利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

8 条记录 (耗时 0.038 秒)

    Deciphering encapsulated and enciphered UDP datagrams
    2.
    发明授权
    Deciphering encapsulated and enciphered UDP datagrams 有权
    解密封装和加密的UDP数据报

    公开(公告)号：US07843910B2

    公开(公告)日：2010-11-30

    申请号：US11069798

    申请日：2005-02-28

    申请人： Kevin Loughran ,  David Nolan ,  Paul Hough ,  Philip Pinto

    发明人： Kevin Loughran ,  David Nolan ,  Paul Hough ,  Philip Pinto

    IPC分类号： H04L12/28 ,  H04L29/06 ,  H04J3/00

    CPC分类号： H04L63/0428 ,  H04L1/0061 ,  H04L1/0072 ,  H04L49/354 ,  H04L63/164

    摘要： Deciphering and verification of the checksum of enciphered and encapsulated UDP datagrams, particularly those which enclose a tunneling protocol such as L2TP, are achieved by the provision of a checksum verifier in parallel with a decipher block. Checksum logic creates a pseudo UDP header needed for checksum verification using fields that would occur at the start of the packet that encapsulates the UDP datagram. The first part of the packet to be deciphered is the UDP header; checksum logic can latch the checksum field into a local register. As the rest of the packet is deciphered the checksum verifier processes the data at the same time. Eventually the checksum logic will acquire a complete checksum which can be compared with the checksum that had been previously latched, so as to verify the checksum.

    摘要翻译： 对加密和封装的UDP数据报的校验和进行解密和验证，特别是包含诸如L2TP的隧道协议的UDP数据报，通过与解密块并行提供校验和来实现。 校验和逻辑使用在封装UDP数据报的数据包开始时发生的字段来创建校验和验证所需的伪UDP头。 要解密的数据包的第一部分是UDP报头; 校验和逻辑可以将校验和字段锁定到本地寄存器中。 当数据包的其余部分被解密时，校验和验证器同时处理数据。 最终，校验和逻辑将获得一个完整的校验和，可以将之与之前锁存的校验和进行比较，以验证校验和。

    Deciphering encapsulated and enciphered UDP datagrams
    5.
    发明申请
    Deciphering encapsulated and enciphered UDP datagrams 有权
    解密封装和加密的UDP数据报

    公开(公告)号：US20060174108A1

    公开(公告)日：2006-08-03

    申请号：US11069798

    申请日：2005-02-28

    申请人： Kevin Loughran ,  David Nolan ,  Paul Hough ,  Philip Pinto

    发明人： Kevin Loughran ,  David Nolan ,  Paul Hough ,  Philip Pinto

    IPC分类号： H04L9/00

    CPC分类号： H04L63/0428 ,  H04L1/0061 ,  H04L1/0072 ,  H04L49/354 ,  H04L63/164

    摘要： Deciphering and verification of the checksum of enciphered and encapsulated UDP datagrams, particularly those which enclose a tunnelling protocol such as L2TP, are achieved by the provision of a checksum verifier in parallel with a decipher block. Checksum logic creates a pseudo UDP header needed for checksum verification using fields that would occur at the start of the packet that encapsulates the UDP datagram. The first part of the packet to be deciphered is the UDP header; checksum logic can latch the checksum field into a local register. As the rest of the packet is deciphered the checksum verifier processes the data at the same time. Eventually the checksum logic will acquire a complete checksum which can be compared with the checksum that had been previously latched, so as to verify the checksum.

    摘要翻译： 对加密和封装的UDP数据报的校验和进行解密和验证，特别是包含诸如L2TP的隧道协议的UDP数据报，通过与解密块并行提供校验和来实现。 校验和逻辑使用在封装UDP数据报的数据包开始时发生的字段来创建校验和验证所需的伪UDP头。 要解密的数据包的第一部分是UDP报头; 校验和逻辑可以将校验和字段锁定到本地寄存器中。 当数据包的其余部分被解密时，校验和验证器同时处理数据。 最终，校验和逻辑将获得一个完整的校验和，可以将之与之前锁存的校验和进行比较，以验证校验和。

    Sensing mode atomic force microscope
    6.
    发明申请
    Sensing mode atomic force microscope 失效
    感应模式原子力显微镜

    公开(公告)号：US20050029450A1

    公开(公告)日：2005-02-10

    申请号：US10933591

    申请日：2004-09-03

    申请人： Paul Hough ,  Chengpu Wang

    发明人： Paul Hough ,  Chengpu Wang

    IPC分类号： G01Q10/04 ,  G01Q10/06 ,  G01Q30/04 ,  G01Q60/24 ,  G01Q60/28 ,  G01Q60/38 ,  G01N23/00 ,  G01B5/28 ,  G21K7/00

    CPC分类号： G01Q60/38 ,  G01Q10/06 ,  Y10S977/851 ,  Y10S977/852 ,  Y10S977/863 ,  Y10S977/869 ,  Y10S977/875

    摘要： An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

    摘要翻译： 描述了一种具有悬臂的原子力显微镜，该悬臂包括在与基座相对的端部上的基部和探针尖端; 连接到基座的悬臂驱动装置; 耦合到探针尖端的磁性材料，使得当向磁性材料施加递增增加的磁场时，递增增加的力将被施加到探针尖端; 可动标本基地 以及控制器，其被构造成在基于所述探针针尖和样本之间的接触的点处获得样本的轮廓高度，并且在程序的控制下通过程序的控制来测量所述探针针尖和所述样本之间的粘附力， 施加足以破坏接触的释放力的磁场的量。 还描述了用于原子力显微镜的成像方法，其涉及测量区域内的多个点处的样本轮廓高度和粘附力，并且同时显示每个点的轮廓和附着力。 还描述了一种显微镜控制器，并被构造成针对一组点，在基于悬臂偏转，悬臂底座位置和样本压电位置的点处计算样本高度; 通过对探针尖端施加递增增加的力直到探针尖端与试样分离来计算探针尖端和样品之间的粘附力; 并将探针尖端移动到组中的新点。