METHOD FOR FORMING A DIELECTRIC LAYER
    1.
    发明申请
    METHOD FOR FORMING A DIELECTRIC LAYER 审中-公开
    形成介电层的方法

    公开(公告)号:US20080176375A1

    公开(公告)日:2008-07-24

    申请号:US11970654

    申请日:2008-01-08

    IPC分类号: H01L21/31 H01L21/02

    摘要: The present invention relates to a deposition of a dielectric layer. On a substrate having a structured area a crystallization seed layer for a dielectric layer is deposited via an atomic layer deposition technique employing a first and a second precursor on the structured area of the substrate. The first pre-cursor is a compound having the constitutional formula M1(R1Cp)x(R2)4-x, wherein M1 is one of hafnium and zirconium, Cp is cyclopentadienyl, R1 is independently selected of methyl, ethyl and alkyl, R2 is independently selected of hydrogen, methyl, ethyl, alkyl and alkoxyl, and x is one or two. The dielectric layer is deposited on the crystallization seed layer via an atomic layer deposition technique employing a third and a forth precursor wherein the third pre-cursor being a compound having the constitutional formula M2 R3 R4 R5 R6, wherein M2 is one of hafnium or zirconium and R3, R4, R5, and R6 are independently selected of alkyl amines.

    摘要翻译: 本发明涉及电介质层的沉积。 在具有结构区域的基板上,通过使用第一和第二前体的原子层沉积技术在基板的结构化区域上沉积用于电介质层的结晶种子层。 第一个前体是具有结构式M 1(R 1)的化合物,其中R 1,R 2,R 2, 其中M 1是铪和锆中的一种,Cp是环戊二烯基,R 1独立地选自甲基,乙基 和烷基,R 2独立地选自氢,甲基,乙基,烷基和烷氧基,x是一个或两个。 介电层通过使用第三和第四前体的原子层沉积技术沉积在结晶种子层上,其中第三个前体是具有结构式M 2 O 3的化合物 其中M 2是铪或锆中的一种,R 2是R 5 R 4,R 5,R 6和R 6独立地选自烷基胺。

    METHOD, APPARATUS AND STARTING MATERIAL FOR PROVIDING A GASEOUS PRECURSOR
    2.
    发明申请
    METHOD, APPARATUS AND STARTING MATERIAL FOR PROVIDING A GASEOUS PRECURSOR 审中-公开
    方法,装置和起始材料,用于提供气体前体

    公开(公告)号:US20070269598A1

    公开(公告)日:2007-11-22

    申请号:US11750073

    申请日:2007-05-17

    IPC分类号: C23C16/00

    CPC分类号: C23C16/4481 C23C16/08

    摘要: A method and apparatus for providing a gaseous precursor for a coating process. A starting material having a pulverulent precursor material is heated in order to cause a vaporization of the pulverulent precursor material, whereby a gaseous precursor is produced. A carrier gas is flowed past the starting material at a distance minimizing or preventing a convective gas flow, while transporting the gaseous precursor to a processing region containing a wafer to be coated.

    摘要翻译: 一种用于提供涂覆工艺的气态前体的方法和装置。 加热具有粉状前体材料的起始材料,以便引起粉状前体材料的汽化,由此产生气态前体。 在将气态前体输送到包含待涂覆的晶片的处理区域的同时,载气以一定距离流过原料,使其最小化或防止对流气体流动。

    Automatic layer deposition process
    3.
    发明申请
    Automatic layer deposition process 审中-公开
    自动层沉积工艺

    公开(公告)号:US20070161180A1

    公开(公告)日:2007-07-12

    申请号:US11331441

    申请日:2006-01-13

    IPC分类号: H01L21/8242

    摘要: The atomic layer deposition process according to the invention provides the following steps for the production of homogeneous layers on a substrate. The substrate is introduced into a reaction chamber. A first precursor is introduced into the reaction chamber, which first precursor reacts on the surface of the substrate to form an intermediate product. A second precursor is introduced into the reaction chamber, which second precursor has a low sticking coefficient and reacts with part of the intermediate product to form a first product. A third precursor is introduced into the reaction chamber, which third precursor has a high sticking coefficient and reacts with the remaining part of the intermediate product to form a second product. The second precursor and its first product reduce the effective sticking coefficient of the third precursor by partially covering the surface.

    摘要翻译: 根据本发明的原子层沉积方法提供了在基底上生产均质层的以下步骤。 将基底引入反应室。 将第一前体引入反应室,其中第一前体在基材的表面上反应形成中间产物。 将第二前体引入反应室,该第二前体具有低粘附系数并与部分中间产物反应以形成第一产物。 将第三前体引入反应室,该第三前体具有高粘附系数并与中间产物的剩余部分反应以形成第二产物。 第二种前体及其第一种产物通过部分覆盖表面来降低第三种前体的有效粘附系数。