Reference voltage generation circuitary for semiconductor apparatus and method for checking a reference voltage
    2.
    发明授权
    Reference voltage generation circuitary for semiconductor apparatus and method for checking a reference voltage 有权
    用于半导体装置的参考电压产生电路和用于检查参考电压的方法

    公开(公告)号:US08680841B2

    公开(公告)日:2014-03-25

    申请号:US12983090

    申请日:2010-12-31

    IPC分类号: G05F1/607 G05F1/614

    CPC分类号: G11C5/147 G11C29/021

    摘要: A semiconductor apparatus includes a comparison voltage generation unit configured to generate a plurality of different comparison voltages, a reference voltage generation unit configured to receive a generation code from an external system, select one of the plurality of the different comparison voltages according to the generation code, and generate a reference voltage, and a reference voltage determination unit configured to receive the generation code and an expected reference voltage from the external system, check whether a level of the expected reference voltage is in a target range, and output a check result to the external system.

    摘要翻译: 一种半导体装置,包括:被配置为生成多个不同的比较电压的比较电压生成单元,被配置为从外部系统接收生成代码的基准电压生成单元,根据生成代码选择所述多个不同的比较电压中的一个 并产生参考电压,参考电压确定单元被配置为从外部系统接收生成代码和预期参考电压,检查预期参考电压的电平是否在目标范围内,并将检查结果输出到 外部系统。

    Method for conducting reference voltage training
    3.
    发明授权
    Method for conducting reference voltage training 有权
    进行参考电压训练的方法

    公开(公告)号:US09053772B2

    公开(公告)日:2015-06-09

    申请号:US13315483

    申请日:2011-12-09

    申请人: Jeong Hun Lee

    发明人: Jeong Hun Lee

    IPC分类号: G11C5/14 G11C7/10

    摘要: A method for conducting reference voltage training includes setting levels of a reference voltage in response to code signals and receiving and storing data for the respective levels of the reference voltage, and simultaneously outputting the stored data.

    摘要翻译: 用于进行参考电压训练的方法包括响应于代码信号设置参考电压的电平,并且接收和存储参考电压的各个电平的数据,并同时输出所存储的数据。

    SEMICONDUCTOR MEMORY APPARATUS AND METHOD OF TESTING THE SAME
    4.
    发明申请
    SEMICONDUCTOR MEMORY APPARATUS AND METHOD OF TESTING THE SAME 失效
    半导体存储装置及其测试方法

    公开(公告)号:US20100332925A1

    公开(公告)日:2010-12-30

    申请号:US12649743

    申请日:2009-12-30

    IPC分类号: G11C29/08 G06F11/26

    CPC分类号: G11C29/46

    摘要: A semiconductor memory apparatus according to the embodiment includes a test mode controller, a first data alignment unit, a decoder, a test executing unit and a second data alignment unit. The test mode controller is configured to generate test enable signals in response to a test mode setting signal and a read command. The first data alignment unit is configured to parallely align first input data that are input in series, generate first alignment data, and transmit it to the first data driver. The decoder is configured to decode the first alignment data in response to the test enable signal and generate the decoding signal. The test executing unit is configured to execute the preset test mode in response to the decoding signal. The second data alignment unit is configured to parallely align second input data, which are input in series, in response to the test enable signal, generate second alignment data, and transmit it to a second data driver.

    摘要翻译: 根据实施例的半导体存储装置包括测试模式控制器,第一数据对准单元,解码器,测试执行单元和第二数据对准单元。 测试模式控制器被配置为响应于测试模式设置信号和读取命令而产生测试使能信号。 第一数据对准单元被配置为并行地对准串联输入的第一输入数据,产生第一对准数据,并将其发送到第一数据驱动器。 解码器被配置为响应于测试使能信号对第一对准数据进行解码并产生解码信号。 测试执行单元被配置为响应于解码信号执行预设测试模式。 第二数据对准单元被配置为响应于测试使能信号并行输入串联的第二输入数据,产生第二对准数据并将其发送到第二数据驱动器。

    Integrated circuit using method for setting level of reference voltage
    5.
    发明授权
    Integrated circuit using method for setting level of reference voltage 有权
    集成电路使用方法设定参考电压电平

