Abstract:
Integrated circuits with smooth metal gates and methods for fabricating integrated circuits with smooth metal gates are provided. In an embodiment, a method for fabricating an integrated circuit includes providing a partially fabricated integrated circuit including a dielectric layer formed with a trench bound by a trench surface. The method deposits metal in the trench and forms an overburden portion of metal overlying the dielectric layer. The method includes selectively etching the metal with a chemical etchant and removing the overburden portion of metal.
Abstract:
Integrated circuits with tungsten components having a smooth surface and methods for producing such integrated circuits are provided. A method of producing the integrated circuits includes forming a nucleation layer overlying a substrate and within a cavity, where the nucleation layer includes tungsten. A nucleation layer thickness is reduced, and a fill layer if formed overlying the nucleation layer.
Abstract:
A conductive structure(s), such as a gate electrode(s) or a contact structure(s), and methods of fabrication thereof are provided. The conductive structure(s) includes a first conductive layer of a first conductive material, and a second conductive layer of a second conductive material. The second conductive layer is disposed over the first conductive layer, and at least a portion of the first conductive material includes grains having a size larger than a defined value, and at least a second portion of the second conductive material includes grains having a size less than the defined value. In one embodiment, the first and second conductive materials are the same conductive material, with different-sized grains.
Abstract:
Integrated circuits with tungsten components having a smooth surface and methods for producing such integrated circuits are provided. A method of producing the integrated circuits includes forming a nucleation layer overlying a substrate and within a cavity, where the nucleation layer includes tungsten. A nucleation layer thickness is reduced, and a fill layer if formed overlying the nucleation layer.