公开(公告)号：US09390969B2

公开(公告)日：2016-07-12

申请号：US14600273

申请日：2015-01-20

Applicant: GLOBALFOUNDRIES INC.

Inventor： David A. DeMuynck ,  Zhong-Xiang He ,  Daniel R. Miga ,  Matthew D. Moon ,  Daniel S. Vanslette ,  Eric J. White

IPC: H01L21/4763 ,  H01L21/768 ,  H01L23/522 ,  H01L49/02

CPC classification number: H01L21/76843 ,  H01L21/76802 ,  H01L21/76834 ,  H01L21/76846 ,  H01L21/76879 ,  H01L23/5227 ,  H01L28/10 ,  H01L2924/0002 ,  H01L2924/00

Abstract: The disclosure relates generally to integrated circuits (IC), IC interconnects, and methods of fabricating the same, and more particularly, high performance inductors. The IC includes at least one trench within a dielectric layer disposed on a substrate. The trench is conformally coated with a liner and seed layer, and includes an interconnect within. The interconnect includes a hard mask on the sidewalls of the interconnect.

Abstract translation: 本公开一般涉及集成电路（IC），IC互连及其制造方法，更具体地，涉及高性能电感器。 IC包括设置在基板上的电介质层内的至少一个沟槽。 沟槽被保形地涂覆有衬里和种子层，并且包括内部的互连。 互连包括在互连的侧壁上的硬掩模。