摘要:
A non-volatile memory device of flash type includes first memory cells for storing data, second memory cells for storing protection information of the first memory cells, and a circuit for updating the protection information that includes a circuit for writing a plurality of versions of the protection information in the second memory cells, and a circuit for identifying a current version of the protection information.
摘要:
A non-volatile memory device of flash type includes first memory cells for storing data, second memory cells for storing protection information of the first memory cells, and a circuit for updating the protection information that includes a circuit for writing a plurality of versions of the protection information in the second memory cells, and a circuit for identifying a current version of the protection information.
摘要:
Example embodiments described herein may comprise a transfer of firmware execution within a non-volatile memory device to one or more replacement instructions at least in part in response to a match between a code fetch address and an address stored n a trap address register.
摘要:
A sensing circuit is provided. The sensing circuit is adapted to determine when a cell current flowing trough a selected memory cell exceeds a reference current during an evaluation phase of a sensing operation. The sensing circuit is adapted to be coupled to at least one selected memory cell through a respective bit line. The sensing circuit includes: an access circuit node adapted to be coupled to the bit line; precharging circuitry adapted to be activated in a precharge phase of the sensing operation preceding the evaluation phase, so as to bring a voltage of said access circuit node to a reference voltage; a reference circuit node coupled to the access circuit node and arranged to receive the reference current. The sensing circuit further includes an evaluation circuit node coupled to the reference circuit node through a first current to voltage converter, adapted to sink a current flowing from the reference circuit node to the evaluation circuit node and to produce a corresponding voltage difference between the reference circuit node and the evaluation circuit node, wherein the current is nearly equal to the reference current substantially at the end of the precharge phase; comparator circuitry is provided, adapted to compare the voltage of the access circuit node with the voltage of the evaluation circuit node and to provide a corresponding comparison signal whose time pattern indicates when the cell current exceeds the reference current. The first current to voltage converter is an electronic device having essentially the behavior of a diode.
摘要:
A regulator for a digital-to-analog converter having in input a digital signal and suitable for providing an analog signal in output, the regulator including at least one pair of buffers having in input the digital signal and the outputs connected to a pair of circuit branches connected to the output of the regulator; each of the at least two circuit branches having at least one resistance. To at least one of the at least one pair of buffers a variable resistance is associated, and the regulator includes a circuit having in input the analog signal and adapted for measuring its waveform and acting on the variable resistance in response to its possible anomalous waveform compared to a desired waveform.
摘要:
A memory device has an array of memory cells. A column decoder is configured to address the memory cells. A charge-pump supply circuit generates a boosted supply voltage for the column decoder. A connecting stage is arranged between the supply circuit and the column decoder. The connecting stage switches between a high-impedance state and a low-impedance state, and is configured to switch into the high-impedance state in given operating conditions of the memory device, in particular during a reading step.
摘要:
A voltage regulator connected to a memory cell is configured by identifying at least a first and a second operation regions of the cell and associating the first and second operation regions with respective first and second operation conditions of the memory cell. An operative condition of the memory cell involved in a programming operation is detected, and at least a configuration signal of the regulator according to said detected operative condition is generated, this configuration signal taking a first and a second value associated with the first and second operation conditions.
摘要:
A sensing circuit is provided. The sensing circuit is adapted to determine when a cell current flowing trough a selected memory cell exceeds a reference current during an evaluation phase of a sensing operation. The sensing circuit is adapted to be coupled to at least one selected memory cell through a respective bit line. The sensing circuit includes: an access circuit node adapted to be coupled to the bit line; precharging circuitry adapted to be activated in a precharge phase of the sensing operation preceding the evaluation phase, so as to bring a voltage of said access circuit node to a reference voltage; a reference circuit node coupled to the access circuit node and arranged to receive the reference current. The sensing circuit further includes an evaluation circuit node coupled to the reference circuit node through a first current to voltage converter, adapted to sink a current flowing from the reference circuit node to the evaluation circuit node and to produce a corresponding voltage difference between the reference circuit node and the evaluation circuit node, wherein the current is nearly equal to the reference current substantially at the end of the precharge phase; comparator circuitry is provided, adapted to compare the voltage of the access circuit node with the voltage of the evaluation circuit node and to provide a corresponding comparison signal whose time pattern indicates when the cell current exceeds the reference current. The first current to voltage converter is an electronic device having essentially the behavior of a diode.
摘要:
A memory device has an array of memory cells. A column decoder is configured to address the memory cells. A charge-pump supply circuit generates a boosted supply voltage for the column decoder. A connecting stage is arranged between the supply circuit and the column decoder. The connecting stage switches between a high-impedance state and a low-impedance state, and is configured to switch into the high-impedance state in given operating conditions of the memory device, in particular during a reading step.
摘要:
Example embodiments described herein may comprise a transfer of firmware execution within a non-volatile memory device to one or more replacement instructions at least in part in response to a match between a code fetch address and an address stored in a trap address register.