Curing oven using Wellsbach conversion
    1.
    发明授权
    Curing oven using Wellsbach conversion 失效
    使用Wellsbach转换固化烤箱

    公开(公告)号:US5033203A

    公开(公告)日:1991-07-23

    申请号:US483619

    申请日:1990-02-23

    CPC分类号: F26B3/28 F26B3/305

    摘要: An improved curing oven using Wellsbach conversion is disclosed. The present invention 10 provides an improved curing oven which cures materials with electromagnetic radiation in the ultraviolet region. The invention consists of a surface 12 lined with a layer of material 14 effective to radiate ultraviolet radiation in response to the application of infrared radiation. In a specific illustrative implementation, the invention 10 includes a second surface 18 overlying the first surface 12 providing a passageway therebetween. The oven temperature is set and maintained by a conventional temperature controller 20. The temperature controller 20 measures the oven temperature and controls a valve 22 which adjusts the gas pressure from a gas supply 24 to a set of oven burners 26. Air is supplied through inlet ports 28 included in the second surface 18.

    Electro-optical IFS finder
    2.
    发明授权
    Electro-optical IFS finder 失效
    电光IFS探测器

    公开(公告)号:US5076662A

    公开(公告)日:1991-12-31

    申请号:US340655

    申请日:1989-04-20

    IPC分类号: G06E1/00 G06E3/00 G06T1/00

    CPC分类号: G06E3/001

    摘要: An electro-optical system that implements the self-tiling process of fining proper Iterated Function Systems for modeling natural objects. The system can operate in two different modes, a real-time interactive mode and an automated mode. The purpose of the system is to speed up the process of finding a proper IFS for a given object to be modeled. The system makes use of optical processing, including optical means for rotating, magnifying/demagnifying and translating an input image. Optical beamsplitters are used to combine transformed images to produce a tiled output image. In one embodiment, an automated controller evaluates the goodness of the match between the tiled image and the input image and generates control signals which cause adjustment of the settings of the optical means. The process is repeated automatically until the match is sufficiently good. The invention can also be operated in a manual, man-in-the-loop mode.

    Dispersive holographic spectrometer
    3.
    发明授权
    Dispersive holographic spectrometer 失效
    分散全息光谱仪

    公开(公告)号:US5050992A

    公开(公告)日:1991-09-24

    申请号:US508436

    申请日:1990-04-13

    摘要: This invention relates to a dispersive holographic spectrometer (12) for analyzing radiation from an infrared source (16). The holographic spectrometer (12) comprises a piezoelectric block (40) having a holographic lens (38) on one face, an array of detectors (36) on another face and a pair of vernier electrodes (32, 34) on opposite faces. Radiation from the source (16) incident upon the holographic lens (38) is dispersed into component wavelengths (44, 46) and directed towards the detector array (38). The holographic lens (36) has a holographic interference pattern recorded on it such that radiation of predetermined wavelength components are dispersed sufficiently enough such that radiation of specific wavelengths falls on different detector elements (48) of the detector array (36). By applying a voltage to the electrodes (32, 38), an electric field is created within the piezoelectric block (40) such that it is either compressed or expanded. This change in the piezoelectric block (40) alters the direction of the radiation from the holographic lens (38) to the detector array (36). Therefore, misalignment of the source (16) with the holographic lens (38) can be compensated for such that piezoelectric adjustment of the block (40) will make the radiation of individual wavelengths fall on the desired detector element (48). Further, radiation from different wavelengths can be directed from one detector element to another. The detector array (36) is self-scanning such that an absorption spectrum can be measured and recorded over a range of frequencies.

    Reduction of nonmetallic coating surface vertical irregularities by
electrostatic pressure
    4.
    发明授权
    Reduction of nonmetallic coating surface vertical irregularities by electrostatic pressure 失效
    通过静电压力减少非金属涂层表面的垂直不规则性

    公开(公告)号:US5250326A

    公开(公告)日:1993-10-05

    申请号:US814206

    申请日:1991-12-20

    IPC分类号: B05C11/02 B05D1/04

    CPC分类号: B05C11/02

    摘要: A time-efficient method for smoothing a surface 20 of an applied coating composition 22 is disclosed herein. In particular, the present invention sets forth a technique for expediting the subsidence of coating surface nonmetallic vertical irregularities R1, R2. The technique of the present invention is applied subsequent to the application of the coating composition 22 to an electrically conductive object 24, which results in the formation of a coating surface 20. The technique of the present invention includes the step of generating electrically charged particles 40 in a volume of space adjacent to the coating surface 20. The charged particles 40 cause an electric field to develop across the coating composition 22, which induces the charged particles 40 to exert pressure on the coating surface 20.

