Gate electrode(s) and contact structure(s), and methods of fabrication thereof
    3.
    发明授权
    Gate electrode(s) and contact structure(s), and methods of fabrication thereof 有权
    栅电极和接触结构及其制造方法

    公开(公告)号:US08859417B2

    公开(公告)日:2014-10-14

    申请号:US13733282

    申请日:2013-01-03

    Abstract: A conductive structure(s), such as a gate electrode(s) or a contact structure(s), and methods of fabrication thereof are provided. The conductive structure(s) includes a first conductive layer of a first conductive material, and a second conductive layer of a second conductive material. The second conductive layer is disposed over the first conductive layer, and at least a portion of the first conductive material includes grains having a size larger than a defined value, and at least a second portion of the second conductive material includes grains having a size less than the defined value. In one embodiment, the first and second conductive materials are the same conductive material, with different-sized grains.

    Abstract translation: 提供导电结构,例如栅电极或接触结构,以及其制造方法。 导电结构包括第一导电材料的第一导电层和第二导电材料的第二导电层。 第二导电层设置在第一导电层上,并且第一导电材料的至少一部分包括尺寸大于限定值的晶粒,并且第二导电材料的至少第二部分包括尺寸较小的晶粒 比定义的值。 在一个实施例中,第一和第二导电材料是相同的导电材料,具有不同尺寸的晶粒。

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