    公开(公告)号:US09330750B2

    公开(公告)日:2016-05-03

    申请号:US13033685

    申请日:2011-02-24

    申请人: Jeong Hun Lee

    发明人: Jeong Hun Lee

    摘要: An integrated circuit includes a reference voltage level setting circuit and a reference voltage generation circuit. The reference voltage level setting circuit is configured to set a level of an input reference voltage to a preset level in a power-up period or a self-refresh mode. The reference voltage generation circuit is configured to select one of a plurality of reference voltages and output the selected reference voltage as the input reference voltage when the power-up period is ended and an operation mode is not in the self-refresh mode.

    摘要翻译: 集成电路包括参考电压电平设置电路和参考电压产生电路。 参考电压电平设置电路被配置为在上电周期或自刷新模式下将输入参考电压的电平设置为预设电平。 参考电压产生电路被配置为当上电周期结束并且操作模式不处于自刷新模式时,选择多个参考电压中的一个并输出所选择的参考电压作为输入参考电压。

    BOARD BLOCK FOR VEHICLES
    6.
    发明申请
    BOARD BLOCK FOR VEHICLES 有权
    车辆板块

    公开(公告)号:US20130194763A1

    公开(公告)日:2013-08-01

    申请号:US13879235

    申请日:2011-06-07

    IPC分类号: H05K5/00

    摘要: Disclosure relates to a board block for vehicles. A housing forms an outer appearance of the board block of the present invention. The housing includes a housing body and a housing cover. A interior space is formed in the housing body, and a first connection unit is formed at one side of an upper end of the housing body. The housing cover covers the upper end of the housing body and the first connection unit.

    摘要翻译: 公开涉及一种用于车辆的板块。 壳体形成本发明的板块的外观。 壳体包括壳体和壳体盖。 内部空间形成在壳体中,并且第一连接单元形成在壳体的上端的一侧。 壳体盖覆盖壳体的上端和第一连接单元。

    Semiconductor system including semiconductor device
    8.
    发明授权
    Semiconductor system including semiconductor device 有权
    半导体系统包括半导体器件

    公开(公告)号:US08593886B2

    公开(公告)日:2013-11-26

    申请号:US13339050

    申请日:2011-12-28

    申请人: Jeong Hun Lee

    发明人: Jeong Hun Lee

    IPC分类号: G11C7/00 G11C8/00

    摘要: A semiconductor system includes a controller configured to apply code signals for setting levels of a reference voltage and data, and to receive output data. The semiconductor system also includes a semiconductor device configured to receive the data for the respective levels of the reference voltage set according to the code signals, to compare the reference voltages with the data to generate new data, to store the new data as internal data, and to process the stored internal data to output as the output data.

    摘要翻译: 半导体系统包括被配置为应用用于设置参考电压和数据的电平的代码信号并且接收输出数据的控制器。 半导体系统还包括:半导体器件,被配置为根据代码信号接收针对参考电压组的各个电平的数据,以将参考电压与数据进行比较以生成新数据,以将新数据存储为内部数据, 并处理存储的内部数据作为输出数据输出。

    VOLTAGE STABILIZATION CIRCUIT AND SEMICONDUCTOR MEMORY APPARATUS USING THE SAME
    10.
    发明申请
    VOLTAGE STABILIZATION CIRCUIT AND SEMICONDUCTOR MEMORY APPARATUS USING THE SAME 失效
    使用电压稳定电路和半导体存储器件

    公开(公告)号:US20110235443A1

    公开(公告)日:2011-09-29

    申请号:US13155901

    申请日:2011-06-08

    IPC分类号: G11C5/14 G11C7/00

    摘要: A voltage stabilization circuit of a semiconductor memory apparatus includes an operation speed detecting unit configured to detect an operation speed of the semiconductor memory apparatus to generate a detection signal, and a voltage line controlling unit configured to interconnect a first voltage line and a second voltage line in response to the detection signal.

    摘要翻译: 半导体存储装置的电压稳定电路包括操作速度检测单元,其被配置为检测半导体存储装置的操作速度以产生检测信号;以及电压线控制单元,被配置为将第一电压线和第二电压线 响应于检测信号。