    摘要翻译: 本文公开了一种用于平滑施加的涂料组合物22的表面20的时间有效的方法。 特别地,本发明提出了一种加速涂层表面非金属垂直不规则性R1,R2的沉降的技术。 本发明的技术在将涂料组合物22施加到导电物体24之后应用,导致形成涂层表面20.本发明的技术包括产生带电粒子40的步骤 在与涂层表面20相邻的空间的体积中。带电粒子40导致跨过涂层组合物22的电场,这引起带电粒子40在涂层表面20上施加压力。

    Method and apparatus for reducing matter to constituent elements and
separating one of the elements from the other elements
    5.
    发明授权
    Method and apparatus for reducing matter to constituent elements and separating one of the elements from the other elements 失效
    用于将物质还原成组成元件并将元件与其它元件分离的方法和装置

    公开(公告)号:US3942975A

    公开(公告)日:1976-03-09

    申请号:US269634

    申请日:1972-07-07

    CPC分类号: C22B4/005

    摘要: A method and apparatus for reducing matter, particularly chemical compounds, to constituent elements in a high temperature environment (a plasma) and separating one of the elements from the other elements. Reduction is effected by raising the input compound to a high temperature -- thermally disassociating it. Separation is effected by partly ionizing one of the species (elements) to be separated and moving the resultant mixture of gas and plasma at a velocity (v) through a magnetic field (B) having a vector component (B.sub..vertline.) perpendicular to the plasma velocity vector. The interaction of the perpendicular and parallel components of the magnetic field with the ions and electrons in the plasma produces a separating force perpendicular to the direction of plasma flow. The separating force acts on the entire specie which is significantly ionized even though it is only partially ionized. Axial symmetry is maintained so that a space charge does not build up and destroy the flow of electric current in a direction transverse to the plasma flow.

    摘要翻译: 一种用于将物质,特别是化合物还原成高温环境(等离子体)中的组成元素并将其中一种元素与其它元素分离的方法和装置。 通过将输入的化合物升高至高温 - 使其分解而实现还原。 通过部分电离待分离的物质(元素)中的一种进行分离,并以所述速度(v)将所得到的气体和等离子体的混合物通过具有垂直于所述物质(B)的矢量分量(B + 234)的磁场 等离子体速度矢量。 磁场的垂直和平行分量与等离子体中的离子和电子的相互作用产生垂直于等离子体流动方向的分离力。 分离力作用于整个物质,即使仅部分离子化,该分离力也显着离子化。 保持轴向对称性,使得空间电荷不会在横向于等离子体流的方向上积累并破坏电流。

    Magneto-acoustic imaging
    7.
    发明授权
    Magneto-acoustic imaging 失效
    磁声成像

    公开(公告)号:US06535625B1

    公开(公告)日:2003-03-18

    申请号:US09405236

    申请日:1999-09-24

    IPC分类号: G06K900

    摘要: An apparatus having a coil of wire, energized by a repetitively pulsed radio frequency (RF) power source to provide electromagnetic fields to a region within a body. A scanning, directional hydrophone acoustically connected to the body, samples ultrasonic radiation generated by the RF fields at the RF frequency or twice the RF frequency induced from conductive spots. Signals from the hydrophone are analyzed with regard to their time of arrival relative to the RF pulses and with respect to their direction of arrival. These collected data are recorded and displayed as images of the spots within the region.

    摘要翻译: 一种具有线圈的装置,其由重复脉冲射频(RF)电源激励,以向身体内的区域提供电磁场。 声学连接到身体的扫描定向水听器采样RF频率产生的超声波辐射,或从导电点引起的RF频率的两倍。 关于来自水听器的信号关于它们相对于RF脉冲的到达时间以及相对于它们的到达方向进行分析。 这些收集的数据被记录并显示为该区域内的斑点的图像。

    Infrared holographic defect detector
    8.
    发明授权
    Infrared holographic defect detector 失效
    红外全息缺陷检测器

