摘要:
An atomic force microscope for examining a sample is described. The atomic force microscope includes a probe assembly that includes a first tip and a second tip each directed towards a surface of a sample. The AFM further includes a source for applying a potential across the first tip and the second tip; at least one mechanism operable to cause relative motion between the surface and the probe; and at least one sensor operable to sense current flowing between the first tip and the second tip.
摘要:
Systems and methods for reducing the effect of noise while reading data in series from memory, are provided. One system embodiment comprises a memory cell that stores a first data; a sensing device that receives the first data multiple times and provides a first set of outputs; and a voting system that evaluates the first set of outputs to determine whether one of the outputs of the first set is valid data from the memory cell. One method embodiment comprises reading data in series that is stored in a memory cell to provide outputs; and evaluating the outputs to determine whether one of the outputs is valid data from the memory cell.
摘要:
A sensing circuit for determining the logic state of each memory cell in a resistive memory array, wherein each memory cell in the resistive memory array has current control isolation and the logic state of each memory cell can be determined relative to a reference cell having a pre-selected logic state. The sensing circuit comprises a memory cell sensing circuit to determine a bias voltage of a memory cell, a reference cell sensing circuit to determine a bias voltage of a reference cell, an isolation circuit to apply an isolation voltage to turn off a current control element associated with each unselected memory cell, an adjusting circuit to make the bias voltage on the memory cell approximately equal to the bias voltage on the reference cell, and a state determining circuit for determining the logic state of the memory cell.
摘要:
A method for reading the magnetization orientation of a memory cell includes applying a magnetic field to the memory cell, observing any change in resistance of the memory cell as the magnetic field is applied, and determining the magnetization orientation based upon the observed change in resistance of the memory cell.
摘要:
An adjustable current mode differential sense amplifier is disposed to be in communication with a selected memory cell and a reference cell having a predetermined value. The amplifier is able to sense current and voltage changes associated with the selected memory cell and compare them to current and voltage changes associated with the reference cell. The operating point of the sensing amplifier may be changed by modifying threshold voltages related to the back gate bias applied to selected transistors in the amplifier. This adjusting capability enables currents or voltages of the sense amplifier to be set when a first bias voltage is applied to a selected memory cell in order to maximize the sensitivity of the amplifier. When a second bias voltage is applied to the memory and reference cells in order to determine the memory cell value, the amplifier is able to sense slight changes in the currents or voltages associated with the selected memory cell and the reference cell and compare them to determine the state of the memory cell. This increased sensitivity enables the amplifier to have a substantially increased dynamic range without introducing components that might adversely affect the memory circuitry parameters. The memory cell array being sensed has equi-potential isolation for all unselected memory cells, thereby minimizing sneak currents through the unselected memory cells.