公开(公告)号：US06939776B2

公开(公告)日：2005-09-06

申请号：US09988272

申请日：2001-11-19

申请人： Hirotoshi Kubo ,  Masanao Kitagawa ,  Masahito Onda ,  Hiroaki Saito ,  Eiichiroh Kuwako

发明人： Hirotoshi Kubo ,  Masanao Kitagawa ,  Masahito Onda ,  Hiroaki Saito ,  Eiichiroh Kuwako

IPC分类号： H01L21/336 ,  H01L29/10 ,  H01L29/423 ,  H01L29/78 ,  H01L21/76

CPC分类号： H01L29/7802 ,  H01L29/1095 ,  H01L29/41766 ,  H01L29/4236 ,  H01L29/66719 ,  H01L29/66727 ,  H01L29/66734 ,  H01L29/7813

摘要： A power MOSFET comprises: a semiconductor substrate 21 of a first conduction type; a drain layer 22 of the first conduction type and formed on a surface layer of the substrate; a gate insulating film 25 formed in a partial region on the drain layer 22; a gate electrode 26 formed on the gate insulating film 25; an insulating film 27 formed on the gate electrode; a side wall insulator 28 formed on side walls of the gate insulating film 25, the gate electrode 26, and the insulating film 27; a recess formed on the drain layer 22 and in a region other than a region where the gate electrode 25 and the side wall insulator 28 are formed; a channel layer 23 of a second conduction type opposite to the first conduction type and formed in a range from the region where the recess is formed to a vicinity of the region where the gate electrode 26 is formed; a source region layer 24 of the one conduction type and formed on the channel layer 23 outside the recess; and a wiring layer 29 formed to cover the channel layer 23 which is exposed through the recess, the side wall insulator 28, and the insulating film.

摘要翻译： 功率MOSFET包括：第一导电类型的半导体衬底21; 第一导电类型的漏极层22，并形成在衬底的表面层上; 形成在漏极层22的局部区域中的栅极绝缘膜25; 形成在栅极绝缘膜25上的栅电极26; 形成在栅电极上的绝缘膜27; 形成在栅极绝缘膜25，栅电极26和绝缘膜27的侧壁上的侧壁绝缘体28; 在漏极层22上形成的凹部和形成有栅电极25和侧壁绝缘体28的区域以外的区域; 与第一导电型相反的第二导电类型的沟道层23形成在从形成凹部的区域到形成栅电极26的区域附近的范围内; 一个导电类型的源极区24，并形成在凹槽外部的沟道层23上; 以及形成为覆盖通过凹部暴露的沟道层23，侧壁绝缘体28和绝缘膜的布线层29。

公开(公告)号：US20050266642A1

公开(公告)日：2005-12-01

申请号：US11194446

申请日：2005-08-02

申请人： Hirotoshi Kubo ,  Masanao Kitagawa ,  Masahito Onda ,  Hiroaki Saito ,  Eiichiroh Kuwako

发明人： Hirotoshi Kubo ,  Masanao Kitagawa ,  Masahito Onda ,  Hiroaki Saito ,  Eiichiroh Kuwako

IPC分类号： H01L21/336 ,  H01L29/10 ,  H01L29/423 ,  H01L29/78

CPC分类号： H01L29/7802 ,  H01L29/1095 ,  H01L29/41766 ,  H01L29/4236 ,  H01L29/66719 ,  H01L29/66727 ,  H01L29/66734 ,  H01L29/7813

摘要： A power MOSFET comprises: a semiconductor substrate 21 of a first conduction type; a drain layer 22 of the first conduction type and formed on a surface layer of the substrate; a gate insulating film 25 formed in a partial region on the drain layer 22; a gate electrode 26 formed on the gate insulating film 25; an insulating film 27 formed on the gate electrode; a side wall insulator 28 formed on side walls of the gate insulating film 25, the gate electrode 26, and the insulating film 27; a recess formed on the drain layer 22 and in a region other than a region where the gate electrode 25 and the side wall insulator 28 are formed; a channel layer 23 of a second conduction type opposite to the first conduction type and formed in a range from the region where the recess is formed to a vicinity of the region where the gate electrode 26 is formed; a source region layer 24 of the one conduction type and formed on the channel layer 23 outside the recess; and a wiring layer 29 formed to cover the channel layer 23 which is exposed through the recess, the side wall insulator 28, and the insulating film.

