ADVANCED ANALYTE SENSOR CALIBRATION AND ERROR DETECTION

    公开(公告)号:US20190320948A1

    公开(公告)日:2019-10-24

    申请号:US16460906

    申请日:2019-07-02

    申请人: DexCom, Inc.

    摘要: Systems and methods for processing sensor data and self-calibration are provided. In some embodiments, systems and methods are provided which are capable of calibrating a continuous analyte sensor based on an initial sensitivity, and then continuously performing self-calibration without using, or with reduced use of, reference measurements. In certain embodiments, a sensitivity of the analyte sensor is determined by applying an estimative algorithm that is a function of certain parameters. Also described herein are systems and methods for determining a property of an analyte sensor using a stimulus signal. The sensor property can be used to compensate sensor data for sensitivity drift, or determine another property associated with the sensor, such as temperature, sensor membrane damage, moisture ingress in sensor electronics, and scaling factors.

    ADVANCED ANALYTE SENSOR CALIBRATION AND ERROR DETECTION

    公开(公告)号:US20190261903A1

    公开(公告)日:2019-08-29

    申请号:US16405931

    申请日:2019-05-07

    申请人: DexCom, Inc.

    摘要: Systems and methods for processing sensor data and self-calibration are provided. In some embodiments, systems and methods are provided which are capable of calibrating a continuous analyte sensor based on an initial sensitivity, and then continuously performing self-calibration without using, or with reduced use of, reference measurements. In certain embodiments, a sensitivity of the analyte sensor is determined by applying an estimative algorithm that is a function of certain parameters. Also described herein are systems and methods for determining a property of an analyte sensor using a stimulus signal. The sensor property can be used to compensate sensor data for sensitivity drift, or determine another property associated with the sensor, such as temperature, sensor membrane damage, moisture ingress in sensor electronics, and scaling factors.