    公开(公告)号:US5041726A

    公开(公告)日:1991-08-20

    申请号:US535793

    申请日:1990-06-11

    摘要: An infrared holographic defect detector (10) comprises a far infrared pulsed coherent source (14) of infrared radiation which provides infrared radiation. The radiation is directed at a generally non-reflective surface (12), for example, a surface of an automobile body having a matt grey pre-coat thereon. A semi-transparent mirror (15) is placed in the path of the radiation to provide a reference beam (17) therefrom. An infrared detector (18) and a charge-coupled device (20) receives the radiation reflected from the surface and the reference signal. A comparator (22) compares the received reflected information and the reference signal and, preferably, information from a source (24) which defines a desired surface configuration in order to derive a quantitative measurement of the surface. A monitor (26) visually displays the quantitative mesurement and location of any dents in the surface. To avoid a requirement that sequential automobile doors containing the surface of investigation be three-dimensionally aligned to within microns of reference points, a detector of the reflected radiation can be translated and rotated. A number of sensed images of the surface are taken, one at each of the different positions of the detector. For each image a measure of its correlation with the standard image is made.

    RF FIELD SHAPING AND ATTENUATION FOR EMAI INDUCTION ELEMENTS
    9.
    发明申请
    RF FIELD SHAPING AND ATTENUATION FOR EMAI INDUCTION ELEMENTS 审中-公开
    EMAI感应元件的射频场形成和衰减

    公开(公告)号:US20110166438A1

    公开(公告)日:2011-07-07

    申请号:US12896733

    申请日:2010-10-01

    IPC分类号: A61B8/13 A61B8/00 A61B5/055

    CPC分类号: A61B5/0051 G01R33/4814

    摘要: An Electro-Magnetic Imaging (EMAI) System is presented. EMAI systems can include induction elements (e.g., an induction coil) configured to induce a target tissue to generate internally sourced ultrasounds. The induction elements can be shielded by one or more shielding elements to shape, or otherwise alter, an imaging field while attenuating radiated fields in a far zone. EMAI systems can further include a shield tuner to adjust shield parameters to achieved desired imaging or radiated field properties. A shielding element can be placed approximately one induction coil radius away from the coil to achieve suitably strong imaging field magnitudes while also achieving suitably weak radiated field magnitudes in a far zone. In some embodiments, acoustic sensors lack substantial shielding from the fields generated by the induction elements.

    摘要翻译: 介绍了电磁成像(EMAI)系统。 EMAI系统可以包括被配置为诱导靶组织以产生内部来源的超声波的感应元件(例如感应线圈)。 感应元件可以被一个或多个屏蔽元件屏蔽,以形成或以其它方式改变成像场,同时衰减远区中的辐射场。 EMAI系统还可以包括屏蔽调谐器来调节屏蔽参数以实现期望的成像或辐射场特性。 屏蔽元件可以放置在大约一个感应线圈半径远离线圈,以实现适当强的成像磁场强度,同时在远区域也实现适当的弱辐射场强。 在一些实施例中,声传感器缺少与感应元件产生的场的实质屏蔽。

    Thermal technique for simultaneous testing of circuit board solder joints
    10.
    发明授权
    Thermal technique for simultaneous testing of circuit board solder joints 失效
    电路板焊点同时测试的热技术

    公开(公告)号:US4792683A

    公开(公告)日:1988-12-20

    申请号:US4009

    申请日:1987-01-16

    IPC分类号: G01N25/72 G01N21/71

    CPC分类号: G01N25/72

    摘要: A system for inspecting the electronic integrity of solder joints by repetitive pulse-heating the solder joints with radiant energy and determining the temperature oscillation of pulse-heated solder joints by measuring the infrared emissions from the solder joints during heating and non-heating periods. Advantageously, the exposed solder joints of a circuit board can be tested all at one time by pulse-heating the entire circuit board. The temperature oscillation of each joint can be compared to the temperature oscillations of corresponding standard solder joints of known good electronic integrity on properly operating boards.

    摘要翻译: 用于通过用辐射能重复脉冲加热焊点并确定脉冲加热焊点的温度振荡来测量加热和非加热期间焊点的红外发射,来检测焊点的电子完整性的系统。 有利地,可以通过脉冲加热整个电路板来一次性地测试电路板的暴露的焊点。 可以将每个接头的温度振荡与正确操作的板上的已知良好电子完整性的相应标准焊点的温度振荡进行比较。