摘要翻译： 功率MOSFET包括：第一导电类型的半导体衬底21; 第一导电类型的漏极层22，并形成在衬底的表面层上; 形成在漏极层22上的部分区域中的栅极绝缘膜25; 形成在栅极绝缘膜25上的栅电极26; 形成在栅电极上的绝缘膜27; 形成在栅极绝缘膜25，栅电极26和绝缘膜27的侧壁上的侧壁绝缘体28; 在漏极层22上形成的凹部和形成有栅电极25和侧壁绝缘体28的区域以外的区域; 与第一导电型相反的第二导电类型的沟道层23形成在从形成凹部的区域到形成栅电极26的区域附近的范围内; 一个导电类型的源极区24，并形成在凹槽外部的沟道层23上; 以及形成为覆盖通过凹部暴露的沟道层23，侧壁绝缘体28和绝缘膜的布线层29。

公开(公告)号：US07521306B2

公开(公告)日：2009-04-21

申请号：US11194446

申请日：2005-08-02

申请人： Hirotoshi Kubo ,  Masanao Kitagawa ,  Masahito Onda ,  Hiroaki Saito ,  Eiichiroh Kuwako

发明人： Hirotoshi Kubo ,  Masanao Kitagawa ,  Masahito Onda ,  Hiroaki Saito ,  Eiichiroh Kuwako

IPC分类号： H01L21/336

CPC分类号： H01L29/7802 ,  H01L29/1095 ,  H01L29/41766 ,  H01L29/4236 ,  H01L29/66719 ,  H01L29/66727 ,  H01L29/66734 ,  H01L29/7813

摘要： A power MOSFET comprises: a semiconductor substrate 21 of a first conduction type; a drain layer 22 of the first conduction type and formed on a surface layer of the substrate; a gate insulating film 25 formed in a partial region on the drain layer 22; a gate electrode 26 formed on the gate insulating film 25; an insulating film 27 formed on the gate electrode; a side wall insulator 28 formed on side walls of the gate insulating film 25, the gate electrode 26, and the insulating film 27; a recess formed on the drain layer 22 and in a region other than a region where the gate electrode 25 and the side wall insulator 28 are formed; a channel layer 23 of a second conduction type opposite to the first conduction type and formed in a range from the region where the recess is formed to a vicinity of the region where the gate electrode 26 is formed; a source region layer 24 of the one conduction type and formed on the channel layer 23 outside the recess; and a wiring layer 29 formed to cover the channel layer 23 which is exposed through the recess, the side wall insulator 28, and the insulating film.

公开(公告)号：US5972741A

公开(公告)日：1999-10-26

申请号：US958992

申请日：1997-10-28

申请人： Hirotoshi Kubo ,  Eiichiroh Kuwako ,  Masanao Kitagawa ,  Masahito Onda ,  Hiroaki Saitou ,  Keita Odajima

发明人： Hirotoshi Kubo ,  Eiichiroh Kuwako ,  Masanao Kitagawa ,  Masahito Onda ,  Hiroaki Saitou ,  Keita Odajima

IPC分类号： H01L21/336 ,  H01L29/78 ,  H01L21/352

CPC分类号： H01L29/7813

摘要： A first conductivity layer and a first insulating film are successively formed on a channel layer, and a photoresist film is formed on the first insulating film. The photoresist film is selectively exposed to light using a photomask and patterned. Using the patterned photoresist film as a mask, the first insulating film and the first conductivity layer are etched to form source electrodes from the first conductivity layer. Using the first insulating film and the source electrodes as a mask, an impurity of one conductivity type is diffused into exposed portions of the channel layer to form source regions. A second insulating film is formed in covering relation to side walls and upper surfaces of the source electrodes. Using the second insulating film as a mask, the channel layer and the common drain layer are etched to form trenches in the source regions, the channel layer, and the common drain layer. A third insulating film is formed on surfaces of the trenches, and a second conductive layer is formed as a gate electrode on the entire surface so as to fill up the trenches and cover the second insulating film.

