outputting a first and a second output voltage, respectively, of the input amplification unit. In addition, the input amplification unit comprises a reset terminal arranged to receive a reset signal for resetting the input amplification unit. The buffer unit is operatively connected to the first and the second output terminal of the input amplification unit. Furthermore, the buffer unit comprises a first and a second output terminal for outputting a first and a second output voltage, respectively, of the buffer unit. The control unit is operatively connected to the input amplification unit and the buffer unit. The control unit is adapted to generate the reset signal based on the first and the second output voltage of the buffer unit and a clock signal and to generate an output signal of the latched comparator circuit based on the first and the second output voltage of the buffer unit. A method of operating the latched comparator circuit is also disclosed.
Abstract:
A latched comparator circuit. The latched comparator circuit comprises a first and a second output terminal for outputting a first and a second output voltage, respectively, of the latched comparator circuit. Furthermore, the latched comparator circuit comprises a cross-coupled pair of transistors operatively connected between the first and the second output terminal for providing a positive feedback in the latched comparator circuit. In addition, the latched comparator circuit comprises a reset terminal for receiving a reset signal and reset circuitry arranged to balance the first and the second output voltage during a first phase of the reset signal and allow a voltage difference to develop between the first and the second output voltage during a second phase of the reset signal. Moreover, the latched comparator circuit comprises a load unit operatively connected to the cross-coupled pair of transistors and a bias circuit arranged to receive the reset signal and to bias the load unit such that a conductivity of the load unit is higher during the second phase of the reset signal than during the first phase of the reset signal, whereby said positive feedback is stronger during the second phase of the reset signal than during the first phase of the reset signal.
Abstract:
An A/D converter includes at least one comparator array (COMP1–COMP7) for flash A/D conversion of an analog signal. Means (CCU, SW1–SW7) provide, for each comparator in the array, a common reference signal to both comparator input terminals. Means (CCU, DAC1–DAC7) force each compara-tor in the array into the same logical output state. Finally, means (CCU, DAC1–DAC7) adjust the comparator trip-point for each comparator by a ramp signal until the logical output state is inverted.
Abstract:
An A/D converter includes at least one comparator array (COMP1-COMP7) for flash A/D conversion of an analog signal. Means (CCU, SW1-SW7) pro-vide, for each comparator in the array, a common reference signal to both comparator input terminals. Means (CCU, DAC1-DAC7) force each compara-tor in the array into the same logical output state. Finally, means (CCU, DAC1-DAC7) adjust the comparator trip-point for each comparator by a ramp signal until the logical output state is inverted.
Abstract:
A comparator for an analog-to-digital converter comprises an input stage (in+, in−, M1, M2) for receiving an input signal; a bipolar latch stage (Q1, Q2; Q1a-b, Q2a-b) coupled to the input stage for performing a latch decision based on the input signal; means for amplifying the latch output (Va, Vb) to a level suitable for CMOS circuitry; and an output (out+, out−). The means for amplifying includes at least one tapping transistor (Q3, Q4) coupled to the latch stage for, depending on the latch decision, tapping a collector current (Ic2; Ic1) from the latch stage, while leaving the latch decision thereof unaffected, such that a current gain (&bgr;) of the latch stage can be used to amplify a latch bias current (Ia, Ib) of the latch stage to thereby provide for the amplification.
Abstract:
A method of determining at least one calibration value for a redundant analog-to-digital-converter, ADC, is disclosed. For at least an i:th bit bL, the corresponding bit weight wi is less than the sum of the bit weights Wj, j=0, 1, . . . , i−1 corresponding to the bits bj, j=0, 1, . . . , i−1 with lesser significance than the bit bi. The method comprises sampling a first electrical value representative of the bit weight wi; performing a first analog-to-digital, A/D, conversion using the bits bj, j=0, 1, . . . , i−1 with lesser significance than the bit bi to obtain a first digital word of said bits bj, j=0, 1, . . . , i−1 with lesser significance than the bit bi representing said first electrical value; and estimating the value of the bit weight Wi expressed in terms of the bit weights Wj. j=0, 1, . . . , i−1 corresponding to the bits bj, j=0, 1, . . . , i−1 with lesser significance than the bit bi based at least on said first digital word, wherein the resulting estimated value of the bit weight wi is one of the at least one calibration value. A control unit, a redundant ADC and a computer program are also disclosed.
Abstract:
A comparator circuit (5) comprising a fully differential main amplifier unit (10, 10b). The main amplifier unit (10, 10b) comprises a control port and is adapted to control a bias current of a first branch of the main amplifier unit (10, 10b) and/or a bias current of a second branch of the main amplifier unit (10, 10b) in response to one or more control voltages supplied to the control port of the main amplifier unit (10, 10b). The comparator circuit (5) comprises circuitry (60) for balancing the voltages at the positive and negative input terminals (12a, 12b) of the main amplifier unit (10, 10b) during a first clock phase of the comparator circuit (5). Furthermore, the comparator circuit (10, 10a) comprises a switched-capacitor accumulator unit with a differential input. The switched-capacitor accumulator unit is operatively connected to the positive and negative output terminals (14a, 14b) of the main amplifier unit (10, 10b) for sampling voltages at the positive and negative output terminals (14a, 14b) of the main amplifier unit (10, 10b) during the first clock phase, and operatively connected to the control port of the main amplifier unit (10, 10b) for supplying said one or more control voltages.