Internal clock multiplication for test time reduction
    3.
    发明授权
    Internal clock multiplication for test time reduction 有权
    内部时钟倍增,用于测试时间缩短

    公开(公告)号:US6069829A

    公开(公告)日:2000-05-30

    申请号:US408093

    申请日:1999-09-27

    摘要: A circuit is designed with a clock circuit (215, 217) coupled to receive a control signal having a first logic state and a second logic state. The clock circuit produces a first clock signal (CLK) response to the first logic state and a second clock signal (*CLK) in response to the second logic state. The second clock signal has a frequency at least twice a frequency of the first clock signal. An address counter (221) is coupled to receive one of the first and second clock signals. The address counter produces a sequence of address signals corresponding to the one of the first and second clock signals. An array of memory cells is arranged to produce a sequence of data bits corresponding to the sequence of address signals. A logic circuit (235, 239, 240) is coupled to receive the sequence of data bits. The logic circuit produces a logical combination of the sequence of data bits.

    摘要翻译: 电路被设计成具有耦合以接收具有第一逻辑状态和第二逻辑状态的控制信号的时钟电路(215,217)。 时钟电路响应于第二逻辑状态产生响应于第一逻辑状态的第一时钟信号(CLK)和第二时钟信号(* CLK)。 第二时钟信号的频率至少是第一时钟信号频率的两倍。 地址计数器(221)被耦合以接收第一和第二时钟信号中的一个。 地址计数器产生对应于第一和第二时钟信号之一的地址信号序列。 存储器单元的阵列被布置成产生与地址信号序列相对应的数据位序列。 逻辑电路(235,239,240)被耦合以接收数据位序列。 逻辑电路产生数据位序列的逻辑组合。