摘要翻译： 在沟道层上依次形成第一导电层和第一绝缘膜，在第一绝缘膜上形成光致抗蚀剂膜。 使用光掩模将光致抗蚀剂膜选择性地暴露于光并图案化。 使用图案化的光致抗蚀剂膜作为掩模，第一绝缘膜和第一导电层被蚀刻以从第一导电层形成源电极。 使用第一绝缘膜和源电极作为掩模，一种导电类型的杂质扩散到沟道层的暴露部分中以形成源极区。 形成与源极电极的侧壁和上表面相关的第二绝缘膜。 使用第二绝缘膜作为掩模，蚀刻沟道层和公共漏极层，以在源极区，沟道层和公共漏极层中形成沟槽。 第三绝缘膜形成在沟槽的表面上，并且在整个表面上形成第二导电层作为栅电极，以填充沟槽并覆盖第二绝缘膜。

公开(公告)号：US06395604B1

公开(公告)日：2002-05-28

申请号：US09652013

申请日：2000-08-31

申请人： Hirotoshi Kubo ,  Hiroaki Saito ,  Masanao Kitagawa ,  Eiichiroh Kuwako

发明人： Hirotoshi Kubo ,  Hiroaki Saito ,  Masanao Kitagawa ,  Eiichiroh Kuwako

IPC分类号： H01L21336

CPC分类号： H01L29/7813 ,  H01L29/4232 ,  H01L29/4238

摘要： The present invention improves the characteristic of a trench-type vertical MOSFET. When a trench 23 serving as a gate 25 is formed, it is made in a shape of “&ggr;” which is convex toward the inside of the trench. Thus, the surface area of the trench is reduced so that both gate-source capacitance and gate-drain capacitance can be reduced, thereby shortening the switching time of the MOSFET.

摘要翻译： 本发明改进了沟槽型垂直MOSFET的特性。 当形成用作栅极25的沟槽23时，其形成为朝向沟槽内部凸出的“γ”形状。 因此，沟槽的表面积减小，从而可以减小栅极 - 源极电容和栅极 - 漏极电容，从而缩短MOSFET的开关时间。

公开(公告)号：US6137135A

公开(公告)日：2000-10-24

申请号：US131345

申请日：1998-08-07

申请人： Hirotoshi Kubo ,  Hiroaki Saito ,  Masanao Kitagawa ,  Eiichiroh Kuwako

发明人： Hirotoshi Kubo ,  Hiroaki Saito ,  Masanao Kitagawa ,  Eiichiroh Kuwako

IPC分类号： H01L21/302 ,  H01L21/3065 ,  H01L21/336 ,  H01L29/423 ,  H01L29/78 ,  H01L29/76 ,  H01L29/94 ,  H01L31/113 ,  H01L31/119 ,  H01L31/062

CPC分类号： H01L29/7813 ,  H01L29/4232 ,  H01L29/4238

摘要： The present invention improves the characteristic of a trench-type vertical MOSFET. When a trench 23 serving as a gate 25 is formed, it is made in a shape of ".gamma." which is convex toward the inside of the trench. Thus, the surface area of the trench is reduced so that both gate-source capacitance and gate-drain capacitance can be reduced, thereby shortening the switching time of the MOSFET.

摘要翻译： 本发明改进了沟槽型垂直MOSFET的特性。 当形成用作栅极25的沟槽23时，其形成为朝向沟槽内部凸出的“γ”形状。 因此，沟槽的表面积减小，从而可以减小栅极 - 源极电容和栅极 - 漏极电容，从而缩短MOSFET的开关时间。

公开(公告)号：US5970344A

公开(公告)日：1999-10-19

申请号：US138617

申请日：1998-08-24

申请人： Hirotoshi Kubo ,  Eiichiroh Kuwako ,  Masanao Kitagawa ,  Hiroaki Saito

发明人： Hirotoshi Kubo ,  Eiichiroh Kuwako ,  Masanao Kitagawa ,  Hiroaki Saito

IPC分类号： H01L21/336 ,  H01L29/08 ,  H01L29/417 ,  H01L29/78 ,  H01L21/302

CPC分类号： H01L29/7813 ,  H01L29/0847 ,  H01L29/41766 ,  H01L29/7802

摘要： A channel layer is formed in a surface of a semiconductor substrate, and a plurality of trenches are formed in the surface of the semiconductor substrate, the trenches being deeper than the channel layer. Then, gate electrodes are formed in the trenches, respectively, after which body layers are formed between the trenches and source layers are formed adjacent to the trenches.

