Abstract:
Embodiments relate to systems and methods for sensor self-diagnostics using multiple signal paths. In an embodiment, the sensors are magnetic field sensors, and the systems and/or methods are configured to meet or exceed relevant safety or other industry standards, such as SIL standards. For example, a monolithic integrated circuit sensor system implemented on a single semiconductor ship can include a first sensor device having a first signal path for a first sensor signal on a semiconductor chip; and a second sensor device having a second signal path for a second sensor signal on the semiconductor chip, the second signal path distinct from the first signal path, wherein a comparison of the first signal path signal and the second signal path signal provides a sensor system self-test.
Abstract:
In an embodiment, a method for sensing a body includes measuring an impedance of a body occupying a seat over a plurality of frequencies and comparing the measured impedance of the body with a predefined body model. The method also includes determining whether the predefined body model corresponds to the measured impedance of the body.
Abstract:
The disclosed invention provides a structure and method for easily measuring capacitive and/or resistive components of a sensor system. In one embodiment, the structure comprises a signal generator configured to output a load current to a measurement element containing measurement sensor elements and a parasitic capacitance. A controllable excitation voltage is generated, via integration of the load current on the parasitic capacitance, and output to the measurement sensor elements having capacitive and resistive components. The controlled voltage through the measurement device may be manipulated to cause the capacitive and resistive components to exhibit a transient effect. The resulting output current, provided from the measurement device therefore has transient response characteristics (e.g., the settling time, amplitude) that can be selectively measured by a measurement circuit to easily determine values of the capacitive and resistive measurement elements. Furthermore, dedicated demodulation techniques may be used to measure the capacitive and resistive components.
Abstract:
A system for capacitive object recognition including a pair of electrodes, one of the electrodes having an adjustable parameter, and a controller modeling current pathways formed by interaction of an object with an electric field between the pair electrodes as a network of capacitors. The controller is configured to set the adjustable parameter to a first setting and to apply a set of alternating current voltages to the pair electrodes and measure a resulting first set of current values at each of the electrodes, configured to set the adjustable parameter to a second setting and apply the set of alternating current voltages to the pair of electrodes and measure a resulting second set of current values at each of the electrodes, and configured to determine values for up to all capacitors of the network of capacitors based on the first and second sets of current values.
Abstract:
A phase locked loop (PLL) circuit includes a first signal detector having a first input terminal configured to receive a varying first input signal, a second input terminal configured to receive a feedback signal that corresponds to the center of the input frequency, and an output terminal configured to provide an output signal corresponding to a phase difference between the first input and feedback signals. A delay estimator has an input terminal configured to receive the output signal from the first phase detector and in response thereto, output a phase difference estimation signal. A variable delay circuit has an input terminal configured to receive the phase difference estimation signal and in response thereto, phase shift the second input signal.
Abstract:
A system includes a first circuit configured to convert a first analog signal to a first digital signal. The system includes a second circuit configured to determine an area of the first digital signal above a set value and an area of the first digital signal below the set value to provide a second digital signal indicating an offset of the first analog signal.
Abstract:
The disclosed invention provides a structure and method for easily measuring capacitive and/or resistive components of a sensor system. In one embodiment, the structure comprises a signal generator configured to output a load current to a measurement element containing measurement sensor elements and a parasitic capacitance. A controllable excitation voltage is generated, via integration of the load current on the parasitic capacitance, and output to the measurement sensor elements having capacitive and resistive components. The controlled voltage through the measurement device may be manipulated to cause the capacitive and resistive components to exhibit a transient effect. The resulting output current, provided from the measurement device therefore has transient response characteristics (e.g., the settling time, amplitude) that can be selectively measured by a measurement circuit to easily determine values of the capacitive and resistive measurement elements. Furthermore, dedicated demodulation techniques may be used to measure the capacitive and resistive components.
Abstract:
A system includes a capacitive sensor including a first electrode and a second electrode. The system includes a measurement system configured to sense a capacitance between the first electrode and the second electrode and apply a first offset to the sensed capacitance to provide an offset compensated capacitance.
Abstract:
A voltage controller for controlling an output voltage to a predetermined value. The voltage controller has a first terminal configured to connect a supply voltage, a second terminal configured to output the output voltage, a control voltage generating unit configured to provide a control voltage, and a control transistor. The control transistor is connected as a series controller between the first terminal and the second terminal. The control voltage can be applied to the control terminal of the control transistor, wherein the output voltage is controlled in a manner dependent on the supply voltage and the control voltage. Furthermore, an offset voltage is superposed on the control voltage.
Abstract:
A system includes a first circuit configured to convert a first analog signal to a first digital signal. The system includes a second circuit configured to determine an area of the first digital signal above a set value and an area of the first digital signal below the set value to provide a second digital signal indicating an offset of the first analog signal.