摘要翻译： 在半导体衬底的表面中形成沟道层，并且在半导体衬底的表面中形成多个沟槽，沟槽比沟道层更深。 然后，分别在沟槽中形成栅电极，之后在沟槽之间形成体层，并且与沟槽相邻地形成源极层。

公开(公告)号：US20060065926A1

公开(公告)日：2006-03-30

申请号：US11230538

申请日：2005-09-21

申请人： Hirotoshi Kubo ,  Junichiro Tojo ,  Hiroaki Saito ,  Masahito Onda ,  Satoshi Iwata ,  Masamichi Yanagida

发明人： Hirotoshi Kubo ,  Junichiro Tojo ,  Hiroaki Saito ,  Masahito Onda ,  Satoshi Iwata ,  Masamichi Yanagida

IPC分类号： H01L29/94

CPC分类号： H01L29/7813 ,  H01L29/42368 ,  H01L29/66734

摘要： A capacity layer is formed of non-doped polysilicon. Unlike capacity layers formed of an oxide film, generation of seams and the like can be suppressed and thereby a stable capacity layer can be formed. Moreover, polysilicon used as a capacity layer may be doped polysilicon, and an oxide film formed on the surface of the polysilicon also serves as a capacity film. Thus, provision of an insulated gate device featuring low capacity is made possible.

摘要翻译： 电容层由非掺杂多晶硅形成。 与由氧化膜形成的容量层不同，可以抑制接缝等的产生，从而可以形成稳定的电容层。 此外，用作电容层的多晶硅可以是掺杂多晶硅，并且形成在多晶硅表面上的氧化膜也用作容量膜。 因此，提供具有低容量的绝缘栅极器件成为可能。

公开(公告)号：US20050167748A1

公开(公告)日：2005-08-04

申请号：US11023961

申请日：2004-12-29

申请人： Masahito Onda ,  Hirotoshi Kubo ,  Shouji Miyahara ,  Hiroyasu Ishida ,  Hiroaki Saito

发明人： Masahito Onda ,  Hirotoshi Kubo ,  Shouji Miyahara ,  Hiroyasu Ishida ,  Hiroaki Saito

IPC分类号： H01L29/417 ,  H01L21/265 ,  H01L21/336 ,  H01L29/08 ,  H01L29/41 ,  H01L29/423 ,  H01L29/49 ,  H01L29/72 ,  H01L29/739 ,  H01L29/76 ,  H01L29/78

CPC分类号： H01L29/7813 ,  H01L21/26586 ,  H01L29/0869 ,  H01L29/4236 ,  H01L29/66727 ,  H01L29/66734

摘要： An interlayer dielectric film is completely buried in a trench, and failures caused by step coverage is prevented because a source electrode can be formed substantially uniformly on an upper portion of a gate electrode. Also, in the processes of forming a source region, a body region and an interlayer dielectric film, only one mask is necessary so that the device size is reduced to account for placement error of only one mask alignment.

摘要翻译： 层间电介质膜被完全埋入沟槽中，由于可以在栅电极的上部基本上均匀地形成源电极，所以防止由台阶覆盖引起的故障。 此外，在形成源极区域，体区域和层间电介质膜的过程中，仅需要一个掩模，使得器件尺寸减小以仅考虑一个掩模对准的放置误差。

公开(公告)号：US07413954B2

公开(公告)日：2008-08-19

申请号：US11230538

申请日：2005-09-21

申请人： Hirotoshi Kubo ,  Junichiro Tojo ,  Hiroaki Saito ,  Masahito Onda ,  Satoshi Iwata ,  Masamichi Yanagida

发明人： Hirotoshi Kubo ,  Junichiro Tojo ,  Hiroaki Saito ,  Masahito Onda ,  Satoshi Iwata ,  Masamichi Yanagida

IPC分类号： H01L21/336

CPC分类号： H01L29/7813 ,  H01L29/42368 ,  H01L29/66734

摘要： A capacity layer is formed of non-doped polysilicon. Unlike capacity layers formed of an oxide film, generation of seams and the like can be suppressed and thereby a stable capacity layer can be formed. Moreover, polysilicon used as a capacity layer may be doped polysilicon, and an oxide film formed on the surface of the polysilicon also serves as a capacity film. Thus, provision of an insulated gate device featuring low capacity is made possible.

摘要翻译： 电容层由非掺杂多晶硅形成。 与由氧化膜形成的容量层不同，可以抑制接缝等的产生，从而可以形成稳定的电容层。 此外，用作电容层的多晶硅可以是掺杂多晶硅，并且形成在多晶硅表面上的氧化膜也用作容量膜。 因此，提供具有低容量的绝缘栅极器件成为可能。